IP Library › Granted Patent US 11,106,370
Granted Patent B2
US 11,106,370 · App. 16/460,787 · Granted Aug 31, 2021

Changing of memory components to be used for a stripe based on an endurance condition

Inventor: Bruce A. Liikanen (Berthoud, CO)
Assignee: Micron Technology, Inc.
G06F3/0635G06F3/0616G06F3/0653G06F3/0659G06F3/0689G06F11/1076
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Quick Facts
Patent No.
US 11,106,370
App. No.
16/460,787
Granted
Aug 31, 2021
Kind
B2
Abstract

Memory components can be determined to store one or more stripes of data. Data for one or more stripes of data can be stored based on the determined memory components. An indication that an endurance condition of the memory components has satisfied an endurance condition threshold can be received. In response to receiving the indication that the endurance condition of the memory components has satisfied the endurance condition threshold, the memory components that are to store a subsequent stripe of data can be changed. Data for the subsequent stripe of data can be stored based on the changed memory components.

Claims (39)

1. A non-transitory computer readable medium comprising instructions, which when executed by a processing device, cause the processing device to perform operations comprising:

storing data of one or more stripes at a first group of dice of a plurality of dice;

determining that the first group of dice has satisfied an endurance condition threshold comprising a predetermined number of write operations or bit errors;

storing data of one or more subsequent stripes at a second group of dice of the plurality of dice in response to determining that the first group of dice has satisfied the endurance condition threshold, the second group of dice including at least one die that is not included in the first group of dice;

changing the endurance condition threshold to a changed endurance condition threshold upon storing the data at the second group of dice, wherein the changed endurance condition threshold is based on:

a rate at which the at least one die satisfied the endurance condition threshold; and

a number of the first group of dice to come within a fixed percentage of satisfying the endurance condition threshold; and

using the changed endurance condition threshold to determine a time to store data of one or more subsequent stripes at a third group of dice of the plurality of dice.

2. The non-transitory computer readable medium of claim 1 , wherein the endurance condition threshold corresponds to a bit error rate threshold, and wherein the changed endurance condition threshold corresponds to an increased bit error rate threshold.

3. The non-transitory computer readable medium of claim 1 , wherein the endurance condition threshold corresponds to a threshold number of write operations, and wherein the changed endurance condition threshold corresponds to an increased threshold number of write operations.

4. The non-transitory computer readable medium of claim 1 , wherein the operations further comprise determining that the second group of dice has satisfied the changed endurance condition threshold.

5. The non-transitory computer readable medium of claim 4 , wherein the operations further comprise storing data of the one or more subsequent stripes at the third group of dice of the plurality of dice in response to determining that the second group of dice has satisfied the changed endurance condition threshold.

6. A system comprising:

a plurality of dice; and

a processing device operatively coupled to the plurality dice, the processing device to perform operations comprising:

storing data of one or more stripes at a first group of dice of a plurality of dice;

determining that the first group of dice has satisfied an endurance condition threshold comprising a predetermined number of write operations or bit errors;

storing data of one or more subsequent stripes at a second group of dice of the plurality of dice in response to determining that the first group of dice has satisfied the endurance condition threshold, the second group of dice including at least one die that is not included in the first group of dice;

changing the endurance condition threshold to a changed endurance condition threshold upon storing the data at the second group of dice, wherein the changed endurance condition threshold is based on:

a rate at which the at least one die satisfied the endurance condition threshold; and

a number of the first group of dice to come within a fixed percentage of satisfying the endurance condition threshold; and

using the changed endurance condition threshold to determine a time to store data of one or more subsequent stripes at a third group of dice of the plurality of dice.

7. The system of claim 6 , wherein the endurance condition threshold corresponds to a bit error rate threshold, and wherein the changed endurance condition threshold corresponds to an increased bit error rate threshold.

8. The system of claim 6 , wherein the endurance condition threshold corresponds to a threshold number of write operations, and wherein the changed endurance condition threshold corresponds to an increased threshold number of write operations.

9. The system of claim 6 , wherein the operations further comprise determining that the second group of dice has satisfied the changed endurance condition threshold.

10. The system of claim 6 , wherein the operations further comprise storing data of the one or more subsequent stripes at the third group of dice of the plurality of dice in response to determining that the second group of dice has satisfied the changed endurance condition threshold.

11. A method comprising:

storing, by a processing device, data of one or more stripes at a first group of dice of a plurality of dice;

determining, by the processing device, that the first group of dice has satisfied an endurance condition threshold comprising a predetermined number of write operations or bit errors;

storing, by the processing device, data of one or more subsequent stripes at a second group of dice of the plurality of dice in response to determining that the first group of dice has satisfied the endurance condition threshold, the second group of dice including at least one die that is not included in the first group of dice; and

changing, by the processing device, the endurance condition threshold to a changed endurance condition threshold upon storing the data at the second group of dice, wherein the changed endurance condition threshold is based on:

a number of the first group of dice to come within a fixed percentage of satisfying the endurance condition threshold; and

a number of the first group of dice to come within a fixed percentage of satisfying the endurance condition threshold; and

using, by the processing device, the changed endurance condition threshold to determine a time to store data of one or more subsequent stripes at a third group of dice of the plurality of dice.

12. The method of claim 11 , wherein the endurance condition threshold corresponds to a bit error rate threshold, and wherein the changed endurance condition threshold corresponds to an increased bit error rate threshold.

13. The method of claim 11 , wherein the endurance condition threshold corresponds to a threshold number of write operations, and wherein the changed endurance condition threshold corresponds to an increased threshold number of write operations.

14. The method of claim 11 , further comprising determining that the second group of dice has satisfied the changed endurance condition threshold.

15. The method of claim 11 , further comprising storing data of the one or more subsequent stripes at the third group of dice of the plurality of dice in response to determining that the second group of dice has satisfied the changed endurance condition threshold.

16. The method of claim 11 , wherein the changed endurance condition threshold is further based a rate at which the at least one die reached satisfied the endurance condition threshold.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2019
From: LIIKANEN, BRUCE A.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 049658/0520 →
Continuity (1)
Related Publication 20210004170A1 · Jan 7, 2021