Charged particle beam apparatus and control method thereof

1. A charged particle beam apparatus processing a sample by irradiating the sample with a charged particle beam, the charged particle beam apparatus comprising:

an image identity degree determination unit determining whether an identity degree is equal to or greater than a predetermined value, the identity degree indicating a degree of identity between a processing cross-section image that is an SEM image obtained through observation of a cross section of the sample by a scanning electron microscope, and a criterion image;

a post-determination processing unit performing a predetermined processing operation according to a result of the determination by the image identity degree determination unit;

a registration image determination unit determining, based on the processing cross-section image, whether a particular structure appears on the cross section, in a period before the image identity degree determination unit performs the determination; and

an image registration unit registering the processing cross-section image as the criterion image when the registration image determination unit determines that the particular structure appears on the cross section, in the period.

2. The charged particle beam apparatus of claim 1 , wherein the registration image determination unit uses, as the processing cross-section image, the SEM image for the determination which is obtained through observation by the scanning electron microscope with use of a first mode, in the period;

the image registration unit registers, as the criterion image, the processing cross-section image obtained through observation of the cross section by the scanning electron microscope with use of a second mode having resolution lower that resolution of the first mode, when the registration image determination unit determines that the particular structure appears on the cross section, in the period; and

the image identity degree determination unit uses, as the processing cross-section image, the SEM image for the determination which is obtained through observation by the scanning electron microscope with use of the second mode.

3. The charged particle beam apparatus of claim 1 , wherein the criterion image is a plurality of the processing cross-section images, and

the image registration unit registers the processing cross-section image as the criterion image each time the registration image determination unit determines that the particular structure appears on the cross section, in the period.

4. The charged particle beam apparatus of claim 2 , wherein the criterion image is a plurality of the processing cross-section images, and

the image registration unit registers the processing cross-section image as the criterion image each time the registration image determination unit determines that the particular structure appears on the cross section, in the period.

5. The charged particle beam apparatus of claim 1 , wherein the criterion image is the SEM image in which the particular structure is taken, and

the predetermined processing operation is a processing operation in which a predetermined analysis is conducted.

6. The charged particle beam apparatus of claim 1 , wherein the criterion image is the SEM image in which the particular structure is taken, and

the predetermined processing operation is a processing operation in which a predetermined analysis is conducted.

7. The charged particle beam apparatus of claim 2 , wherein the criterion image is the SEM image in which the particular structure is taken, and

the predetermined processing operation is a processing operation in which a predetermined analysis is conducted.

8. The charged particle beam apparatus of claim 3 , wherein the criterion image is the SEM image in which the particular structure is taken, and

the predetermined processing operation is a processing operation in which a predetermined analysis is conducted.

9. The charged particle beam apparatus of claim 4 , wherein the criterion image is the SEM image in which the particular structure is taken, and

the predetermined processing operation is a processing operation in which a predetermined analysis is conducted.

10. A control method of a charged particle beam apparatus that processes a sample by irradiating the sample with a charged particle beam, the control method comprising:

a registration image determination process of determining, based on a processing cross-section image that is an SEM image obtained through observation of a cross section of the sample by a scanning electron microscope, whether a particular structure appears on the cross section;

an image registration process of registering the processing cross-section image as a criterion image when the registration image determination unit determines that the particular structure appears on the cross section;

an image identity degree determination process of whether an identity degree is equal to or greater than a predetermined value, the identity degree indicating a degree of identity between the processing cross-section image that is an SEM image obtained after the registration image determination process and the image registration process, and the criterion image that is previously registered by the image registration process; and

a post-determination processing operation process of performing a predetermined processing operation according to a result of the determination in the image identity degree determination process.