IP Library Granted Patent US 11,217,583
Granted Patent B2
US 11,217,583 · App. 16/560,490 · Granted Jan 4, 2022

Architecture design of monolithically integrated 3D CMOS logic and memory

Inventors: Lars Liebmann (Mechanicville, NY); Jeffrey Smith (Clifton Park, NY); Anton J. deVilliers (Clifton Park, NY); Kandabara Tapily (Mechanicville, NY)
Assignee: Tokyo Electron Limited
H01L27/092H01L21/32139H01L21/76895H01L21/8221H01L21/823828H01L21/823871H01L23/528H01L23/535H01L27/0207H01L29/0847H01L29/1033H01L29/41758H01L29/42376H03K19/0948
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,217,583
App. No.
16/560,490
Granted
Jan 4, 2022
Kind
B2
Abstract

A semiconductor device is provided. The device includes a plurality of transistor pairs that are stacked over a substrate. Each of the plurality of transistor pairs includes a n-type transistor and a p-type transistor that are stacked over one another. The device also includes a plurality of gate electrodes that are stacked over the substrate with a staircase configuration. The plurality of gate electrodes are electrically coupled to gate structures of the plurality of transistor pairs. The device further includes a plurality of source/drain (S/D) local interconnects that are stacked over the substrate with a staircase configuration. The plurality of S/D local interconnects are electrically coupled to source regions and drain regions of the plurality of transistor pairs.

Claims (22)

1. A semiconductor device, comprising:

a plurality of transistor pairs that are stacked over a substrate, each of the plurality of transistor pairs including a n-type transistor and a p-type transistor that are stacked over one another;

a plurality of gate electrodes that are stacked over the substrate with a staircase configuration, the plurality of gate electrodes being electrically coupled to gate structures of the plurality of transistor pairs;

a plurality of source/drain (S/D) local interconnects that are stacked over the substrate and extend in a first direction parallel to the substrate with a staircase configuration, the plurality of S/D local interconnects being electrically coupled to source regions and drain regions of the plurality of transistor pairs; and

an array of vertical contacts that extend from the plurality of gate electrodes and the plurality of S/D local interconnects in a second direction perpendicular to the substrate.

2. The device of claim 1 , wherein the n-type transistor is positioned over the p-type transistor so as to form a complementary field effect transistor (CFET) device.

3. The device of claim 1 , wherein the p-type transistor is positioned over the n-type transistor so as to form a complementary field effect transistor device.

4. The device of claim 1 , wherein:

the array of vertical contacts are electrically coupled to the plurality of gate electrodes, and the plurality of S/D local interconnects.

5. The device of claim 4 , further comprising:

a series of wiring levels that are positioned over the array of vertical contacts and provide a functionality of the semiconductor device by connecting the array of vertical contacts.

6. The device of claim 1 , wherein the n-type transistor and the p-type transistor share a gate structure that is electrically coupled to one of the plurality of gate electrodes.

7. The device of claim 6 , wherein the n-type transistor has a source region and a drain region that are positioned at two ends of a n-type channel region that is surrounded by the gate structure, the n-type channel region, the source region and the drain region of the n-type transistor being arranged in the first direction.

8. The device of claim 6 , wherein the p-type transistor has a source region and a drain region that are positioned at two ends of a p-type channel region that is surrounded by the gate structure, the p-type channel region, the source region and the drain region of the p-type transistor being arranged in the first direction.

9. The device of claim 1 , wherein each of the plurality of S/D local interconnects is positioned at two sides of a respective gate electrode of the plurality of gate electrodes.

10. A semiconductor device, comprising:

a plurality of transistor pairs that are stacked over a substrate, wherein the plurality of transistor pairs have a plurality of gate electrodes that are stacked over the substrate with a staircase configuration and electrically coupled to gate structures of the plurality of transistor pairs, and a plurality of source/drain (S/D) local interconnects that are stacked over the substrate with a staircase configuration and electrically coupled to source regions and drain regions of the plurality of transistor pairs;

an array of vertical contacts that are positioned over the plurality of transistor pairs, arranged in a direction perpendicular to the substrate and electrically coupled to the plurality of gate electrodes, and the plurality of S/D local interconnects; and

a series of wiring levels that are positioned over the array of vertical contacts and provide a functionality of the semiconductor device by connecting the array of vertical contacts.

11. The device of claim 10 , wherein each of the plurality of transistor pairs comprises a n-type transistor and a p-type transistor that are stacked over one another, the n-type transistor and the p-type transistor sharing a gate structure.

12. The device of claim 11 , wherein the n-type transistor is positioned over the p-type transistor so as to form a complementary field effect transistor device.

13. The device of claim 11 , wherein the p-type transistor is positioned over the n-type transistor so as to form a complementary field effect transistor device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2019
From: LIEBMANN, LARS; SMITH, JEFFREY; DEVILLIERS, ANTON J.; TAPILY, KANDABARA
To: TOKYO ELECTRON LIMITED
Reel/Frame 050900/0321 →
Continuity (2)
Provisional Application 62727097 · Sep 5, 2018
Related Publication 20200075592A1 · Mar 5, 2020