IP Library Granted Patent US 11,069,834
Granted Patent B2
US 11,069,834 · App. 16/637,432 · Granted Jul 20, 2021

Optoelectronic device having a boron nitride alloy electron blocking layer and method of production

Inventors: Xiaohang Li (Thuwal, SA); Wenzhe Guo (Thuwal, SA); Haiding Sun (Thuwal, SA)
Assignee: KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY
H01L33/145H01L27/15H01L29/2003H01L29/205H01L29/7786H01L33/007H01L33/06H01L33/32
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Quick Facts
Patent No.
US 11,069,834
App. No.
16/637,432
Granted
Jul 20, 2021
Kind
B2
Abstract

An optoelectronic device a substrate, a first doped contact layer arranged on the substrate, a multiple quantum well layer arranged on the first doped contact layer, a boron nitride alloy electron blocking layer arranged on the multiple quantum well layer, and a second doped contact layer arranged on the boron nitride alloy electron blocking layer.

Claims (21)

1. An optoelectronic device, comprising:

a light emitting diode comprising a multiple quantum well layer, an electron blocking layer, a first doped contact layer and a second doped contact layer; and

a high electron mobility transistor comprising a two-dimensional electron gas channel and the electron blocking layer, wherein the two-dimensional electron gas channel of the high electron mobility transistor is comprised of a portion of a last quantum barrier layer of the multiple quantum well layer of the light emitting diode,

wherein the electron blocking layer is a boron nitride alloy electron blocking layer arranged in contact with the last quantum barrier layer on the two-dimensional electron gas channel to allow the portion of the last quantum barrier layer to function as the two-dimensional electron gas channel of the high electron mobility transistor.

2. The optoelectronic device of claim 1 , wherein the boron nitride alloy electron blocking layer comprises:

B x Al 1-x N.

3. The optoelectronic device of claim 1 , wherein the multiple quantum well layer comprises:

at least one layer of gallium nitride; and

at least one layer of aluminum gallium nitride.

4. The optoelectronic device of claim 1 , further comprising:

a substrate, wherein

the first doped contact layer is arranged on the substrate,

the multiple quantum well layer is arranged on the first doped contact layer; and

the second doped contact layer is arranged on the boron nitride alloy electron blocking layer.

5. The optoelectronic device of claim 1 , wherein the optoelectronic device is a monolithically integrated device.

6. The optoelectronic device of claim 1 , wherein:

the high electron mobility transistor further comprises:

a gate;

a source in contact with the last quantum barrier layer; and

a drain in contact with the last quantum barrier layer; and

the last quantum barrier layer is shared between the light emitting diode and the high electron mobility transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2020
From: LI, XIAOHANG; GUO, WENZHE; SUN, HAIDING
To: KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY
Reel/Frame 051998/0095 →
Continuity (2)
Provisional Application 62559842 · Sep 18, 2017
Related Publication 20200388722A1 · Dec 10, 2020