Inductively coupled plasma mass spectrometer with mass correction

1. A method for controlling mass filtering of polyatomic ions in an ion beam passing through an inductively coupled plasma mass spectrometer (ICP-MS), the method comprising:

determining polyatomic ion mass data representative of the exact mass of a polyatomic ion having a target isotope, wherein the exact mass is based on the target isotope and a cell gas used in the ICP-MS to form the polyatomic ions in the ion beam;

generating a first control signal based on the determined polyatomic ion mass data; and

outputting the first control signal to an ICP-MS to filter based on mass the polyatomic ions in the ion beam traveling through the ICP-MS to an ion detector.

2. The method of claim 1 , wherein the polyatomic ion mass data comprises the exact mass of the polyatomic ion having the target isotope.

3. The method of claim 2 , further comprising storing mass data in memory including storing the polyatomic ion mass data.

4. The method of claim 3 , wherein the determining comprises accessing the polyatomic ion mass data stored in memory.

5. The method of claim 2 , wherein the determining comprises calculating the exact mass of the polyatomic ion having the target isotope.

6. The method of claim 2 , wherein the determining comprises performing a table look up to determine the exact mass of the polyatomic ion having the target isotope.

7. The method of claim 1 , further comprising storing mass deviation correction data in memory, wherein the mass deviation correction data is based on the target isotope and the cell gas.

8. The method of claim 1 , wherein the ICP-MS comprises a triple quadrupole ICP-MS having first and second mass analyzers controlled to filter ion masses, and the first control signal is output to the second mass analyzer to control one or more voltage signals applied to the second mass analyzer.

9. The method of claim 1 , wherein the ICP-MS comprises a single quadrupole ICP-MS having a mass analyzer, and the first control signal is output to the mass analyzer to control mass filtering of the ion beam passing through the mass analyzer.

10. An element analyzer system configurable for use in an inductively coupled plasma mass spectrometer (ICP-MS), comprising:

a user-interface that enables a user to input selections for analyzing a target isotope included in a polyatomic ion; and

one or more processors coupled to the user-interface and configured to received data representative of the input selections and further configured to:

determine polyatomic ion mass data representative of the exact mass of a polyatomic ion having a target isotope, wherein the exact mass is based on the target isotope and a cell gas used in the ICP-MS to form the polyatomic ions in the ion beam;

generate a first control signal based on the determined polyatomic ion mass data; and

initiate output of the first control signal to an ICP-MS to filter based on mass the polyatomic ions in the ion beam traveling through the ICP-MS.

11. The system of claim 10 , wherein the polyatomic ion mass data comprises the exact mass of the polyatomic ion having the target isotope.

12. The system of claim 11 , further comprising a memory that stores mass data including the polyatomic ion mass data.

13. The system of claim 12 , wherein the one or more processors are configured to access the polyatomic ion mass data stored in the memory.

14. The system of claim 11 , wherein the one or more processors are configured to calculate the exact mass of the polyatomic ion having the target isotope.

15. The system of claim 11 , wherein the one or more processors are further configured to perform a table look up to determine the exact mass of the polyatomic ion having the target isotope.

16. The system of claim 10 , wherein the one or more processors are further configured to store mass deviation correction data in memory, wherein the mass deviation correction data is based on the target isotope and the cell gas.

17. The system of claim 10 , wherein the ICP-MS comprises a triple quadrupole ICP-MS having first and second mass analyzers controlled to filter ion masses, and wherein the one or more processors are configured to output the first control signal to the second mass analyzer to control one or more voltage signals applied to the second mass analyzer.

18. The system of claim 17 , further comprising a power supply coupled to the second mass analyzer, wherein the power supply generates the one or more voltage signals applied to the second mass analyzer, and wherein the one or more voltage signals comprise a DC voltage signal (U) and an AC voltage signal (Vp) and further comprising applying the U and Vp voltages to quadrupole electrodes in the second mass analyzer to control mass filtering of the ion beam passing through the second mass analyzer.

19. The system of claim 10 , wherein the ICP-MS comprises a single quadrupole ICP-MS having a mass analyzer, and the first control signal is output to the mass analyzer to control mass filtering of the ion beam passing through the mass analyzer.

20. An element analyzer system comprising:

an inductively coupled plasma mass spectrometer;

a workstation coupled to the inductively coupled plasma mass spectrometer, wherein the workstation includes:

a user-interface that enables a user to input selections for analyzing a target element isotope included in a polyatomic ion; and

one or more processors coupled to the user-interface and configured to received data representative of the input selections and further configured to:

determine a first exact mass (EM 1 ) of the target element isotope;

evaluate whether a mass deviation correction is needed for the elemental analysis of the target element isotope included in the polyatomic ion; and

when mass deviation correction is needed, determine a second exact mass (EM 2 ) of the target elemental isotope as a function of a mass number corresponding to the target polyatomic ion and a mass deviation correction corresponding to a reactant in the reaction cell.