Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same
A magnetic property measuring system may include a stage configured to load a sample and to rotate the sample about a rotation axis such that the stage rotates the sample by a rotation angle, the rotation axis extending normal to a top surface of the sample. The magnetic property measuring system may further include a polarizer having a first polarization axis, and an analyzer having a second polarization axis. The polarizer and the analyzer may enable the first and second polarization axes to be independently rotated based on the rotation angle of the sample.
1. A magnetic property measuring system, comprising:
a stage configured to load a sample and to rotate the sample about a rotation axis such that the stage rotates the sample by a rotation angle, the rotation axis extending normal to a top surface of the sample;
a polarizer having a first polarization axis;
an analyzer having a second polarization axis; and
a controller configured to control the polarizer and the analyzer to cause each polarization axis of the first and second polarization axes to be independently rotated based on the rotation angle of the sample,
wherein the controllre is further configured to rotate the stage to rotate the sample by the rotation angle and to cause the first polarization axis to be rotated by a first angle and the second polarization axis to be rotated by a second angle, such that each angle of the first angle and the second angle is in proportion to the rotation angle of the sample.
2. The system of claim 1 , further comprising:
a light source configured to emit an incident light beam toward the sample, such that the incident light beam is incident to the sample through the polarizer; and
a detector configured to detect polarization of a reflection light beam reflected from the sample based on the incident light beam being emitted toward the sample,
wherein the detector is configured to receive the reflection light beam through the analyzer.
3. The system of claim 2 , wherein
the light source is configured to be rotated about a light source rotation axis substantially parallel to a propagation direction of the incident light beam,
the propagation direction of the incident light beam is a direction from the light source toward the polarizer, and
the light source is configured to be rotated based on the rotation angle of the sample.
4. The system of claim 3 , wherein the light source is configured to emit a laser beam.
5. The system of claim 1 , wherein the rotated second polarization axis is aligned to be substantially perpendicular to the rotated first polarization axis.
6. The system of claim 2 , further comprising:
a plurality of coil structures configured to apply a magnetic field to the sample, the magnetic field substantially perpendicular to the top surface of the sample,
wherein each coil structure of the plurality of coil structures includes a pole piece and a coil enclosing an outer circumference surface of the pole piece.
7. The system of claim 2 , wherein the controller is configured to produce a magnetic hysteresis curve, based on data obtained by the detector.
8. The system of claim 2 , wherein the light source is configured to be fixed or rotated while the polarizer and the analyzer are rotated to enable the first and second polarization axes to be independently rotated based on the rotation angle of the sample.
9. The system of claim 1 , wherein the stage is further configured to move the sample in a horizontal plane in addition to being configured to rotate the sample by the rotation angle.