IP Library › Granted Patent US 11,228,284
Granted Patent B2
US 11,228,284 · App. 16/272,215 · Granted Jan 18, 2022

Controlling parameters of an amplifier system based on a measured physical quantity

Inventors: Eric Lindemann (Boulder, CO); Itisha Tyagi (Austin, TX)
Assignee: Cirrus Logic, Inc.
H03F1/30G01R27/08G01R27/2605G01R27/2611H03F13/00H03F2200/03
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Quick Facts
Patent No.
US 11,228,284
App. No.
16/272,215
Granted
Jan 18, 2022
Kind
B2
Abstract

A method for controlling one or more parameters of an amplifier system may include receiving an indication of a physical quantity associated with the amplifier system, determining one or more parameters of the amplifier system in response to the indication, and causing the amplifier system to operate in accordance with the one or more parameters.

Claims (52)

1. A method for controlling one or more parameters of an amplifier system comprising:

receiving an indication of an estimated temperature associated with the amplifier system;

determining one or more parameters of the amplifier system in response to the indication wherein:

the one or more parameters comprise a selected frequency response of the amplifier system, such that the selected frequency response of the amplifier system varies as a function of the estimated temperature; and

determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected frequency response corresponding to the estimated temperature from a plurality of stored frequency responses; and

causing the amplifier system to operate in accordance with the one or more parameters.

2. The method of claim 1 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:

selecting two frequency responses corresponding to the estimated temperature from a plurality of stored frequency responses; and

interpolating between the two selected frequency responses to set the selected frequency response.

3. The method of claim 1 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises calculating the selected frequency response based on the estimated temperature.

4. The method of claim 1 , wherein the amplifier system comprises a digital signal processor and a transducer amplifier.

5. The method of claim 1 , wherein the amplifier system comprises an equalizer stage and a transducer amplifier.

6. A method for controlling one or more parameters of an amplifier system comprising:

receiving an indication of an estimated impedance associated with the amplifier system;

determining one or more parameters of the amplifier system in response to the indication; and

causing the amplifier system to operate in accordance with the one or more parameters.

7. The method of claim 6 , wherein the one or more parameters comprise a selected amplifier configuration associated with the amplifier system.

8. The method of claim 7 , wherein the selected amplifier configuration defines one or more of a boost headroom associated with the amplifier system, an amplifier gain, amplifier compensation network parameters, and a frequency response of the amplifier system.

9. The method of claim 7 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected amplifier configuration corresponding to the estimated impedance from a plurality of stored amplifier configurations.

10. The method of claim 7 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:

selecting two amplifier configurations corresponding to the estimated impedance from a plurality of stored amplifier configurations; and

interpolating between the two amplifier configurations to set the selected amplifier configuration.

11. The method of claim 7 , wherein the estimated impedance is an impedance of a transducer driven by the amplifier system.

12. The method of claim 11 , wherein the estimated impedance comprises an estimated resistance of the transducer, and wherein an amplifier gain of the amplifier system is varied as a function of the estimated resistance.

13. The method of claim 11 , wherein the estimated impedance comprises an estimated inductance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated inductance.

14. The method of claim 11 , wherein the estimated impedance comprises an estimated capacitance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated capacitance.

15. An apparatus for controlling one or more parameters of an amplifier system comprising:

at least one input configured to receive an estimated temperature associated with the amplifier system; and

a controller configured to:

determine one or more parameters of the amplifier system in response to the indication, wherein the one or more parameters comprises a selected frequency response of the amplifier system, such that the selected frequency response of the amplifier system varies as a function of the estimated temperature, wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected frequency response corresponding to the estimated temperature from a plurality of stored frequency responses; and

cause the amplifier system to operate in accordance with the one or more parameters.

16. The apparatus of claim 15 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:

selecting two frequency responses corresponding to the estimated temperature from a plurality of stored frequency responses; and

interpolating between the two selected frequency responses to set the selected frequency response.

17. The apparatus of claim 15 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises calculating the selected frequency response based on the estimated temperature.

18. The apparatus of claim 15 , wherein the amplifier system comprises a digital signal processor and a transducer amplifier.

19. The apparatus of claim 15 , wherein the amplifier system comprises an equalizer stage and a transducer amplifier.

20. An apparatus for controlling one or more parameters of an amplifier system comprising:

at least one input configured to receive an indication of an estimated impedance associated with the amplifier system; and

a controller configured to:

determine one or more parameters of the amplifier system in response to the indication; and

cause the amplifier system to operate in accordance with the one or more parameters.

21. The apparatus of claim 20 , wherein the one or more parameters comprise a selected amplifier configuration associated with the amplifier system.

22. The apparatus of claim 21 , wherein the selected amplifier configuration defines one or more of a boost headroom associated with the amplifier system, an amplifier gain, amplifier compensation network parameters, and a frequency response of the amplifier system.

23. The apparatus of claim 21 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises selecting the selected amplifier configuration corresponding to the estimated impedance from a plurality of stored amplifier configurations.

24. The apparatus of claim 21 , wherein determining the one or more parameters of the amplifier system in response to the indication comprises:

selecting two amplifier configurations corresponding to the estimated impedance from a plurality of stored amplifier configurations; and

interpolating between the two amplifier configurations to set the selected amplifier configuration.

25. The apparatus of claim 21 , wherein the estimated impedance is an impedance of a transducer driven by the amplifier system.

26. The apparatus of claim 25 , wherein the estimated impedance comprises an estimated resistance of the transducer, and wherein an amplifier gain of the amplifier system is varied as a function of the estimated resistance.

27. The apparatus of claim 25 , wherein the estimated impedance comprises an estimated inductance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated inductance.

28. The apparatus of claim 25 , wherein the estimated impedance comprises an estimated capacitance of the transducer, and wherein a frequency response of the amplifier system is varied as a function of the estimated capacitance.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2021
From: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
To: CIRRUS LOGIC, INC.
Reel/Frame 057707/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2019
From: LINDEMANN, ERIC; TYAGI, ITISHA
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 048899/0714 →
Continuity (4)
Provisional Application 62632765 · Feb 20, 2018
Provisional Application 62632793 · Feb 20, 2018
Provisional Application 62632755 · Feb 20, 2018
Related Publication 20190260333A1 · Aug 22, 2019
Cited By (2)
US 12,348,206 US 12,425,767