IP Library Granted Patent US 11,067,643
Granted Patent B2
US 11,067,643 · App. 15/829,223 · Granted Jul 20, 2021

Magnetic field sensor and method for making same

Inventors: Christian Schott (Lussy-sur-Morges, CH); Matthew Meitl (Durham, NC); Christopher Bower (Raleigh, NC)
Assignees: MELEXIS TECHNOLOGIES NV; X-CELEPRINT LIMITED
G01R33/0047G01R33/0052G01R33/0094G01R33/07G01R33/077G01R33/09G01R33/093G01R33/098H01L24/00H01L24/24H01L24/82H01L24/94H01L43/04G01R15/207H01L2224/24146H01L2224/2919H01L2224/32145H01L2224/32245H01L2224/48091H01L2224/48247H01L2224/73227H01L2224/73265H01L2224/73267H01L2224/83005H01L2224/92137H01L2224/92244H01L2224/92247H01L2224/94H01L2224/97H01L2924/00014H01L2924/10253H01L2924/10329H01L2924/181
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Quick Facts
Patent No.
US 11,067,643
App. No.
15/829,223
Granted
Jul 20, 2021
Kind
B2
Abstract

A multi-element sensor for measuring a magnetic field. The multi-element sensor comprises a magnetic sensing element, and an electronic circuit. The magnetic sensing element is mounted on the electronic circuit and comprises a fractured tether. The magnetic sensing element is electrically connected with the electronic circuit. The electronic circuit is produced in a first technology and/or first material and the magnetic sensing element is produced in a second technology and/or second material different from the first technology/material.

Claims (26)

1. A multi-element sensor for measuring a magnetic field, comprising:

an integrated circuit element comprising an electronic circuit formed in a semiconductor circuit substrate;

a cured adhesive layer disposed over the circuit substrate;

a magnetic sensing element comprising a sensor substrate having at least one tether, fractured when transferring the magnetic sensing element using a stamp, for contacting the magnetic sensing element to the adhesive layer, the magnetic sensing element further comprising a top side, and a bottom side opposite the top side, and a magnetic sensor formed on, in, or over the top side of the sensor substrate, wherein the bottom side of the sensor substrate is adhered to the adhesive layer;

one or more electrical connections formed at least partly in a conductive distribution layer on the circuit substrate over the electronic circuit, the electrical connections electrically connecting the magnetic sensor to the electronic circuit; and

wherein the circuit substrate is a separate substrate from the sensor substrate and the material of the circuit substrate comprises a different material than the material of the sensor substrate.

2. The multi-element sensor according to claim 1 , wherein the magnetic sensing element has a thickness between less than 5 μm or between 2 μm and 5 μm.

3. The multi-element sensor according to claim 1 , wherein the electrical connections have a thickness between 1.0 μm and 2.0 μm and a width between 1 μm and 10 μm.

4. The multi-element sensor according to claim 1 , wherein the material of the sensor substrate has a mobility that is higher than the mobility of the semiconductor of the circuit substrate at room temperature.

5. The multi-element sensor according to claim 1 , wherein the magnetic sensor is a Hall sensor, a quantum-well Hall sensor, a magneto-resistive sensor, a giant magneto-resistive sensor, a tunnel magneto-resistive sensor, or wherein the magnetic sensing element comprises graphene.

6. The multi-element sensor according to claim 1 , wherein the material of the sensor substrate is a compound semiconductor, a III-V semiconductor, or GaAs, or wherein the semiconductor of the circuit substrate is silicon.

7. The multi-element sensor according to claim 1 , comprising a ferromagnetic layer on top of the conductive distribution layer.

8. The multi-element sensor according to claim 1 , wherein the multi-element sensor includes a passivation layer formed over the magnetic sensor.

9. The multi-element sensor according to claim 1 , wherein the magnetic sensing element comprises supporting structures made of electrically insulating material, situated at least partially on the lateral sides of the sensor substrate.

10. The multi-element sensor according to claim 9 , wherein the adhesion layer between the magnetic sensing element and the electronic circuit is chemically bonded to the supporting structures.

11. The multi-element sensor according to claim 1 , wherein the magnetic sensing element is mechanically joint with the electronic circuit through an adhesion layer present on the electronic circuit.

12. The multi-element sensor according to claim 1 , wherein the magnetic sensing element is smaller than the electronic circuit, and covers only a portion of a surface of the electronic circuit on which the magnetic sensing element is disposed, and extends from the surface of the electronic circuit by a distance of 2 μm or more.

13. A multi-element sensor wafer, comprising:

a plurality of spaced apart integrated circuit elements each comprising an electronic circuit disposed over a sacrificial portion of the sensor wafer, and formed in a semiconductor circuit substrate;

an adhesive layer disposed over the electronic circuits;

a plurality of magnetic sensing elements each comprising a sensor substrate having at least one tether, fractured when transferring the magnetic sensing element using a stamp, for contacting the magnetic sensing element to the adhesive layer, the magnetic sensing element further comprising a top side, and a bottom side opposite the top side, and a magnetic sensor formed on, in, or over the top side of the sensor substrate, wherein the bottom side of the sensor substrate is adhered to the adhesive layer and is disposed over a corresponding electronic circuit;

one or more electrical connections formed at least partly in a conductive distribution layer on the circuit substrate over each electronic circuit, the electrical connections electrically connecting the magnetic sensor to the corresponding electronic circuit; and

wherein the circuit substrate is a separate substrate from the sensor substrate and the material of the circuit substrate comprises a different material than the material of the sensor substrate.

14. The multi-element sensor source wafer according to claim 13 , wherein the sacrificial portion forms a gap between the circuit substrate and the sensor wafer defining at least one tether connecting the circuit substrate to an anchoring portion of the sensor wafer.

15. The multi-element sensor wafer according to claim 13 , wherein the magnetic sensor is a Hall sensor, a quantum-well Hall sensor, a magneto-resistive sensor, a giant magneto-resistive sensor, a tunnel magneto-resistive sensor, or wherein the magnetic sensing element comprises graphene.

16. The multi-element sensor wafer according to claim 13 , wherein the material of the sensor substrate is a compound semiconductor, a III-V semiconductor, or GaAs, or wherein the semiconductor of the circuit substrate is silicon.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 1, 2017
From: SCHOTT, CHRISTIAN; MEITL, MATTHEW; BOWER, CHRISTOPHER
To: MELEXIS TECHNOLOGIES NV; X-CELEPRINT LIMITED
Reel/Frame 044276/0247 →
CHANGE OF ADDRESS Recorded Dec 1, 2017
From: X-CELEPRINT LIMITED
To: X-CELEPRINT LIMITED
Reel/Frame 044594/0429 →
Priority Claims (1)
GB 1419515 · Nov 3, 2014 · national
Continuity (2)
Continuation In Part 15524003
Related Publication 20180100902A1 · Apr 12, 2018
Cited By (1)
US 12,245,520