Multi-charged particle beam image acquisition apparatus and multi-charged particle beam image acquisition method
A multi-charged particle beam image acquisition apparatus includes an image acquisition mechanism, including a stage on which a target object is capable to be disposed and a deflector for deflecting multiple charged particle beams in array arrangement, configured to acquire, in a state where a scan region width to be scanned by each of the multiple beams has been set depending on an image averaging frequency, image data of each beam by scanning the target object with deflected multiple beams while relatively shifting a stage moving direction angle and an array arranging direction angle of the multiple beams from each other, and an averaging circuit configured to average, using image data of each beam, errors of the image data by superimposing image data of the same position at the image averaging frequency.
1. A multi-charged particle beam image acquisition apparatus comprising:
an image acquisition mechanism, including a stage on which a target object is capable to be disposed and a deflector which deflects multiple charged particle beams in an array arrangement, configured to acquire, in a state where a scan region width to be scanned by each beam of the multiple charged particle beams has been set depending on an image averaging frequency, image data of the each beam by scanning the target object with the multiple charged particle beams deflected by the deflector while relatively shifting an angle of a moving direction of the stage and an angle of an array arranging direction of the multiple charged particle beams from each other; and
an averaging circuit configured to average, using the image data of the each beam, errors of the image data by superimposing image data of a same position at the image averaging frequency.
2. The apparatus according to claim 1 further comprising:
an individual region setting circuit configured to set an individual scan region of the each beam on the target object which extends in parallel to the moving direction of the stage, by relatively shifting the angle of the moving direction of the stage and the angle of the array arranging direction of the multiple charged particle beams from each other, wherein
the scan region width of the each beam is set such that the individual scan region of other beam is included in a direction perpendicular to the moving direction of the stage.
3. The apparatus according to claim 1 , wherein the image averaging frequency can be set variably.
4. The apparatus according to claim 1 , wherein the image averaging frequency is set from two to a number of beams of the multiple charged particle beams.
5. The apparatus according to claim 1 , wherein,
an individual block region, being a quadrangle, whose side has a length of a beam pitch indicating a pitch between mutually adjacent beams is set for the each beam of the multiple charged particle beams, and
the scan region width of the each beam is set such that the individual block region of other beam is included in a two-dimensional direction.
6. A multi-charged particle beam image acquisition method comprising:
acquiring, in a state where a scan region width to be scanned by each beam of multiple charged particle beams in an array arrangement has been set depending on an image averaging frequency, image data of the each beam by scanning a target object disposed on a stage with the multiple charged particle beams deflected by a deflector while relatively shifting an angle of a moving direction of the stage and an angle of an array arranging direction of the multiple charged particle beams from each other; and
averaging, using the image data of the each beam, errors of the image data by superimposing image data of a same position at the image averaging frequency.
7. The method according to claim 6 further comprising:
setting an individual scan region of the each beam on the target object which extends in parallel to the moving direction of the stage, by relatively shifting the angle of the moving direction of the stage and the angle of the array arranging direction of the multiple charged particle beams from each other, wherein
the scan region width of the each beam is set such that the individual scan region of other beam is included in a direction perpendicular to the moving direction of the stage.
8. The method according to claim 6 , wherein the image averaging frequency can be set variably.
9. The method according to claim 6 , wherein the image averaging frequency is set from two to a number of beams of the multiple charged particle beams.
10. The method according to claim 6 , wherein,
an individual block region, being a quadrangle, whose side has a length of a beam pitch indicating a pitch between mutually adjacent beams is set for the each beam of the multiple charged particle beams, and
the scan region width of the each beam is set such that the individual block region of other beam is included in a two-dimensional direction.
11. The apparatus according to claim 1 , wherein the image acquisition mechanism scans the target object with the multiple charged particle beams deflected by the deflector while relatively shifting the angle of the moving direction of the stage and the angle of the array arranging direction of the multiple charged particle beams from each other so that a plurality of beams of the multiple charged particle beams are not arranged in parallel to the moving direction of the stage.
12. The apparatus according to claim 1 , wherein the image acquisition mechanism acquires, in the state where the scan region width to be scanned by the each beam of the multiple charged particle beams has been variably set correspondingly depending on the image averaging frequency having been set, the image data of the each beam.
13. The method according to claim 6 , wherein the target object is scanned with the multiple charged particle beams deflected by the deflector while relatively shifting the angle of the moving direction of the stage and the angle of the array arranging direction of the multiple charged particle beams from each other so that a plurality of beams of the multiple charged particle beams are not arranged in parallel to the moving direction of the stage.
14. The method according to claim 6 , wherein the image data of the each beam is acquired in the state where the scan region width to be scanned by the each beam of the multiple charged particle beams has been variably set correspondingly depending on the image averaging frequency having been set.