IP Library › Granted Patent US 11,215,443
Granted Patent B2
US 11,215,443 · App. 17/033,996 · Granted Jan 4, 2022

Optical measurement apparatus and optical measurement method

Inventor: Kunikazu Taguchi (Hirakata, JP)
Assignee: Otsuka Electronics Co., Ltd.
G01B11/0625G01B9/02024G01N21/8422G01N2021/8427
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Quick Facts
Patent No.
US 11,215,443
App. No.
17/033,996
Granted
Jan 4, 2022
Kind
B2
Abstract

An optical measurement apparatus including: an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths; a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generated, wherein the calculation unit calculates a transmittance spectrum or a reflectance spectrum of the measurement subject based on a first criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is not present on the measurement area, a second criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the non-measurement area, and a measurement spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is present on the measurement area.

Claims (19)

1. An optical measurement apparatus comprising:

an irradiation optical system configured to irradiate, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths;

a reception optical system configured to receive measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and

a calculation unit configured to generate a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light performed by the reception optical system, and calculate, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generated,

wherein the calculation unit calculates a transmittance spectrum or a reflectance spectrum of the measurement subject based on a first criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is not present on the measurement area, a second criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the non-measurement area, and a measurement spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is present on the measurement area.

2. The optical measurement apparatus according to claim 1 ,

wherein the second criterion spectrum is a spectrum generated by the calculation unit in advance based on the measurement light travelling from the non-measurement area when the measurement subject is not present on the measurement area, and

the calculation unit calculates the transmittance spectrum or the reflectance spectrum of the measurement subject further based on a reference spectrum that is the reception light spectrum that is based on the measurement light travelling from the non-measurement area when the measurement subject is present on the measurement area.

3. The optical measurement apparatus according to claim 2 ,

wherein the reference spectrum and the measurement spectrum are spectra generated by the calculation unit respectively based on the measurement light travelling from the non-measurement area and the measurement light travelling from the measurement area received by the reception optical system at the same point in time when the measurement subject is present on the measurement area.

4. The optical measurement apparatus according to claim 1 ,

wherein the first criterion spectrum and the second criterion spectrum are spectra generated by the calculation unit respectively based on the measurement light travelling from the measurement area and the measurement light travelling from the non-measurement area received by the reception optical system at the same point in time when the measurement subject has not been present on the measurement area.

5. The optical measurement apparatus according to claim 1 ,

wherein the calculation unit calculates the transmittance spectrum or the reflectance spectrum of the measurement subject based on the plurality of first criterion spectra that are respectively based on the rays of measurement light travelling from a plurality of positions on the measurement area when the measurement subject is not present on the measurement area, the second spectrum, and the plurality of measurement spectra that are respectively based on the rays of measurement light travelling from the plurality of positions.

6. An optical measurement method comprising,

a step of irradiating, in a straight direction, a target area that includes a measurement area and a non-measurement area that is an area different from the measurement area, with irradiation light that includes a plurality of wavelengths;

a step of receiving measurement light that is transmission light or reflection light travelling from the target area as a result of the target area being irradiated with the irradiation light; and

a step of generating a reception light spectrum that indicates a relationship between a wavelength and an intensity of the measurement light, for each position in the target area, based on a result of reception of the measurement light, and calculating, for each wavelength, a transmittance or a reflectance of a measurement subject that is placed on the measurement area, based on the reception light spectrum thus generated,

wherein, in the step of calculating the transmittance or the reflectance, a transmittance spectrum or a reflection spectrum of the measurement subject is calculated based on a first criterion spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is not present on the measurement area, a second criterion spectrum that is the reception light spectrum that is based on the measurement light traveling from the non-measurement area, and a measurement spectrum that is the reception light spectrum that is based on the measurement light travelling from the measurement area when the measurement subject is present on the measurement area.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2020
From: TAGUCHI, KUNIKAZU
To: OTSUKA ELECTRONICS CO., LTD.
Reel/Frame 053896/0837 →
Priority Claims (1)
JP JP2019-193275 · Oct 24, 2019 · national
Continuity (1)
Related Publication 20210123721A1 · Apr 29, 2021