Non-destructive inspection methods, systems and apparatuses using focusable x-ray backscatter detectors

1. A method for non-destructively inspecting a target, the method comprising:

positioning a non-destructive X-ray backscatter inspection apparatus proximate to a target, said target having an exterior target surface, said exterior target surface having an exterior target surface geometry, said X-ray backscatter apparatus comprising:

an X-ray radiation source configured to emit X-ray beams, said X-ray beams configured to at least partially penetrate the exterior target surface;

a collimator in communication with the X-ray radiation source, said collimator configured to form a beam using a portion of X-ray radiation emitted by the X-ray radiation source;

a flexible X-ray backscatter detector, said flexible X-ray backscatter detector configured to detect X-ray backscatter formed in response to the beam encountering the target, said flexible X-ray backscatter detector comprising:

a one-piece flexible X-ray backscatter detector substrate; and

at least one substantially continuous flexible X-ray scintillating material layer, said at least one substantially continuous flexible X-ray scintillating material layer configured to substantially cover the one-piece flexible X-ray backscatter detector substrate to form a substantially continuous flexible X-ray scintillating material coating layer on the one-piece flexible X-ray backscatter detector substrate;

orienting the flexible X-ray backscatter detector comprising the substantially continuous flexible X-ray scintillating material coating layer to a predetermined flexible X-ray backscatter detector geometry, said predetermined flexible X-ray backscatter detector geometry configured to substantially match the exterior target surface geometry, said predetermined flexible X-ray backscatter detector geometry conformable to the exterior target surface geometry to obtain a point-for-point imaging capability;

emitting an X-ray beam towards the target;

focusing the flexible X-ray backscatter detector to maximize an amount of X-ray backscatter returning to the flexible X-ray backscatter detector comprising the substantially continuous flexible X-ray scintillating material coating layer from the target and impacting the flexible X-ray backscatter detector comprising the substantially continuous flexible X-ray scintillating material coating layer;

establishing a substantially constant distance between the at least one substantially continuous flexible X-ray scintillating material coating layer and the exterior target surface across a length of the flexible X-ray backscatter detector comprising the substantially continuous flexible X-ray scintillating material coating layer;

scanning the X-ray beam;

detecting X-ray backscatter across the totality of the at least one substantially continuous flexible X-ray scintillating material coating layer;

generating image data in response to X-ray backscatter detected on the substantially continuous flexible X-ray scintillating material coating layer;

forming a target image using the image data; and

non-destructively inspecting the target.

2. The method of claim 1 , further comprising:

indirectly detecting X-ray backscatter on the substantially continuous flexible X-ray scintillating material coating layer.

3. The method of claim 1 , wherein the flexible X-ray backscatter detector substrate has a thickness ranging from about 50 nm to about 100 nm.

4. The method of claim 1 , wherein the at least one substantially continuous flexible X-ray scintillating material coating layer has a thickness ranging from about 200 nm to about 500 nm.

5. A non-destructive X-ray backscatter inspection apparatus comprising:

an X-ray radiation source configured to emit X-rays;

a collimator in communication with the X-ray radiation source, said collimator configured to form a beam using at least a portion of the X-ray emitted by the X-ray radiation source, wherein the beam is directed to a target, said target comprising an exterior target surface, said exterior target surface comprising an exterior target surface geometry;

a flexible X-ray backscatter detector, said flexible X-ray backscatter detector configured to detect X-ray backscatter formed in response to the beam encountering the exterior target surface, said flexible X-ray backscatter detector conformable to the exterior target surface geometry to obtain a point-for-point imaging capability, said flexible X-ray backscatter detector comprising:

a one-piece flexible X-ray backscatter detector substrate comprising: at least one substantially continuous flexible X-ray scintillating material layer, said at least one substantially continuous flexible X-ray scintillating material layer configured to substantially cover a surface of the one-piece flexible X-ray backscatter detector substrate;

wherein the flexible X-ray backscatter detector is configured to maximize capture of an amount of X-ray backscatter returning to the flexible X-ray backscatter detector from the target and impacting the flexible X-ray backscatter detector across the totality of the X-ray backscatter detector; and

wherein the flexible X-ray backscatter detector is configured to establish a substantially constant distance between the at least one substantially continuous flexible X-ray scintillating material layer and the exterior target surface across the totality of the flexible X-ray backscatter detector.

6. The apparatus of claim 5 , wherein the exterior target surface geometry comprises at least one of: a non-planar geometry; an irregular geometry; a contoured geometry, and combinations thereof.

7. The apparatus of claim 5 , wherein said X-rays are configured to at least partially penetrate the exterior target surface.

8. The apparatus of claim 5 , wherein the one-piece flexible X-ray backscatter detector substrate comprises an organic carbon-containing material.

9. The apparatus of claim 5 , wherein the one-piece flexible X-ray backscatter detector substrate comprises at least one of: a carbon-based siloxane material; polyethylene naphthalate; poly-4-vinylphenol; and combinations thereof.

10. The apparatus of claim 5 , wherein the one-piece flexible X-ray backscatter detector substrate has a thickness ranging from about 50 nm to about 100 nm.

11. The apparatus of claim 5 , wherein the at least one substantially continuous flexible X-ray scintillating material layer comprises at least one of: gadolinium oxide doped with europium; gadolinium oxysulfate; cesium iodide; and calcium tungstate, and combinations thereof.

12. The apparatus of claim 5 , wherein the at least one substantially continuous flexible X-ray scintillating material layer has a thickness ranging from about 200 nm to about 500 nm.

13. The apparatus of claim 5 , wherein the at least one substantially continuous flexible X-ray scintillating material layer is configured to be deposited onto the flexible X-ray backscatter detector substrate.

14. The apparatus of claim 5 , wherein the at least one substantially continuous flexible X-ray scintillating material layer comprises a printable scintillating inkjet printer ink.

15. The apparatus of claim 5 , wherein the at least one substantially continuous flexible X-ray scintillating material layer is configured to be printed onto the one-piece flexible X-ray backscatter detector substrate.

16. The apparatus of claim 5 , wherein the flexible X-ray backscatter detector comprises a flexible X-ray backscatter detector geometry, said flexible X-ray backscatter detector geometry configured to substantially conform to the exterior target surface geometry, and exterior target surface geometry is a non-planar target surface geometry.

17. The apparatus of claim 16 , wherein the non-planar target surface geometry comprises at least one of: a concave geometry; a convex geometry, an irregular geometry, a contoured geometry; and combinations thereof.

18. A flexible X-ray backscatter detector for a non-destructive X-ray backscatter system, said flexible X-ray backscatter detector comprising:

a one-piece flexible X-ray backscatter detector substrate;

at least one substantially continuous flexible X-ray scintillating material layer, said at least one substantially continuous flexible X-ray scintillating material layer configured to substantially cover at least one surface of the one-piece flexible X-ray backscatter detector substrate to form a substantially continuous flexible X-ray scintillating material coating layer;

wherein in use the flexible X-ray backscatter detector is configured to maximize a capture of an amount of X-ray backscatter returning from a target to the flexible X-ray backscatter detector and impacting the flexible X-ray backscatter detector across the totality of the X-ray backscatter detector, said target comprising an exterior target surface, said exterior target surface comprising an exterior target surface geometry, said flexible X-ray backscatter detector conformable to the exterior target surface geometry to obtain a point-for-point imaging capability; and

wherein in use the flexible X-ray backscatter detector is configured to establish a substantially constant distance between the substantially continuous flexible X-ray scintillating material coating layer and the exterior target surface across an entire length of the flexible X-ray backscatter detector.

19. The detector of claim 18 , wherein the flexible X-ray backscatter detector substrate has a thickness ranging from about 50 nm to about 100 nm.

20. The detector of claim 18 , wherein the at least one substantially continuous flexible X-ray scintillating material coating layer has a thickness ranging from about 200 nm to about 500 nm.