IP Library › Granted Patent US 11,067,599
Granted Patent B2
US 11,067,599 · App. 16/648,777 · Granted Jul 20, 2021

Probe device

Inventor: Jianfeng Shan (Shenzhen, CN)
Assignee: HKC CORPORATION LIMITED
G01R1/06766G01R1/06722
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Quick Facts
Patent No.
US 11,067,599
App. No.
16/648,777
Granted
Jul 20, 2021
Kind
B2
Abstract

An embodiment of the present disclosure discloses a probe device including: a base, including a main body, a cavity formed in the main body, and a through hole defined in the main body and communicating with the cavity; a probe, including a main part, a probe head defined at one end of the main part, and a mounting portion defined at the other end of the main part, the mounting portion being inserted into the cavity via the through hole; and a conductive member, disposed in the cavity and defined on the mounting portion, allowing the mounting portion to be caught in the cavity. The conductive member is in contact with the probe device to release the charge of the probe accumulated during operation of the probe, when the probe device is not in operation.

Claims (12)

1. A probe device, comprising:

a base, comprising a main body, a cavity formed in the main body, a conductive contact grounded and defined on the main body, and a through hole communicating with the cavity defined in the main body;

a probe, comprising a main part, a probe head defined at one end of the main part, and a mounting portion defined at the other end of the main part, the mounting portion being inserted into the cavity of the base via the through hole;

a conductive member, disposed in the cavity and defined on the mounting portion of the probe, allowing the mounting portion to be caught in the cavity; and

an elastic member, disposed in the cavity, one end of the elastic member being connected to the main body at the side away from the through hole, the other end of the elastic member being connected with the mounting portion of the probe, the elastic member generating compressive deformation to separate the conductive member from the conductive contact when the probe is in operation,

wherein, the conductive contact is defined on bottom of two opposite sidewalls of the main body, and a through opening for disposing the conductive contact is defined in each the bottom of the opposite sidewalls, and the conductive contact is shaped as arcuate cylinder, the inner side of the conductive contact is flushed with the sidewall of the cavity;

the conductive member is in contact with the conductive contact to release the charge of the probe accumulated during operation of the probe, when the probe device is not in operation.

2. The probe device of claim 1 , wherein the outer side of the conductive contact is flushed with the outer sidewall of the main body.

3. The probe device of claim 1 , wherein the outer side of the conductive contact is not flushed with the outer sidewall of the main body.

4. The probe device of claim 1 , wherein the elastic member is a spring.

5. The probe device of claim 1 , wherein the conductive member is a conductive ring.

6. The probe device of claim 5 , wherein the outer diameter of the conductive ring matches the size of the sidewall of the cavity.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 19, 2020
From: SHAN, JIANFENG
To: HKC CORPORATION LIMITED
Reel/Frame 052165/0344 →
Priority Claims (1)
CN 201710875612.9 · Sep 25, 2017 · national
Continuity (1)
Related Publication 20200271691A1 · Aug 27, 2020