Semiconductor package
A semiconductor package includes a semiconductor chip disposed on a first substrate, a mold layer covering a sidewall of the semiconductor chip and including a through-hole, a second substrate disposed on the semiconductor chip, a connection terminal disposed between the first substrate and the second substrate and provided in the through-hole, and an underfill resin layer extending from between the semiconductor chip and the second substrate into the through-hole.
1. A semiconductor package comprising:
a first substrate;
a first semiconductor chip disposed on the first substrate;
a plurality of support patterns laterally spaced apart from each other on an upper surface of the first semiconductor chip;
a second substrate on the plurality of support patterns;
a connection terminal between the first substrate and the second substrate, the connection terminal electrically connecting the first substrate to the second substrate; and
a molding structure disposed between the first substrate and the second substrate and surrounding sidewalls of the connection terminal,
wherein each of the plurality of support patterns extends through a portion of the molding structure between the first semiconductor chip and the second substrate so as to contact the upper surface of the first semiconductor chip.
2. The semiconductor package of claim 1 , wherein the plurality of support patterns are in contact with a bottom surface of the second substrate.
3. The semiconductor package of claim 1 ,
wherein the molding structure extends to a gap between side surfaces of the plurality of support patterns, the gap provided between the upper surface of the first semiconductor chip and a bottom surface of the second substrate.
4. The semiconductor package of claim 1 , wherein the plurality of support patterns are connected to the second substrate.
5. The semiconductor package of claim 4 , wherein the plurality of support patterns include the same material as the second substrate.
6. The semiconductor package of claim 1 , further comprising:
a third substrate disposed on the second substrate and electrically connected to the second substrate; and
a second semiconductor chip mounted on the third substrate.
7. The semiconductor package of claim 1 , the plurality of support patterns include an epoxy-based resin or a metal material.
8. The semiconductor package of claim 1 , wherein a top surface of each of the plurality of support patterns is in contact with the second substrate, and
wherein a bottom surface of each of the plurality of support patterns is in contact with the first semiconductor chip.
9. The semiconductor package of claim 1 , wherein the molding structure comprises:
a first molding layer covering a side surface of the first semiconductor chip and including an epoxy-based resin; and
a second molding layer disposed on the first molding layer and including an epoxy-based resin.
10. A semiconductor package comprising:
a first semiconductor chip mounted on a first substrate;
a second substrate on the first substrate, the first semiconductor chip disposed between the first substrate and the second substrate;
a connection terminal between the first substrate and the second substrate, the connection terminal electrically connecting the first substrate to the second substrate;
a molding structure disposed between the first substrate and the second substrate and surrounding sidewalls of the connection terminal; and
wherein the second substrate includes protrusions protruding from a bottom surface of the second substrate,
wherein the protrusions extend through the molding structure to an upper surface of the first semiconductor chip, the protrusions being in contact with the upper surface of the first semiconductor chip.
11. The semiconductor package of claim 10 , wherein the protrusions are laterally spaced apart from each other.
12. The semiconductor package of claim 10 , wherein each of the protrusions include the same material as a lowermost one of stacked layers of the second substrate.
13. The semiconductor package of claim 12 , the protrusions include an insulating material.
14. The semiconductor package of claim 13 , wherein the protrusions include a photo solder resist (PSR).
15. The semiconductor package of claim 10 , wherein the second substrate comprises an interposer substrate.
16. The semiconductor package of claim 15 , further comprising:
a third substrate disposed on the second substrate and electrically connected to the second substrate; and
a second semiconductor chip mounted on the third substrate.
17. A semiconductor package comprising:
a first semiconductor chip mounted on a first substrate;
a second substrate on the first semiconductor chip;
a plurality of support patterns laterally spaced apart from each other between the first semiconductor chip and the second substrate;
a connection terminal between the first substrate and the second substrate, the connection terminal electrically connecting the first substrate to the second substrate; and
a molding structure disposed between the first substrate and the second substrate and between the first semiconductor chip and the second substrate, the molding structure surrounding sidewalls of the connection terminal,
wherein a top surface of each of the plurality of support patterns is in contact with the second substrate,
wherein a bottom surface of each of the plurality of support patterns is in contact with the first semiconductor chip, and
wherein the molding structure extends between the plurality of support patterns.
18. The semiconductor package of claim 17 , wherein the second substrate comprises an interposer substrate.