Temperature-sensitive transistor gate driver
A system comprises a gate driver that is configured to couple to a transistor disposed in a transistor module via a first pin. The gate driver comprises a duty cycle measurement circuit having a first input terminal and a first output terminal, the first input terminal coupled to a second pin via an isolator. The duty cycle measurement circuit comprises a flip-flop, a counter, a shift register, and a comparator. The system comprises an analog to digital converter circuit having a second input terminal, a second output terminal, and a reference terminal, the second input terminal coupled to a third pin configured to couple to a temperature-sensitive device disposed in the transistor module, the second output terminal coupled to a fourth pin via the isolator, and the reference terminal coupled to the first output terminal.
1. A system, comprising:
a gate driver adapted to be coupled to a transistor in a transistor module, the gate driver comprising:
a duty cycle measurement circuit having a duty cycle input and a duty cycle output, the duty cycle measurement circuit comprising:
a flip-flop coupled to the duty cycle input;
a counter coupled to the flip-flop;
a shift register coupled to the counter; and
a comparator coupled to the shift register; and
an analog to digital converter (ADC) circuit having an ADC input, an ADC output, and a reference terminal, and the reference terminal coupled to the duty cycle output, and the ADC input adapted to be coupled to a temperature sensitive device in the transistor module.
2. The system of claim 1 , wherein the gate driver further comprises a current source coupled to the ADC input.
3. The system of claim 1 , wherein the duty cycle measurement circuit is configured to:
receive an input signal; and
produce a start of conversion (SOC) signal responsive to a turn-on time of the input signal.
4. The system of claim 3 , wherein the ADC circuit is configured to:
sample a potential across the temperature sensitive device in response to receiving the SOC signal; and
produce a data frame responsive to the sampled potential across the temperature sensitive device.
5. The system of claim 4 , wherein the data frame indicates the potential across the temperature sensitive device.
6. The system of claim 4 , wherein the temperature sensitive device is a diode.
7. The system of claim 1 , further comprising an isolator coupled to the duty cycle input and to the ADC output.
8. The system of claim 7 , wherein the gate driver further comprises:
a communication interface coupled to the isolator; and
an adding unit coupled to the communication interface and to the ADC circuit.
9. A system, comprising:
a gate driver adapted to be coupled to a transistor disposed in a transistor module, the gate driver comprising:
a duty cycle measurement circuit configured to:
receive a pulse width modulation (PWM) signal; and
produce a start of conversion (SOC) signal in accordance with a turn-on time of the PWM signal; and
an analog to digital converter (ADC) circuit coupled to the duty cycle measurement circuit, the ADC circuit adapted to be coupled to a temperature sensitive device in the transistor module, the ADC circuit configured to:
receive an analog temperature signal from the temperature sensitive device; and
responsive to receiving the SOC signal, produce a digital temperature signal in accordance with the analog temperature signal.
10. The system of claim 9 , wherein the analog temperature signal indicates a potential difference across the temperature sensitive device indicating a temperature of the transistor.
11. The system of claim 10 , wherein the digital temperature signal indicates the temperature of the transistor.
12. The system of claim 10 , wherein the gate driver further comprises a current source configured to provide a current signal to the temperature sensitive device.
13. The system of claim 10 , wherein the temperature sensitive device is a diode.
14. The system of claim 9 , wherein the gate driver further comprises an adding unit coupled to the duty cycle measurement circuit, the adding unit configured to concatenate index information at least partially related to the SOC signal to produce a combined signal.
15. A system comprising:
a transistor;
a temperature sensitive device coupled to the transistor, the temperature sensitive device sensitive to a temperature of the transistor; and
a gate driver coupled to the temperature sensitive device, the gate driver comprising:
a duty cycle measurement circuit having a duty cycle input and a duty cycle output, the duty cycle measurement circuit comprising:
a flip-flop coupled to the duty cycle input;
a counter coupled to the flip-flop;
a shift register coupled to the counter; and
a comparator coupled to the shift register; and
an analog to digital converter (ADC) circuit having an ADC input, an ADC output, and a reference terminal, the ADC input coupled to the temperature sensitive device and the reference terminal coupled to the duty cycle output.
16. The system of claim 15 , wherein the temperature sensitive device is a diode.
17. The system of claim 15 , further comprising a galvanic isolator coupled to the duty cycle input and to the ADC output.
18. The system of claim 17 , further comprising a controller coupled to the ADC circuit and to the duty cycle measurement circuit through the galvanic isolator, the controller configured to send a pulse width modulation (PWM) signal to the duty cycle measurement circuit.
19. The system of claim 18 , wherein the gate driver further comprises a communications interface coupled to the ADC circuit though the galvanic isolator and to the controller, the communications interface configured to send data between the controller and the gate driver.
20. The system of claim 15 , further comprising an adder coupled to the duty cycle measurement circuit and to the ADC circuit, the adder configured to populate a data frame from the ADC based on data from the duty cycle measurement circuit.