Plasma processing method and plasma processing apparatus
A plasma processing method executed by a plasma processing apparatus includes steps of an opening formation, a first film formation, a second film formation, and an etching. In the opening formation, the plasma processing apparatus performs etching on a substrate including a base layer and a first layer formed on the base layer so as to form an opening in the first layer. When determined that the opening satisfies a predetermined condition, in the first film formation, the plasma processing apparatus forms an inhibitor on a bottom surface of the opening so as to form a first film to which a predetermined gas species is not adsorbed. After the formation of the first film, the plasma processing apparatus forms a second film on the side wall of the opening in the second film formation. The plasma processing apparatus also performs etching in the opening in the etching.
1. A plasma processing method comprising:
(a) etching a substrate including a base layer and a first layer formed on the base layer to form a recess in the first layer;
(b) forming a first film to which a predetermined gas species is not adsorbed, by forming an inhibitor on a bottom surface of the recess through chemical vapor deposition (CVD) when determined that the recess satisfies a predetermined condition;
(c) after (b), forming a second film on a side wall of the recess using the predetermined gas species; and
(d) etching the substrate through the recess,
wherein the first film is formed of a material different from a material forming the second film.
2. The plasma processing method according to claim 1 , wherein (c) includes:
(i) exposing the substrate to a precursor gas including the predetermined gas species such that the precursor gas is adsorbed onto the side wall of the recess; and
(ii) exposing the substrate to a plasma generated from a reactive gas, thereby forming the second film from the precursor gas and the reactive gas.
3. The plasma processing method according to claim 1 , further comprising:
determining whether or not a distance between the bottom surface of the recess and a surface of the base layer is equal to or smaller than a predetermined distance,
wherein (b) and (c) are performed when determined that the distance is equal to or smaller than the predetermined distance.
4. The plasma processing method according to claim 3 , wherein the predetermined distance is 20 nanometers.
5. The plasma processing method according to claim 2 , wherein (b) and (c) are performed when determined that a damaged layer is formed, and
the damaged layer is removed in (d).
6. The plasma processing method according to claim 5 , wherein (i) and (ii) are repeatedly performed a predetermined number of times in (c).
7. The plasma processing method according to claim 6 , wherein the plasma processing method is performed in a same chamber.
8. The plasma processing method according to claim 7 , wherein the plasma processing method is performed on the substrate in which the base layer and the first layer are formed of different materials.
9. The plasma processing method according to claim 5 , wherein the plasma processing method is performed on the substrate in which the base layer is formed of SiO 2 and the first layer is formed of SiN or Si, and
in (c), the second film is formed of SiO 2 .
10. The plasma processing method according to claim 7 , wherein the plasma processing method is performed on the substrate in which the base layer is formed of Si and the first layer is formed of SiO 2 , and
in (c), the second film is formed of a SiN.
11. The plasma processing method according to claim 2 , wherein (i) and (ii) are repeatedly performed a predetermined number of times in (c).
12. The plasma processing method according to claim 1 , wherein the plasma processing method is performed in a same chamber.
13. The plasma processing method according to claim 1 , wherein the plasma processing method is performed on the substrate in which the base layer and the first layer are formed of different materials.
14. The plasma processing method according to claim 1 , wherein the plasma processing method is performed on the substrate in which the base layer is formed of SiO 2 and the first layer is formed of SiN or Si, and
in (c), the second film is formed of SiO 2 .
15. The plasma processing method according to claim 12 , wherein the plasma processing method is performed on the substrate in which the base layer is formed of Si and the first layer is formed of SiO 2 , and
in (c), the second film is formed of a SiN.
16. The plasma processing method according to claim 2 , wherein the first film includes fluorine,
the predetermined gas species includes silicon, and
the reactive gas includes oxygen or nitrogen.
17. The plasma processing method according to claim 2 , wherein in (c), a thickness of the first film is reduced.
18. A plasma processing method comprising:
(a) etching a substrate to form a recess;
(b) forming a first film to which a predetermined gas species is not adsorbed, by forming an inhibitor on a bottom surface of the recess using capillary condensation;
(c) after (b), forming a second film on a side wall of the recess using the predetermined gas species; and
(d) etching the substrate through the recess.