IP Library › Granted Patent US 11,161,146
Granted Patent B2
US 11,161,146 · App. 15/757,170 · Granted Nov 2, 2021

IC die, probe and ultrasound system

Inventor: Wojtek Sudol (Andover, MA)
Assignee: KONINKLIJKE PHILIPS N.V.
B06B1/0292A61B8/12A61B8/4483B06B1/02B81C1/00349H01L24/46H01R9/0515H01R12/62H01R43/205H05K3/3421H05K2201/09409H05K2201/10356Y02P70/50
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Quick Facts
Patent No.
US 11,161,146
App. No.
15/757,170
Granted
Nov 2, 2021
Kind
B2
Abstract

An integrated circuit die ( 1 ) is disclosed that comprises a substrate ( 30 ) defining a plurality of circuit elements; a sensor region ( 10 ) on the substrate, the sensor region comprising a layer stack defining a plurality of CMUT (capacitive micromachined ultrasound transducer) cells ( 11 ); and an interposer region ( 60 ) on the substrate adjacent to the sensor region. The interposer region comprises a further layer stack including conductive connections to the circuit elements and the CMUT cells, the conductive connections connected to a plurality of conductive contact regions on an upper surface of the interposer region, the conductive contact regions including external contacts ( 61 ) for contacting the integrated circuit die to a connection cable ( 410 ) and mounting pads ( 65 ) for mounting a passive component ( 320 ) on the upper surface. A probe including such an integrated circuit die an ultrasound system including such a probe are also disclosed.

Claims (29)

1. An imaging assembly for an intraluminal device, the imaging assembly comprising:

a substrate defining a plurality of circuit elements;

a sensor region formed in a top portion of the substrate, the sensor region comprising a layer stack defining a plurality of ultrasound transducer cells; and

an interposer region of the substrate formed in the top portion of the substrate adjacent to the sensor region, the interposer region comprising a further layer stack including conductive connections to the circuit elements and the ultrasound transducer cells, the conductive connections connected to a plurality of conductive contact regions on an upper surface of the interposer region, the conductive contact regions including external contacts for contacting the imaging assembly to a connection cable and mounting pads for mounting a passive component on the upper surface;

wherein the external contacts comprise:

a first external contact region along an edge of the upper surface opposite a boundary between the sensor region and the interposer region; and

a second external contact region in between the first external contact region and said boundary, the second external contact region comprising a further array of external contacts for contacting the imaging assembly to the external connection cable, the further array being positioned between a first array and said boundary.

2. The imaging assembly of claim 1 , further comprising a metallization stack in between the substrate and the sensor and interposer regions.

3. The imaging assembly of claim 1 , further comprising at least one passive component mounted on the mounting pads on said upper surface.

4. The imaging assembly of claim 3 , wherein the at least one passive component comprises a decoupling or bypass capacitor.

5. The imaging assembly of claim 1 , wherein the interposer region ( 60 ) is recessed relative to the sensor region.

6. The imaging assembly of claim 1 , wherein the first external contact region comprises at least one external contact for grounding the imaging assembly.

7. An imaging assembly for an intraluminal device, the imaging assembly comprising:

a substrate defining a plurality of circuit elements;

a sensor region formed in a top portion of the substrate, the sensor region comprising a layer stack defining a plurality of ultrasound transducer cells; and

an interposer region of the substrate formed in the top portion of the substrate adjacent to the sensor region, the interposer region comprising a further layer stack including conductive connections to the circuit elements and the ultrasound transducer cells, the conductive connections connected to a plurality of conductive contact regions on an upper surface of the interposer region, the conductive contact regions including external contacts for contacting the imaging assembly to a connection cable and mounting pads for mounting a passive component on the upper surface;

wherein the external contacts comprise an array of external contacts, the upper surface further comprising an array of alignment members in between the array of external contacts and said boundary, wherein each external contact of said array of external contacts is positioned in between a pair of neighboring alignment members in said array of alignment members.

8. The imaging assembly of claim 7 , wherein the contact regions are plated with at least one of gold and nickel.

9. An imaging device comprising:

a body configured for insertion into a patient; and

an imaging assembly associated with said body, the imaging assembly comprising

a substrate defining a plurality of circuit elements;

a sensor region formed in a top portion of the substrate, the sensor region comprising a layer stack defining a plurality of ultrasound transducer cells; and

an interposer region formed in the top portion of the substrate adjacent to the sensor region, the interposer region comprising a further layer stack including conductive connections to the circuit elements and the ultrasound transducer cells, the conductive connections connected to a plurality of conductive contact regions on an upper surface of the interposer region, the conductive contact regions including external contacts for contacting the integrated circuit die to a connection cable and mounting pads for mounting a passive component on the upper surface, wherein the external contacts comprise a first external contact region along an edge of the upper surface opposite a boundary between the sensor region and the interposer region, and a second external contact region in between the first external contact region and said boundary, the second external contact region comprising a further array of external contacts for contacting the imaging assembly to the external connection cable, the further array being positioned between the first array and said boundary.

10. The imaging device of claim 9 , wherein the imaging assembly is encapsulated in a resin encapsulation.

11. The imaging device of claim 10 , wherein the resin encapsulation comprises a recessed portion over the sensor region.

12. The imaging device of claim 9 , wherein the imaging device is a catheter.

13. The imaging device of claim 9 , further comprising a connection cable mounted on the external contacts.

14. The imaging device of claim 13 , wherein at least part of the connection cable is encapsulated in a resin encapsulation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2018
From: SUDOL, WOJTEK
To: KONINKLIJKE PHILIPS N.V.
Reel/Frame 045091/0229 →
Priority Claims (1)
EP 15198399 · Dec 8, 2015 · regional
Continuity (2)
Provisional Application 62213811 · Sep 3, 2015
Related Publication 20180264519A1 · Sep 20, 2018