IP Library Granted Patent US 11,200,933
Granted Patent B2
US 11,200,933 · App. 16/305,649 · Granted Dec 14, 2021

Magnetic multilayer film, magnetic memory element, magnetic memory and method for producing same

Inventors: Shunsuke Fukami (Sendai, JP); Chaoliang Zhang (Sendai, JP); Ayato Ohkawara (Sendai, JP); Kyota Watanabe (Sendai, JP); Hideo Ohno (Sendai, JP); Tetsuo Endoh (Sendai, JP)
Assignee: TOHOKU UNIVERSITY
G11C11/161H01L43/02H01L43/10H01L43/12
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Quick Facts
Patent No.
US 11,200,933
App. No.
16/305,649
Granted
Dec 14, 2021
Kind
B2
Abstract

The magnetic memory element ( 100 ) includes: a conductive layer that includes a heavy metal layer ( 10 ) containing a 5d transition metal; a first ferromagnetic layer ( 20 ) that is adjacent to the conductive layer and contains a ferromagnetic layer having a reversible magnetization; a barrier layer ( 30 ) that is adjacent to the first ferromagnetic layer ( 20 ) and includes an insulating material; a reference layer ( 40 ) that is adjacent to the barrier layer ( 30 ) and has at least one second ferromagnetic layer ( 41 ) having a fixed magnetization direction; a cap layer ( 50 ) that is adjacent to the reference layer ( 40 ) and includes a conductive material; a first terminal (T 1 ) that is capable of introducing a current into one end of the heavy metal layer ( 10 ) in the longitudinal direction; a second terminal (T 2 ) that is capable of introducing a current into the other end of the heavy metal layer ( 10 ) in the longitudinal direction; and a third terminal (T 3 ) that is capable of introducing a current into the cap layer ( 50 ).

Claims (57)

1. A magnetic multilayer film for a magnetic memory element, the magnetic multilayer film comprising:

a conductive layer that includes a heavy metal layer containing a 5d transition metal; and

a first ferromagnetic layer that is adjacent to the conductive layer and contains a ferromagnetic layer having a reversible magnetization,

wherein

a film thickness of the conductive layer is 6 nm or more, and

a crystal structure of the heavy metal layer is amorphous or β-phase.

2. A magnetic multilayer film for a magnetic memory element, the magnetic multilayer film comprising:

a conductive layer that includes a heavy metal layer containing a 5d transition metal; and

a first ferromagnetic layer that is adjacent to the conductive layer and contains a ferromagnetic layer having a reversible magnetization,

wherein

a film thickness of the conductive layer is 6 nm or more, and

a resistivity of the heavy metal layer is 100 μΩ cm or more.

3. The magnetic multilayer film according to claim 2 , wherein a crystal structure of the heavy metal layer is amorphous or β-phase.

4. The magnetic multilayer film according to claim 1 , wherein the conductive layer further includes an adjustment layer that is adjacent to the heavy metal layer and that includes a conductive material.

5. The magnetic multilayer film according to claim 1 , wherein the heavy metal layer contains Ta or W.

6. A magnetic memory element, comprising:

the magnetic multilayer film according to claim 1 ;

a barrier layer that is adjacent to the first ferromagnetic layer and includes an insulating material;

a reference layer that is adjacent to the barrier layer and includes at least one ferromagnetic layer having a fixed magnetization direction;

a cap layer that is adjacent to the reference layer and includes a conductive material;

a first terminal that is capable of introducing a current into one end of the heavy metal layer in the longitudinal direction;

a second terminal that is capable of introducing a current into the other end of the heavy metal layer in the longitudinal direction; and

a third terminal that is capable of introducing a current into the cap layer.

7. The magnetic memory element according to claim 6 , comprising a fourth terminal connected to the first ferromagnetic layer.

8. The magnetic memory element according to claim 6 , wherein the first ferromagnetic layer has a reversible magnetization in a direction perpendicular to a film surface of the first ferromagnetic layer.

9. The magnetic memory element according to claim 6 , wherein the first ferromagnetic layer has a reversible magnetization in a direction orthogonal to a line segment connecting the first terminal and the second terminal within a film surface of the first ferromagnetic layer.

10. The magnetic memory element according to claim 6 , wherein the first ferromagnetic layer has a reversible magnetization in a direction parallel to a line segment connecting the first terminal and the second terminal within a film surface of the first ferromagnetic layer.

11. The magnetic memory element according to claim 6 , wherein

the first ferromagnetic layer includes a first magnetized area, and a second magnetized area and a third magnetized area arranged across the first magnetized area,

a magnetization of the second magnetized area and a magnetization of the third magnetized area are fixed in mutually different directions, and

a magnetization of the first magnetized area is reversible and can be oriented in the same direction as any one of a magnetization of the second magnetized area and a magnetization of the third magnetized area.

12. A magnetic memory, comprising:

the magnetic memory element according to any of claim 6 ;

write means for writing data to the magnetic memory element by feeding a write current to the magnetic memory element; and

read means for reading data written into the magnetic memory element by determining a tunnel resistance by feeding a current in a direction penetrating the barrier layer.

13. The magnetic multilayer film according to claim 1 , wherein

the heavy metal layer is deposited by magnetron sputtering,

a partial pressure of an inert gas in a film forming process is 0.1 Pa or more,

a mean free path of a sputtered particle in a film forming process is shorter than a distance between a target of sputtering and a substrate of the sputtering,

a deposition rate of a thin film in a film forming process is 0.02 nm/s or less,

a substrate temperature is set to a room temperature or less in a film forming process, and

a bias voltage is applied to a substrate in a film forming process.

14. A method for producing a magnetic multilayer film or a magnetic memory element including the magnetic multilayer film, the magnetic multilayer film including:

a heavy metal layer containing a 5d transition metal; and

a first ferromagnetic layer that is adjacent to the heavy metal layer and contains a ferromagnetic layer having a reversible magnetization,

wherein

the heavy metal layer is deposited by magnetron sputtering, and

a partial pressure of an inert gas in a film forming process is 0.1 Pa or more.

15. A method for producing a magnetic multilayer film or a magnetic memory element including the magnetic multilayer film, the magnetic multilayer film including:

a heavy metal layer containing a 5d transition metal; and

a first ferromagnetic layer that is adjacent to the heavy metal layer and contains a ferromagnetic layer having a reversible magnetization,

wherein

the heavy metal layer is deposited by magnetron sputtering, and

a mean free path of a sputtered particle in a film forming process is shorter than a distance between a target of sputtering and a substrate of the sputtering.

16. The method for producing a magnetic multilayer film or a magnetic memory element according to claim 14 , wherein a deposition rate of a thin film in a film forming process of the heavy metal layer is 0.02 nm/s or less.

17. The method for producing a magnetic multilayer film or a magnetic memory element according to claim 14 , wherein a substrate temperature is set to a room temperature or less in a film forming process of the heavy metal layer.

18. The method for producing a magnetic multilayer film or a magnetic memory element according to claim 14 , wherein a bias voltage is applied to a substrate in a film forming process of the heavy metal layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2019
From: FUKAMI, SHUNSUKE; ZHANG, CHAOLIANG; OHKAWARA, AYATO; WATANABE, KYOTA; OHNO, HIDEO; ENDOH, TETSUO
To: TOHOKU UNIVERSITY
Reel/Frame 048558/0914 →
Priority Claims (1)
JP JP2016-112242 · Jun 3, 2016 · national
Continuity (1)
Related Publication 20200286536A1 · Sep 10, 2020