IP Library › Granted Patent US 11,094,538
Granted Patent B2
US 11,094,538 · App. 16/260,403 · Granted Aug 17, 2021

Method of forming graphene

Inventors: Keunwook Shin (Yongin-si, KR); Changhyun Kim (Seoul, KR); Kaoru Yamamoto (Seongnam-si, KR); Changseok Lee (Seoul, KR); Hyunjae Song (Hwaseong-si, KR); Eunkyu Lee (Yongin-si, KR); Kyung-Eun Byun (Seongnam-si, KR); Hyeonjin Shin (Suwon-si, KR); Sungjoo An (Seongnam-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L21/02527H01L21/0262H01L21/02658H01L29/1606
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Quick Facts
Patent No.
US 11,094,538
App. No.
16/260,403
Granted
Aug 17, 2021
Kind
B2
Abstract

Provided is a method of forming graphene. The method of forming graphene includes treating a surface of a substrate placed in a reaction chamber with plasma while applying a bias to the substrate, and growing graphene on the surface of the substrate by plasma enhanced chemical vapor deposition (PECVD).

Claims (56)

1. A method of forming graphene, the method comprising:

treating a surface of a substrate placed in a reaction chamber with plasma while applying a bias to the substrate; and

growing graphene on the surface of the substrate by plasma enhanced chemical vapor deposition (PECVD), wherein

the treating the surface of the substrate includes forming at least one of charges and activation sites inducing adsorption of activated carbon on the surface of the substrate.

2. The method of claim 1 , wherein the activation sites includes at least one of roughness and defects.

3. The method of claim 1 , wherein the treating the surface of the substrate includes:

injecting a pretreatment gas into the reaction chamber;

applying the bias to the substrate; and

generating the plasma in the reaction chamber while applying the bias to the substrate.

4. The method of claim 3 , wherein the pretreatment gas includes at least one of an inert gas, hydrogen, oxygen, ammonia, chlorine, bromine, fluorine, and fluorocarbon.

5. The method of claim 3 , wherein

the applying the bias to the substrate includes supplying a bias power to the substrate, and

the bias power ranges from about 1 W to about 100 W.

6. The method of claim 1 , wherein the growing of the graphene includes:

injecting a reaction gas including a carbon source into the reaction chamber; and

directly growing the graphene on the surface of the substrate by generating plasma in the reaction chamber.

7. The method of claim 6 , wherein the reaction gas further includes at least one of an inert gas and hydrogen gas.

8. The method of claim 6 , wherein the treating the surface of the substrate and the growing the graphene are performed at a processing temperature of about 1000° C. or less.

9. The method of claim 6 , wherein the treating of the surface of the substrate is performed at a lower processing pressure than the growing the graphene.

10. The method of claim 6 , wherein the treating the surface of the substrate is performed at a processing pressure of about 0.02 torr to about 5.0 torr.

11. The method of claim 6 , wherein

the plasma used in the treating the surface of the substrate is generated by at least one of a radio frequency (RF) plasma generating device or a microwave (MW) plasma generating device, and

the plasma used in the growing the graphene is generated by at least one of a radio frequency (RF) plasma generating device or a microwave (MW) plasma generating device.

12. The method of claim 6 , wherein a plasma power in the treating the surface of the substrate is greater than a plasma power in the growing of the graphene.

13. The method of claim 6 , wherein a plasma power in the treating the surface of the substrate ranges from about 10 W to about 4000 W.

14. The method of claim 6 , wherein the growing of the graphene further includes applying a bias to the substrate.

15. The method of claim 1 , wherein the substrate includes at least one of a group IV semiconductor material, a semiconductor compound, a metal, and an insulating material.

16. The method of claim 15 , wherein the substrate further includes a dopant.

17. A method of forming graphene, the method comprising:

treating a surface of a substrate by applying a bias to the substrate; and

growing graphene on the surface of the substrate, wherein

the treating the surface of the substrate includes forming at least one of charges and activation sites inducing adsorption of activated carbon on the surface of the substrate.

18. The method of claim 17 , wherein the treating the surface of the substrate includes:

injecting a pretreatment gas into a reaction chamber;

applying the bias to the substrate; and

generating plasma in the reaction chamber while applying the bias to the substrate.

19. The method of claim 17 , wherein the growing the graphene includes:

injecting a reaction gas including a carbon source into a reaction chamber; and

directly growing the graphene on the surface of the substrate by generating plasma in the reaction chamber.

20. A method of forming graphene, the method comprising:

preparing a substrate including a plasma-treated surface, the preparing the substrate including performing a plasma operation on the substrate while applying a bias to the substrate,

growing graphene on the plasma-treated surface of the substrate by plasma enhanced chemical vapor deposition (PECVD), wherein

the plasma-treated surface of the substrate includes at least one of charges and activation sites inducing adsorption of activated carbon on the plasma-treated surface of the substrate.

21. The method of claim 20 , wherein the preparing the substrate includes:

placing the substrate including the plasma-treated surface in a reaction chamber,

injecting a pretreatment gas into the reaction chamber;

applying the bias to the substrate; and

generating a plasma in the reaction chamber while applying the bias to the substrate in the reaction chamber.

22. The method of claim 21 , wherein

the pretreatment gas includes at least one of an of an inert gas, hydrogen, oxygen, ammonia, chlorine, bromine, fluorine, and fluorocarbon, and

the substrate includes at least one of a group IV semiconductor material, a semiconductor compound, a metal, and an insulating material.

23. The method of claim 20 , wherein

the preparing the substrate is performed at a processing temperature of about 1000° C. or less, a processing pressure in a range of about 0.02 torr to about 5.00 torr, a bias power in a range from about 1 W to about 100 W, and a plasma power in range from about 10 W to about 4000 W.

24. The method of claim 20 , wherein the growing graphene on the plasma-treated surface of the substrate includes:

injecting a reaction gas including a carbon source into a reaction chamber; and

generating a plasma in the reaction chamber from the reaction gas while the substrate including the plasma-treated surface is in the reaction chamber.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2019
From: SHIN, KEUNWOOK; KIM, CHANGHYUN; YAMAMOTO, KAORU; LEE, CHANGSEOK; SONG, HYUNJAE; LEE, EUNKYU; BYUN, KYUNG-EUN; SHIN, HYEONJIN; AN, SUNGJOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 048189/0974 →
Priority Claims (1)
KR 10-2018-0117101 · Oct 1, 2018 · national
Continuity (1)
Related Publication 20200105524A1 · Apr 2, 2020
Cited By (1)
US 12,211,744