IP Library › Granted Patent US 11,101,303
Granted Patent B2
US 11,101,303 · App. 16/639,406 · Granted Aug 24, 2021

Imaging element, laminated imaging element, and solid-state imaging device

Inventors: Hideki Ono (Tokyo, JP); Yukio Kaneda (Kanagawa, JP)
Assignee: Sony Corporation
H01L27/1461H01L27/14667
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Quick Facts
Patent No.
US 11,101,303
App. No.
16/639,406
Granted
Aug 24, 2021
Kind
B2
Abstract

An imaging element (photoelectric conversion element) includes a photoelectric conversion unit formed by laminating a first electrode 21 , a photoelectric conversion layer 23 A, and a second electrode 22 . Between the first electrode 21 and the photoelectric conversion layer 23 A, a composite oxide layer 23 B containing indium-gallium-zinc composite oxide is formed. The composite oxide layer 23 B includes a first layer 23 B 1 adjacent to the first electrode 21 and a second layer 23 B 2 adjacent to the photoelectric conversion layer 23 A. The first layer 23 B 1 has a higher indium composition than the second layer 23 B 2 , or the first layer 23 B 1 has a higher gallium composition than the second layer 23 B 2 , or the first layer 23 B 1 has a higher zinc composition than the second layer 23 B 2 .

Claims (33)

1. An imaging element comprising a photoelectric conversion unit formed by laminating a first electrode, a photoelectric conversion layer, and a second electrode,

between the first electrode and the photoelectric conversion layer, a composite oxide layer containing indium composite oxide is formed,

the composite oxide layer includes a first layer adjacent to the first electrode and a second layer adjacent to the photoelectric conversion layer, and

the first layer has a higher indium composition than the second layer.

2. A laminated imaging element comprising at least one of the imaging elements according to claim 1 .

3. A solid-state imaging device comprising a plurality of the imaging elements according to claim 1 .

4. A solid-state imaging device comprising a plurality of the laminated imaging elements according to claim 2 .

5. An imaging element comprising a photoelectric conversion unit formed by laminating a first electrode, a photoelectric conversion layer, and a second electrode, wherein

between the first electrode and the photoelectric conversion layer, a composite oxide layer containing indium-gallium-zinc composite oxide is formed,

the composite oxide layer includes a first layer adjacent to the first electrode and a second layer adjacent to the photoelectric conversion layer,

the first layer has a higher indium composition than the second layer, or

the first layer has a higher gallium composition than the second layer, or

the first layer has a higher zinc composition than the second layer.

6. The imaging element according to claim 5 , wherein

when the indium-gallium-zinc composite oxide is represented by (ZnO) X (Ga 2 O 3 ) 1-X , (Ga 2 O 3 ) Y (In 2 O 3 ) 1-Y , and (In 2 O 3 ) Z (ZnO) 1-Z ,

a value of X in the first layer is larger than a value of X in the second layer, or

a value of Y in the first layer is lower than a value of Y in the second layer, or

a value of Z in the first layer is higher than a value of Z in the second layer.

7. The imaging element according to claim 6 , satisfying 0<X<0.875, 0<Y<0.875, and 0.125<Z<0.875 (where X+Y+Z=1.000).

8. An imaging element comprising a photoelectric conversion unit formed by laminating a first electrode, a photoelectric conversion layer, and a second electrode, wherein

between the first electrode and the photoelectric conversion layer, a composite oxide layer containing indium composite oxide is formed,

the composite oxide layer includes a first layer adjacent to the first electrode and a second layer adjacent to the photoelectric conversion layer, and

the first layer has a higher carrier mobility than the second layer.

9. The imaging element according to claim 8 , satisfying 1×10 −6 ≤(carrier mobility of second layer)/(carrier mobility of first layer)≤0.1.

10. An imaging element comprising a photoelectric conversion unit formed by laminating a first electrode, a photoelectric conversion layer, and a second electrode, wherein

between the first electrode and the photoelectric conversion layer, a composite oxide layer containing indium composite oxide is formed,

the composite oxide layer includes a first layer adjacent to the first electrode and a second layer adjacent to the photoelectric conversion layer, and

the first layer has a lower state density than the second layer.

11. The imaging element according to claim 10 , wherein the composite oxide layer is amorphous.

12. The imaging element according to claim 10 , wherein the photoelectric conversion unit further includes an insulating layer and a charge accumulation electrode disposed apart from the first electrode so as to face the composite oxide layer via the insulating layer.

13. The imaging element according to claim 12 , further comprising a transfer control electrode disposed apart from the first electrode and the charge accumulation electrode so as to face the composite oxide layer via the insulating layer between the first electrode and the charge accumulation electrode.

14. The imaging element according to claim 12 , further comprising a charge discharge electrode connected to the composite oxide layer and disposed apart from the first electrode and the charge accumulation electrode.

15. The imaging element according to claim 12 , wherein the charge accumulation electrode includes a plurality of charge accumulation electrode segments.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2020
From: ONO, HIDEKI; KANEDA, YUKIO
To: SONY CORPORATION; SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 052078/0986 →
Priority Claims (1)
JP JP2017-157143 · Aug 16, 2017 · national
Continuity (1)
Related Publication 20200258923A1 · Aug 13, 2020
Cited By (1)
US 12,261,187