Tuned oscillator atomic force microscopy methods and apparatus
Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.
1. A method for controlling operation of an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the method comprising:
using a controller to perform:
prior to controlling the cantilever to image the surface of the sample while exhibiting only one stable oscillation state by oscillating the cantilever at or near its resonance frequency and at a first free oscillation amplitude and a first quality factor which are associated with the only one stable oscillation state,
determining the first quality factor and the first free oscillation amplitude using the resonance frequency and a spring constant of the cantilever, wherein the cantilever exhibits the only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor, wherein the first free oscillation amplitude is smaller than 3 Angstroms and the first quality factor is between 300 and 1000; and
after determining the first quality factor and the first free oscillation amplitude, controlling the cantilever of the atomic force microscope to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near the resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.
2. The method of claim 1 , wherein controlling the cantilever to operate at the first quality factor comprises using quality factor control circuitry to automatically control the cantilever to operate at the first quality factor.
3. The method of claim 1 , wherein the first free oscillation amplitude is smaller than a decay length of an interaction potential between the probe tip and the sample.
4. The method of claim 1 , wherein controlling the cantilever comprises controlling the cantilever to operate such that the probe tip is at a distance of 2-10 Angstroms from the surface of the sample.
5. The method of claim 1 , wherein the determining the first quality factor and the first free oscillation amplitude comprises:
obtaining a plurality of quality factors and a plurality of free oscillation amplitudes; and
selecting, as the first quality factor and the first free oscillation amplitude, a quality factor in the plurality of quality factors and a free oscillation amplitude that maximize relative amplitude and/or phase changes in the oscillation of the cantilever during approach to the surface of the sample.
6. The method of claim 1 , wherein the determining the first quality factor and the first free oscillation amplitude comprises:
obtaining a plurality of quality factors and a plurality of free oscillation amplitudes; and
selecting, as the first quality factor and the first free oscillation amplitude, a quality factor in the plurality of quality factors and a free oscillation amplitude that correspond to a desired measurement bandwidth of the atomic force microscope.
7. A system for controlling operation of an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the system comprising:
a controller configured to perform:
prior to controlling the cantilever to image the surface of the sample while exhibiting only one stable oscillation state by oscillating the cantilever at or near its resonance frequency and at a first free oscillation amplitude and a first quality factor which are associated with the only one stable oscillation state, wherein the first free oscillation amplitude is smaller than 3 Angstroms and the first quality factor is between 300 and 1000,
determining the first quality factor and the first free oscillation amplitude using the resonance frequency and a spring constant of the cantilever, wherein the cantilever exhibits the only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and
after determining the first quality factor and the first free oscillation amplitude, controlling the cantilever of the atomic force microscope to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near the resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.
8. The system of claim 7 , further comprising quality factor control circuitry, wherein controlling the cantilever to operate at the first quality factor comprises using the quality factor control circuitry to automatically control the cantilever to operate at the first quality factor.
9. The system of claim 7 , wherein the first free oscillation amplitude is smaller than a decay length of an interaction potential between the probe tip and the sample.
10. The system of claim 7 , wherein controlling the cantilever comprises controlling the cantilever to operate such that the probe tip is at a distance of 2-10 Angstroms from the surface of the sample.
11. The system of claim 7 , wherein the determining the first quality factor and the first free oscillation amplitude comprises:
obtaining a plurality of quality factors and a plurality of free oscillation amplitudes; and
selecting, as the first quality factor and the first free oscillation amplitude, a quality factor in the plurality of quality factors and a free oscillation amplitude that maximize relative amplitude and/or phase changes in the oscillation of the cantilever during approach to the surface of the sample.
12. The system of claim 7 , wherein the determining the first quality factor and the first free oscillation amplitude comprises:
obtaining a plurality of quality factors and a plurality of free oscillation amplitudes; and
selecting, as the first quality factor and the first free oscillation amplitude, a quality factor in the plurality of quality factors and a free oscillation amplitude that correspond to a desired measurement bandwidth of the atomic force microscope.
13. The method of claim 1 , wherein determining the first quality factor and the first free oscillation amplitude comprises accessing, in at least one non-transitory computer readable storage medium, previously calculated cantilever operational parameters for the resonance frequency and the spring constant of the cantilever.