IP Library › Granted Patent US 11,137,442
Granted Patent B2
US 11,137,442 · App. 16/535,433 · Granted Oct 5, 2021

Stiffener and probe card including the same

Inventors: Sang-Ik Lee (Hwaseong-si, KR); Sung-Yong Park (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G01R31/2887G01R1/07307G01R31/2818
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Quick Facts
Patent No.
US 11,137,442
App. No.
16/535,433
Granted
Oct 5, 2021
Kind
B2
Abstract

A stiffener of a probe card includes: a body plate arranged between a test head and a printed circuit board (PCB) of the probe card, wherein the test head is configured to apply a test signal to an object, and the PCB is configured to receive the test signal; a plurality of ribs radially extending from the body plate; an inner rim configured to surround the body plate to connect middle portions of the ribs with each other; and a plurality of contact members arranged on upper surfaces of at least two ribs among the ribs, and configured to make contact with the test head.

Claims (33)

1. A stiffener of a probe card, the stiffener comprising:

a body plate arranged between a test head and a printed circuit board (PCB) of the probe card, wherein the test head is configured to apply a test signal to an object, and the PCB is configured to receive the test signal;

a plurality of ribs radially extending from the body plate;

an inner rim configured to surround the body plate to connect middle portions of the ribs with each other; and

a plurality of contact members arranged on upper, surfaces of at least two ribs among the ribs, and configured to make contact with the test head.

2. The stiffener of claim 1 , wherein each of the contact members is arranged on a part of the upper surface of each of the ribs.

3. The stiffener of claim 2 , wherein each of the contact members is extended from an outer end of each of the ribs to the middle portion of each of the ribs.

4. The stiffener of claim 1 , wherein each of the contact members is integrally formed with at least two ribs among the ribs.

5. The stiffener of claim 1 , wherein the contact members are spaced apart from each other by a gap.

6. The stiffener of claim 1 , wherein the contact members are arranged on the upper surfaces of all of the ribs.

7. The stiffener of claim 1 , wherein each of the contact members is integrally formed with each of the ribs.

8. The stiffener of claim 1 , wherein the ribs are spaced apart from each other by a gap.

9. The stiffener of claim 1 , further comprising an outer rim configured to connect outer ends of the ribs with each other.

10. A probe card comprising:

a. printed circuit board (PCB) including a test pattern, wherein a test signal of a test head flows through the test pattern and is applied to an object;

a stiffener disposed between the test head and the PCB;

a plurality of contact members disposed between the stiffener and the test head to contact the stiffener and the test head;

a multi-layered substrate overlapping the PCB and electrically connected with the test pattern; and

a plurality of needles arranged on a lower surface of the multi-layered substrate and configured to electrically contact the object.

11. The probe card of claim 10 , wherein the contact members are integrally formed with the stiffener.

12. The probe card of claim 11 , wherein the stiffener comprises:

a body plate arranged between the test head and the PCB;

a plurality of ribs radially extending from the body plate, wherein the contact members are arranged on the ribs; and

an inner rim configured to surround the body plate and to connect middle portions of the ribs with each other.

13. The probe card of claim 12 , wherein the contact members are arranged on upper surfaces of at least two ribs among the ribs.

14. The probe card of claim 12 , wherein the contact members are arranged on upper surfaces of all of the ribs.

15. The probe card of claim 12 , wherein each of the contact members is arranged on a part of an upper surface of each of the ribs.

16. The probe card of claim 15 , wherein each of the contact members is extended from an outer end of each of the ribs to the middle portion of each of the ribs.

17. The probe card of claim 12 , wherein each of the contact members is integrally formed with at least two ribs among the ribs.

18. The probe card of claim 12 , wherein the contact members are spaced apart from each other by a uniform gap.

19. The probe card of claim 12 , wherein the ribs are spaced apart from each other by a uniform gap.

20. The probe card of claim 12 , wherein the stiffener further comprises an outer rim configured to connect outer ends of the ribs with each other.

21. The stiffener of claim 1 , wherein the plurality of contact members is disposed above the upper surfaces of the at least two ribs among the ribs.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2019
From: LEE, SANG-IK; PARK, SUNG-YONG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 050000/0833 →
Priority Claims (1)
KR 10-2019-0015357 · Feb 11, 2019 · national
Continuity (1)
Related Publication 20200256916A1 · Aug 13, 2020