System and methods for extracting correlation curves for an organic light emitting device
A system for equalizing the pixels in an array of pixels that include semiconductor devices that age differently under different ambient and stress conditions. The system extracts at least one pixel parameter from the array; creates a stress pattern for the array, based on the extracted pixel parameter; stresses the pixels in accordance with the stress pattern; extracts the pixel parameter from the stressed pixels; determines whether the pixel parameter extracted from the stressed pixels is within a preselected range and, when the answer is negative, creates a second stress pattern for the array, based on the pixel parameter extracted from the stressed pixels, stresses the pixels in accordance with the second stress pattern, extracts the pixel parameter from the stressed pixels, and determines whether the pixel parameter extracted from the stressed pixels is within the preselected range.
1. A method of equalizing pixel circuits in an array of pixel circuits that include semiconductor devices that age differently under different ambient and stress conditions, said method comprising
a) creating a stress history of said pixel circuits during a usage cycle using a controller, said stress history comprising data for tracking a history of stress said pixel circuits have been subjected to;
b) extracting a pixel parameter from said array during or after the usage cycle using at least one of a voltage sensor, a current sensor, and a photo sensor;
c) updating a stress pattern for said array using the controller, based on the extracted pixel parameter and the stress history;
d) stressing said pixel circuits in accordance with said stress pattern;
e) extracting said pixel parameter from the stressed pixel circuits using at least one of the voltage sensor, the current sensor, and the photo sensor;
f) determining that the pixel parameter extracted from the stressed pixel circuits is not within a preselected range using the controller and updating the stress history; and
g) after repeating steps c) to f) a number of times while the pixel parameter is not within the preselected range, repeating steps c) to e) once and thereafter determining that the pixel parameter extracted from the stressed pixel circuits is within the preselected range and returning said array of pixel circuits to normal operation.
2. The method according to claim 1 , wherein the pixel parameter comprises threshold voltage of a drive transistor in each active pixel circuit.
3. The method according to claim 1 , wherein the pixel parameter comprises luminance level.
4. The method according to claim 1 , wherein the pixel parameter comprises current output of each pixel circuit.
5. The method according to claim 1 , wherein the pixel parameter comprises a variation between the pixel parameter across the array of pixel circuits.
6. The method according to claim 1 , wherein step d) comprises applying stress to said pixel circuits using a current supply.
7. The method according to claim 1 , wherein the stress history includes stress time and stress level.
8. The method according to claim 1 , wherein the stress history includes average stress condition of each pixel circuit during the usage cycle.
9. The method according to claim 1 , wherein step e) is conducted at the same time as step d).
10. The method according to claim 1 , wherein step e) is conducted after step d).
11. A system for equalizing the pixel circuits in an array of pixel circuits, said system comprising
a plurality of active pixel circuits for displaying an image, the active pixel circuits each including semiconductor devices that age differently under different ambient and stress conditions
a controller coupled to said array of pixel circuits and configured to:
a) create a stress history of said pixel circuits during or after a usage cycle, said stress history comprising data for tracking a history of stress said pixel circuits have been subjected to;
b) control extraction of a pixel parameter from said array after the usage cycle;
c) update a stress pattern for said array, based on the extracted pixel parameter and the stress history;
d) control application of stress to said pixel circuits in accordance with said stress pattern;
e) control extraction of said pixel parameter from the stressed pixel circuits;
f) determine whether the pixel parameter extracted from the stressed pixel circuits is within a preselected range; and
when the pixel parameter is not within the preselected range:
updating the stress history, and repeating steps c) to f)
when the pixel parameter is within the preselected range, return said array of pixel circuits to normal operation.
12. The system according to claim 11 , wherein the pixel parameter comprises threshold voltage of a drive transistor in each active pixel circuit; and
further comprising a voltage sensor for extraction of the threshold voltage.
13. The system according to claim 11 , wherein the pixel parameter comprises luminance level; and
further comprising at least one photo sensor for extraction of the luminance level of each pixel circuit.
14. The system according to claim 11 , wherein the pixel parameter comprises current output of the pixel circuit; and
further comprising at least one current sensor for extraction of the current output.
15. The system according to claim 11 , wherein the pixel parameter comprises a variation between the pixel parameter across the array of pixel circuits.
16. The system according to claim 11 , further comprising a current supply and readout circuit for applying stress to said pixel circuits.
17. The system according to claim 11 , wherein the stress history includes stress time and stress level.
18. The system according to claim 11 , wherein the stress history includes average stress condition of each pixel circuit during the usage cycle.
19. The system according to claim 11 , wherein step e) is conducted at the same time as step d).
20. The system according to claim 11 , wherein step e) is conducted after step d).