IP Library Granted Patent US 11,189,692
Granted Patent B2
US 11,189,692 · App. 16/711,582 · Granted Nov 30, 2021

VFET standard cell architecture with improved contact and super via

Inventors: Jung Ho Do (Hwaseong-si, KR); Rwik Sengupta (Austin, TX)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L29/0696H01L29/0847H01L29/7827
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Quick Facts
Patent No.
US 11,189,692
App. No.
16/711,582
Granted
Nov 30, 2021
Kind
B2
Abstract

A cell architecture for vertical field-effect transistors (VFETs) is provided. The cell architecture includes: top source/drain (S/D) contact structure having a square shape in a plan view; and horizontal metal patterns formed on the top S/D contact structures and extended in an X-direction to be connected to a vertical pattern through with an output signal of a logic circuit formed by the VFETs. The cell architecture further includes a gate contact structure formed on a gate connection pattern connecting gates of the VFETs, wherein a super via is formed on the gate contact structure to receive an input signal of the logic circuit.

Claims (19)

1. A cell architecture comprising:

a plurality of vertical field-effect transistors (VFETs) formed on a substrate to constitute a logic circuit;

a 1 st top source/drain (S/D) contact structure formed on a 1 st top S/D region of a 1 st VFET and connected to a 1 st horizontal metal pattern formed thereon and extended in an X-direction of the cell architecture to connect an output signal of the logic circuit output from the 1 st top S/D region to a 1 st vertical metal pattern;

a 2 nd top S/D contact structure formed on a 2 nd top S/D region of a 2 nd VFET and connected to a 2 nd horizontal metal pattern formed thereon and extended in the X-direction to connect the output signal of the logic circuit output from the 2 nd top S/D region to the 1 st vertical metal pattern; and

a gate contact structure formed on a gate connection pattern connected to respective gates of the 1 st and 2 nd VFETs, the gate contact structure being connected to an input signal of the logic circuit through a super via,

wherein the 1 st VFET and the 2 nd VFET are formed along a 1 st fin structure extended in a Y-direction of the cell architecture, and

wherein both of the 1 st top S/D contact structure and the 2 nd top S/D contact structure have a substantially-square shape in a plan view of the cell architecture.

2. The cell architecture of claim 1 , wherein the super via is connected to a 2 nd vertical metal pattern to which the input signal of the logic circuit is input, and

wherein the 1 st horizontal metal pattern and the 2 nd horizontal metal pattern are connected to the 1 st vertical metal pattern through a 1 st via and a 2 nd via, respectively.

3. The cell architecture of claim 2 , wherein the 1 st vertical metal pattern and the 2 nd vertical metal pattern are parallel to each other without overlapping each other in the plan view of the cell architecture, and are disposed on a same level from an upper surface of the substrate.

4. The cell architecture of claim 3 , wherein upper surfaces of the 1 st top S/D contact structure, the 2 nd top S/D contact structure and the gate contact structure are disposed on a same level from the upper surface of the substrate.

5. The cell architecture of claim 4 , wherein a height of the super via is the same as a sum of heights of the 1 st via and the 1 st horizontal metal pattern.

6. The cell architecture of claim 4 , wherein the 1 st top S/D contact structure is connected to the 1 st horizontal metal pattern through a 3 rd via formed thereon, and the 2 nd top S/D contact structure is connected to the 2 nd horizontal metal pattern through a 4 th via formed thereon.

7. The cell architecture of claim 6 , wherein a height of the super via is the same as a sum of heights of the 1 st via, the 1 st horizontal metal pattern and the 3 rd via.

8. The cell architecture of claim 1 , further comprising a 3 rd top S/D contact structure formed on a 3 rd top S/D region of a 3 rd VFET and extended to an edge of the cell architecture to be connected to a power rail,

wherein an upper surface of the 3 rd top S/D contact structure is spaced apart from a lower surface of the 1 st horizontal metal pattern.

9. The cell architecture of claim 8 , further comprising a 4 th top S/D contact structure formed on a 4 th top S/D region of a 4 th VFET and connected to the 2 nd horizontal metal pattern formed thereon and extended in the X-direction to connect the output signal of the logic circuit to the 1 st vertical metal pattern through a 2 nd via.

10. The cell architecture of claim 9 , wherein the 3 rd VFET and the 4 th VFET are formed on a 2 nd fin structure extended in parallel with the 1 st fin structure,

wherein the 1 st vertical metal pattern, through which the output signal of the logic circuit is transmitted out, is formed between the 1 st fin structure and the 2 nd fin structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2019
From: DO, JUNG HO; SENGUPTA, RWIK
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 051261/0406 →
Continuity (2)
Provisional Application 62819056 · Mar 15, 2019
Related Publication 20200295134A1 · Sep 17, 2020
Cited By (1)
US 12,363,965