IP Library › Granted Patent US 11,092,642
Granted Patent B2
US 11,092,642 · App. 16/583,436 · Granted Aug 17, 2021

Electronic component handler and electronic component tester

Inventor: Makoto Yanagisawa (Matsumoto, JP)
G01R31/2893B25J15/0633
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Quick Facts
Patent No.
US 11,092,642
App. No.
16/583,436
Granted
Aug 17, 2021
Kind
B2
Abstract

An electronic component handler including a first holding section and a second holding section holding an electronic component by adsorption, a suction section giving the first holding section and the second holding section an adsorption force to adsorb the electronic component, a suction flow path, a first branch flow path, a second branch flow path, a first opening/closing section opening and closing the first branch flow path, a second opening/closing section opening and closing the second branch flow path, a first pressure measurement section measuring first pressure inside the first branch flow path, a second pressure measurement section measuring second pressure inside the second branch flow path, and a control section, in which the control section opens the first branch flow path by the first opening/closing section and causes the first holding section to adsorb the electronic component, and checks whether or not the first pressure is lower than preset pressure when the second branch flow path is opened by the second opening/closing section.

Claims (58)

1. An electronic component handler transporting a first electronic component and a second electronic component to a test section testing electrical characteristics of the first electronic component and the second electronic component, the handler comprising:

a first holding section holding the first electronic component by adsorption;

a second holding section holding the second electronic component by adsorption;

a suction section giving the first holding section an adsorption force to adsorb the first electronic component and giving the second holding section the adsorption force to adsorb the second electronic component;

a suction flow path which communicates with the suction section and through which gas is sucked by the suction section;

a first branch flow path which branches off from the suction flow path and communicates with the first holding section and through which the gas is sucked by the suction section;

a second branch flow path which branches off from the suction flow path and communicates with the second holding section and through which the air is sucked by the suction section;

a first opening/closing section opening and closing the first branch flow path;

a second opening/closing section opening and closing the second branch flow path;

a first pressure measurement section measuring first pressure inside the first branch flow path;

a second pressure measurement section measuring second pressure inside the second branch flow path; and

a control section controlling operations of the suction section, the first opening/closing section, the second opening/closing section, the first pressure measurement section, and the second pressure measurement section, wherein

the control section opens the first branch flow path by the first opening/closing section and causes the first holding section to adsorb the first electronic component, and checks whether or not the first pressure measured when the second branch flow path is opened by the second opening/closing section is lower than preset pressure.

2. The electronic component handler according to claim 1 , wherein

the control section opens the second branch flow path by the second opening/closing section and causes the second holding section to adsorb the second electronic component, and

checks whether or not the second pressure measured when the first branch flow path is opened by the first opening/closing section is lower than the pressure.

3. The electronic component handler according to claim 2 , wherein

the control section determines that a decline of the adsorption force occurs when the first pressure is lower than the pressure and the second pressure is lower than the pressure.

4. The electronic component handler according to claim 3 , further comprising:

a report section reporting a determination result of the control section.

5. An electronic component handler transporting a first electronic component and a second electronic component to a test section testing electrical characteristics of the first electronic component and the second electronic component, the handler comprising:

a first holding section holding the first electronic component by adsorption;

a second holding section holding the second electronic component by adsorption;

a suction section giving the first holding section an adsorption force to adsorb the first electronic component and giving the second holding section the adsorption force to adsorb the second electronic component;

a suction flow path which communicates with the suction section and through which gas is sucked by the suction section;

a first branch flow path which branches off from the suction flow path and communicates with the first holding section and through which the gas is sucked by the suction section;

a second branch flow path which branches off from the suction flow path and communicates with the second holding section and through which the gas is sucked by the suction section;

a first opening/closing section opening and closing the first branch flow path;

a second opening/closing section opening and closing the second branch flow path;

a first pressure measurement section measuring first pressure inside the first branch flow path and outputting a signal based on the first pressure;

a second pressure measurement section measuring second pressure inside the second branch flow path and outputting a signal based on the second pressure;

a control section controlling operations of the suction section, the first opening/closing section, the second opening/closing section, the first pressure measurement section, and the second pressure measurement section; and

a report section, wherein

the control section opens the first branch flow path by the first opening/closing section and causes the first holding section to adsorb the first electronic component, and causes the report section to report based on the signal of the first pressure measurement section when the second branch flow path is opened by the second opening/closing section.

6. The electronic component handler according to claim 5 , wherein

the first pressure measurement section outputs a first signal when the first pressure is lower than a preset pressure threshold value, and

the control section causes the report section to report upon receiving the first signal from the first pressure measurement section.

7. An electronic component tester testing a first electronic component and a second electronic component, the tester comprising:

a first holding section holding the first electronic component by adsorption;

a second holding section holding the second electronic component by adsorption;

a suction section giving the first holding section an adsorption force to adsorb the first electronic component and giving the second holding section the adsorption force to adsorb the second electronic component;

a suction flow path which communicates with the suction section and through which gas is sucked by the suction section;

a first branch flow path which branches off from the suction flow path and communicates with the first holding section and through which the gas is sucked by the suction section;

a second branch flow path which branches off from the suction flow path and communicates with the second holding section and through which the gas is sucked by the suction section;

a first opening/closing section opening and closing the first branch flow path;

a second opening/closing section opening and closing the second branch flow path;

a first pressure measurement section measuring the first pressure inside the first branch flow path;

a second pressure measurement section measuring the second pressure inside the second branch flow path;

a test section testing electrical characteristics of the first electronic component and the second electronic component; and

a control section controlling operations of the suction section, the first opening/closing section, the second opening/closing section, the first pressure measurement section, and the second pressure measurement section, wherein

the control section opens the first branch flow path by the first opening/closing section and causes the first holding section to adsorb the first electronic component, and checks whether or not the first pressure measured when the second branch flow path is opened by the second opening/closing section is lower than preset pressure.

8. The electronic component tester according to claim 7 , wherein

the control section opens the second branch flow path by the second opening/closing section and causes the second holding section to adsorb the second electronic component, and

checks whether or not the second pressure measured when the first branch flow path is opened by the first opening/closing section is lower than the pressure.

9. The electronic component tester according to claim 8 , wherein

the control section determines that a decline of the adsorption force occurs when the first pressure is lower than the pressure and the second pressure is lower than the pressure.

10. The electronic component tester according to claim 9 , further comprising:

a report section reporting a determination result of the control section.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2021
From: SEIKO EPSON CORPORATION
To: NS TECHNOLOGIES, INC.
Reel/Frame 056479/0775 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2019
From: YANAGISAWA, MAKOTO
To: SEIKO EPSON CORPORATION
Reel/Frame 050498/0449 →
Priority Claims (1)
JP JP2018-182810 · Sep 27, 2018 · national
Continuity (1)
Related Publication 20200103463A1 · Apr 2, 2020