IP Library › Granted Patent US 11,152,260
Granted Patent B2
US 11,152,260 · App. 16/574,672 · Granted Oct 19, 2021

Embedding method and processing system

Inventor: Tadahiro Ishizaka (Nirasaki, JP)
Assignee: TOKYO ELECTRON LIMITED
H01L21/76882H01L21/28556H01L21/67017H01L21/76843H01L21/76877H01L21/76879
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Quick Facts
Patent No.
US 11,152,260
App. No.
16/574,672
Granted
Oct 19, 2021
Kind
B2
Abstract

An embedding method includes: removing a metal oxide film at a surface of a metal layer from a substrate that includes the metal layer on a bottom of a recess formed in an insulating layer; covering the surface of the metal layer by embedding ruthenium in the recess from the bottom of the recess; forming a ruthenium liner film in the recess; and further embedding ruthenium in the recess in which the liner film is formed.

Claims (13)

1. An embedding method comprising:

removing a metal oxide film at a surface of a metal layer from a substrate that comprises the metal layer on a bottom of a recess formed in an insulating layer;

covering the surface of the metal layer by embedding ruthenium in the recess from the bottom of the recess;

forming a ruthenium liner film in the recess; and

further embedding ruthenium in the recess in which the liner film is formed,

wherein a material of the metal layer is a metal material to which ruthenium does not diffuse,

the material of the metal layer includes one of tungsten, copper, and ruthenium,

in the covering the surface of the metal layer by embedding ruthenium in the recess from the bottom of the recess, no oxygen gas is used and a gas containing Ru 3 (CO) 12 is used, and

in the forming the ruthenium liner film in the recess, a gas containing a ruthenium component that comprises a hydrocarbon group and oxygen gas are used.

2. The embedding method of claim 1 , wherein, in the forming the ruthenium liner film in the recess, a gas containing Ru(DMBD)(CO) 3 and oxygen gas are used.

3. The embedding method of claim 2 , wherein, in the further embedding the ruthenium in the recess in which the liner film is formed, a gas containing Ru 3 (CO) 12 is used.

4. The embedding method of claim 1 , wherein, in the further embedding the ruthenium in the recess in which the liner film is formed, a gas containing Ru 3 (CO) 12 is used.

5. The embedding method of claim 1 , wherein, in the further embedding the ruthenium in the recess in which the liner film is formed, a gas containing Ru(DMBD)(CO) 3 and oxygen gas are used.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2019
From: ISHIZAKA, TADAHIRO
To: TOKYO ELECTRON LIMITED
Reel/Frame 050445/0406 →
Priority Claims (1)
JP JP2018-176468 · Sep 20, 2018 · national
Continuity (1)
Related Publication 20200098627A1 · Mar 26, 2020
Cited By (1)
US 12,227,841