IP Library › Granted Patent US 11,131,708
Granted Patent B2
US 11,131,708 · App. 15/930,601 · Granted Sep 28, 2021

Aligning mechanism and aligning method

Inventor: Tomoya Endo (Yamanashi, JP)
Assignee: Tokyo Electron Limited
G01R31/2887G01R1/0408
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Quick Facts
Patent No.
US 11,131,708
App. No.
15/930,601
Granted
Sep 28, 2021
Kind
B2
Abstract

An aligning mechanism according to one aspect of the present disclosure includes a mounting table on which a substrate is placed; a holding section configured to hold the mounting table from below; lifting pins configured to raise or lower the mounting table with respect to the holding section; and an aligner configured to support the holding section from below, and to change a position of the holding section relative to the lifting pins. In the holding section and the aligner, through-holes are formed such that the lifting pins can penetrate the through-holes.

Claims (18)

1. An aligning mechanism comprising:

a mounting table on which a substrate is placed;

a first holding section configured to hold the mounting table from below;

lifting pins configured to raise or lower the mounting table with respect to the first holding section; and

an aligner configured to support the first holding section from below, and to change a position of the first holding section relative to the lifting pins; wherein

through-holes are formed in the first holding section and the aligner, such that the lifting pins can pass through the through-holes.

2. The aligning mechanism according to claim 1 , further comprising an interconnect member disposed at a predetermined position with respect to the first holding section, the interconnect member including a contacting part capable of electrically contacting electrodes of devices formed on the substrate.

3. The aligning mechanism according to claim 2 , wherein the interconnect member is a probe card including probes configured to contact the electrodes of the devices.

4. The aligning mechanism according to claim 2 , further comprising a second holding section configured to maintain the interconnect member at a constant position relative to the first holding section at all times.

5. The aligning mechanism according to claim 1 , wherein the mounting table is a vacuum chuck.

6. A method of aligning a mounting table to a holding section, the method comprising:

placing, on the holding section, the mounting table on which a substrate is placed;

supporting, by an aligner, the holding section from below, while the mounting table is placed on the holding section;

separating the mounting table from the holding section by lifting the mounting table upward; and

changing a position of the mounting table relative to the holding section, by moving the aligner in a horizontal direction, while the mounting table is separated from the holding section upward.

7. The method according to claim 6 , further comprising:

placing, after the changing, the mounting table on the holding section by moving the mounting table downward; and

disposing an interconnect member at a predetermined position with respect to the holding section, the interconnect member including a contacting part capable of electrically contacting electrodes of devices formed on the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 13, 2020
From: ENDO, TOMOYA
To: TOKYO ELECTRON LIMITED
Reel/Frame 052647/0558 →
Priority Claims (1)
JP JP2019-103182 · May 31, 2019 · national
Continuity (1)
Related Publication 20200379037A1 · Dec 3, 2020