Memory system and operating method thereof
A memory system includes a memory device; a short super block detecting unit suitable for forming, when one or more initial bad blocks remain in an original super block after a re-mapping operation is performed and a number of the initial bad blocks is equal to or less than a predetermined threshold value within the original super block, a short super block with memory blocks included in the original super block; a bitmap generating unit suitable for generating a bitmap representing whether each of the memory blocks included in the short super block is a normal block or an initial bad block; and a processor suitable for controlling the memory device to simultaneously perform a normal operation on normal blocks among the memory blocks included in the short super block based on the bitmap.
1. A memory system comprising:
a memory device including a plurality of super blocks;
a re-mapping unit suitable for forming a re-mapped super block by mapping an address of an initial bad block of a bad super block included in the plurality of super blocks to an address of a normal block included in a spare group;
a short super block detecting unit suitable for forming, when one or more bad super block remain in the plurality of super blocks after the re-mapped super block is formed and a number of the initial bad blocks is equal to or less than a predetermined threshold value within the remain bad super block, a short super block with memory blocks included in the remain bad super block;
a bitmap generating unit suitable for generating a bitmap representing whether each of the memory blocks included in each of the plurality of super blocks is a normal block or an initial bad block; and
a processor suitable for interleaving commands for accessing one of the plurality of super blocks based on a number of normal blocks of the super block by referring to the bitmap and controlling the memory device to simultaneously perform command operations on the normal blocks.
2. The memory system of claim 1 , further comprising an initial bad block detecting unit suitable for detecting the initial bad blocks within the original super block and generating address information of the initial bad blocks.
3. The memory system of claim 1 , wherein the initial bad block is a memory block that is determined as a bad block in a test performed after a manufacturing process.
4. The memory system of claim 1 , wherein the normal block included in the spare group belongs to the same plane as the corresponding initial bad block.
5. The memory system of claim 1 , wherein the bitmap generating unit records, when a first memory block included in the short super block is the normal block, a value of ‘1’ in an element corresponding to the first memory block in the bitmap.
6. The memory system of claim 1 , wherein the bitmap generating unit records, when a second memory block included in the short super block is the initial bad block, a value of ‘0’ in an element corresponding to the second memory block in the bitmap.
7. The memory system of claim 1 , wherein the command operations are program operations or erase operations.
8. The memory system of claim 1 , wherein the short super block detecting unit processes, when the number of the initial bad blocks is greater than the predetermined threshold value within the original super block, the memory blocks included in the original super block as bad blocks.
9. A method for operating a memory system including a plurality of super blocks, the method comprising:
forming a re-mapped super block by mapping an address of an initial bad block of a bad super block included in the plurality of super blocks to an address of a normal block included in a spare group;
forming, when one or more bad super block remain in the plurality of super blocks after the re-mapped super block is formed and a number of the initial bad blocks is equal to or less than a predetermined threshold value within the remain bad super block, a short super block with memory blocks included in the remain bad super block;
generating a bitmap representing whether each of the memory blocks included in each of the plurality of super blocks is a normal block or an initial bad block;
interleaving commands for accessing one of the plurality of super blocks based on a number of normal blocks of the super block by referring to the bitmap; and
simultaneously performing command operations on the normal blocks.
10. The method of claim 9 , further comprising detecting the initial bad blocks within the original super block and generating address information of the initial bad blocks.
11. The method of claim 9 , wherein the normal block included in the spare group belongs to the same plane as the corresponding initial bad block.
12. The method of claim 9 , wherein the generating of the bitmap includes recording, when a first memory block included in the short super block is the normal block, a value of ‘1’ in an element corresponding to the first memory block in the bitmap.
13. The method of claim 9 , wherein the generating of the bitmap includes recording, when a second memory block included in the short super block is the initial bad block, a value of ‘0’ in an element corresponding to the second memory block in the bitmap.
14. The method of claim 9 , wherein the command operations are program operations or erase operations.
15. The method of claim 9 , further comprising processing, when the number of the initial bad blocks is greater than the predetermined threshold value within the original super block, the memory blocks included in the original super block as bad blocks.