Apparatuses and methods for a multiple master capable debug interface
Methods and apparatuses relating to a multiple master capable debug interface are described. In one embodiment, an apparatus includes a device circuit, a wireless connector circuit, and a switching circuit coupled between the device circuit and the wireless connector circuit to switch a debug and test mastership from the wireless connector circuit to a debug and test tool, wirelessly connected to the wireless connector circuit, to perform a debug and test operation on the device circuit.
1. An apparatus comprising:
a device circuit;
a wireless connector circuit; and
a switching circuit coupled between the device circuit and the wireless connector circuit to switch a debug and test control from the wireless connector circuit to a debug and test tool, wirelessly connected to the wireless connector circuit, to perform a debug and test operation on the device circuit.
2. The apparatus of claim 1 , wherein the switching circuit is to switch the debug and test control to the debug and test tool to further perform a debug and test operation on the wireless connector circuit.
3. The apparatus of claim 1 , wherein the switch of the debug and test control comprises a stall of the wireless connector circuit as a primary controller.
4. The apparatus of claim 3 , wherein a request by the debug and test tool to perform the debug and test operation causes the stall of the wireless connector circuit as the primary controller.
5. The apparatus of claim 1 , wherein the debug and test control is acknowledged according to a bus standard.
6. The apparatus of claim 1 , wherein the debug and test control is a sole control when switched to the debug and test tool.
7. The apparatus of claim 1 , wherein the debug and test tool wirelessly connects through the wireless connector circuit to a multiple pin Joint Test Action Group (JTAG) interface.
8. The apparatus of claim 1 , wherein the device circuit further comprises an internal debug and test tool.
9. A method comprising:
wirelessly connecting a debug and test tool to a wireless connector circuit;
switching a debug and test control, with a switching circuit coupled between a device circuit and the wireless connector circuit, from the wireless connector circuit to the debug and test tool wirelessly connected to the wireless connector circuit; and
performing a debug and test operation on the device circuit with the debug and test tool having the debug and test control.
10. The method of claim 9 , further comprising performing a debug and test operation on the wireless connector circuit with the debug and test tool having the debug and test control.
11. The method of claim 9 , wherein the switching of the debug and test control comprises stalling the wireless connector circuit as a primary controller.
12. The method of claim 11 , wherein sending a request by the debug and test tool to perform the debug and test operation causes the stalling of the wireless connector circuit as the primary controller.
13. The method of claim 9 , further comprising acknowledging the debug and test control according to a bus standard.
14. The method of claim 9 , wherein the debug and test control is a sole control when switched to the debug and test tool.
15. The method of claim 9 , wherein the wirelessly connecting comprises wirelessly connecting the debug and test tool through the wireless connector circuit to a multiple pin Joint Test Action Group (JTAG) interface.
16. The method of claim 9 , wherein the device circuit comprises an internal debug and test tool.
17. A non-transitory machine readable medium that stores code that when executed by a machine causes the machine to perform a method comprising:
wirelessly connecting a debug and test tool to a wireless connector circuit;
switching a debug and test control, with a switching circuit coupled between a device circuit and the wireless connector circuit, from the wireless connector circuit to the debug and test tool wirelessly connected to the wireless connector circuit; and
performing a debug and test operation on the device circuit with the debug and test tool having the debug and test control.
18. The non-transitory machine readable medium of claim 17 , further comprising performing a debug and test operation on the wireless connector circuit with the debug and test tool having the debug and test control.
19. The non-transitory machine readable medium of claim 17 , wherein the switching of the debug and test control comprises stalling the wireless connector circuit as a primary controller.
20. The non-transitory machine readable medium of claim 19 , wherein sending a request by the debug and test tool to perform the debug and test operation causes the stalling of the wireless connector circuit as the primary controller.
21. The non-transitory machine readable medium of claim 17 , further comprising acknowledging the debug and test control according to a bus standard.
22. The non-transitory machine readable medium of claim 17 , wherein the debug and test control is a sole control when switched to the debug and test tool.
23. The non-transitory machine readable medium of claim 17 , wherein the wirelessly connecting comprises wirelessly connecting the debug and test tool through the wireless connector circuit to a multiple pin Joint Test Action Group (JTAG) interface.
24. The non-transitory machine readable medium of claim 17 , wherein the device circuit comprises an internal debug and test tool.