Imaging element and electronic device

1. An imaging element comprising:

a semiconductor substrate on which a photoelectric converting unit is formed;

a wiring layer arranged on a side opposite to a light receiving surface of the semiconductor substrate, and provided with a wire and a reflective film; and

an insulating film stacked between the semiconductor substrate and the wiring layer,

wherein the reflective film is arranged between the insulating film and the wire and overlaps with at least a part of the photoelectric converting unit of each pixel in a first direction in which the semiconductor substrate and the wiring layer are stacked,

wherein a first interlayer film between the insulating film and the reflective film is thicker than the insulating film, and

wherein, when a center wavelength of light reflected by the reflective film is set to λ, a refractive index of the first interlayer film is set to n A , a refractive index of the reflective film is set to n B , and i and j are integers of 0 or larger, a thickness of the first interlayer film is set in a vicinity of (2i+1)λ/4n A , and a thickness of the reflective film is set in a vicinity of (2j+1)λ/4n B .

2. The imaging element according to claim 1 ,

wherein a thickness of the first interlayer film is in a range of 80 nm to 200 nm, and

a thickness of the reflective film is in a range of 40 nm to 80 nm.

3. The imaging element according to claim 1 ,

wherein the first interlayer film includes a silicon oxide film or a silicon nitride film as a main component, and

the reflective film includes polysilicon, amorphous silicon, or single crystal silicon as a main component.

4. The imaging element according to claim 1 ,

wherein two or more reflective films are stacked through a second interlayer film.

5. The imaging element according to claim 4 ,

wherein a thickness of the first and second interlayer films is in a range of 100 nm to 200 nm, and

a thickness of at least one of the two or more reflective films is in a range of 80 nm to 100 nm.

6. The imaging element according to claim 4 ,

wherein the first and second interlayer films include silicon oxide, silicon nitride, or TiO 2 as a main component, and

at least one of the reflective films includes polysilicon, amorphous silicon, single crystal silicon, TaO, silicon nitride, Ge, SiC, TiN, Ti, or TiO 2 as a main component.

7. The imaging element according to claim 1 ,

wherein the reflective film is arranged in a position not overlapping with a gate electrode of a transistor formed on a surface on a side opposite to the light receiving surface of the semiconductor substrate in the first direction.

8. The imaging element according to claim 1 ,

wherein at least one of a shape, a size, or a position of the reflective film is different for each pixel.

9. The imaging element according to claim 8 ,

wherein at least one of the shape, the size, or the position of the reflective film is adjusted corresponding to pupil correction.

10. The imaging element according to claim 1 ,

wherein the reflective film is shared by a plurality of pixels.

11. The imaging element according to claim 1 ,

wherein irregularities are formed on a surface of the reflective film.

12. The imaging element according to claim 1 ,

wherein a trench-shaped pixel separating unit is formed between pixels on the semiconductor substrate, and

a core is formed at a center of the trench-shaped pixel separating unit.

13. The imaging element according to claim 12 ,

wherein the core includes polysilicon, amorphous silicon, or single crystal silicon as a main component, and

the core is covered with a dielectric material including silicon oxide or silicon nitride as a main component.

14. The imaging element according to claim 13 ,

wherein a thickness of the core in a second direction in which the pixels are adjacent is in a range of 50 nm to 200 nm, and

a thickness of the dielectric material around the core in the second direction is in a range of 50 nm to 200 nm.

15. The imaging element according to claim 1 ,

wherein an antireflective film is stacked on the light receiving surface of the semiconductor substrate, and

when a second center wavelength of light for which a reflection rate of the antireflective film is lowered is set to λ and a refractive index of the antireflective film is set to n, a thickness of the antireflective film is set in a vicinity of λ/4n.

16. The imaging element according to claim 1 ,

wherein a diffraction structure is formed on the light receiving surface of the semiconductor substrate.

17. The imaging element according to claim 1 ,

wherein the center wavelength of light reflected by the reflective film is 700 nm or longer.

18. An electronic device, comprising:

an imaging element; and

a signal processing unit which processes a signal output from the imaging element, the imaging element including:

a semiconductor substrate on which a photoelectric converting unit is formed;

a wiring layer arranged on a side opposite to a light receiving surface of the semiconductor substrate, and provided with a wire and a reflective film; and

an insulating film stacked between the semiconductor substrate and the wiring layer,

wherein the reflective film is arranged between the insulating film and the wire and overlaps with at least a part of the photoelectric converting unit of each pixel in a first direction in which the semiconductor substrate and the wiring layer are stacked, and

a first interlayer film between the insulating film and the reflective film is thicker than the insulating film,

wherein, when a center wavelength of light reflected by the reflective film is set to λ, a refractive index of the first interlayer film is set to n A , a refractive index of the reflective film is set to n B , and i and j are integers of 0 or larger, a thickness of the first interlayer film is set in a vicinity of (2i+1)λ/4n A , and a thickness of the reflective film is set in a vicinity of (2j+1)λ/4n B .