IP Library › Granted Patent US 11,255,984
Granted Patent B2
US 11,255,984 · App. 16/868,948 · Granted Feb 22, 2022

Photon interaction characteristics from a subset of pixels

Inventors: Brian William Harris (Gibsonia, PA); Hidefumi Tomita (Pittsburgh, PA)
Assignee: KROMEK GROUP, PLC
G01T1/247H01L31/02966
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Quick Facts
Patent No.
US 11,255,984
App. No.
16/868,948
Granted
Feb 22, 2022
Kind
B2
Abstract

One embodiment provides a method, including: receiving a photon interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels; determining a photoelectron cloud generated from the photon interaction, wherein the photon detector pixel array comprises an electric field, wherein an electrostatic repulsive force disperses a photon to the photoelectron cloud; identifying a subset of the plurality of pixels associated with the photon interaction, wherein each of the subset of the plurality of pixels corresponds to pixels activated by the photo electron cloud, wherein the subset of the plurality of pixels comprise a central pixel and a plurality of neighboring pixels, wherein the central pixel comprises the pixel having the highest amplitude response to the photon interaction; and determining, from the photoelectron cloud, a characteristic of the photon interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction. Other aspects are described and claimed.

Claims (36)

1. A method, comprising:

receiving a photon interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels;

determining a photoelectron cloud generated from the photon interaction, wherein the photon detector pixel array comprises an electric field, wherein an electrostatic repulsive force disperses a photon to the photoelectron cloud;

identifying a subset of the plurality of pixels associated with the photon interaction, wherein each of the subset of the plurality of pixels corresponds to pixels activated by the photo electron cloud, wherein the subset of the plurality of pixels comprise a central pixel and a plurality of neighboring pixels, wherein the central pixel comprises the pixel having the highest amplitude response to the photon interaction; and

determining, from the photoelectron cloud, a characteristic of the photon interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction, wherein the determining comprises adding a correction factor from each of the plurality of pixels to the central pixel based upon a ratio of energy of each of the plurality of pixels.

2. The method of claim 1 , wherein the photon detector array comprises an anode and a cathode that generates electro-static repulsion within the photon.

3. The method of claim 1 , wherein the central pixel receives a negative charge current induction.

4. The method of claim 1 , wherein each of the plurality of neighboring pixels receives a positive charge current induction.

5. The method of claim 4 , wherein the positive charge current induction is proportional to a subset of the photoelectron cloud.

6. The method of claim 1 , wherein the characteristic comprises a location of the photon interaction, wherein the determining the location of the interaction comprises comparing a pulse height from at least two neighboring pixels.

7. The method of claim 1 , wherein the characteristic comprises an intensity of the photon interaction, wherein the intensity is based upon adding a response to the central pixel and the plurality of neighboring pixels.

8. The method of claim 1 , wherein the characteristic comprises a location of the photon interaction, wherein the determining the location of the interaction comprises comparing a latency from at least two neighboring pixels.

9. The method of claim 1 , wherein the plurality of responses does not correspond to responses from a cathode of the photon detector pixel array.

10. The method of claim 1 , wherein the photon detector pixel array comprises an array of pixelated semiconductor detectors comprising CdZnTe.

11. An apparatus, comprising:

a photon detector pixel array comprising a plurality of pixels;

a processor operatively coupled to the photon detector pixel array;

a memory device that stores instructions executable by the processor to:

receive a photon interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels;

determine a photoelectron cloud generated from the photon interaction, wherein the photon detector pixel array comprises an electric field, wherein an electrostatic repulsive force disperses a photon to the photoelectron cloud;

identify a subset of the plurality of pixels associated with the photon interaction, wherein each of the subset of the plurality of pixels corresponds to pixels activated by the photo electron cloud, wherein the subset of the plurality of pixels comprise a central pixel and a plurality of neighboring pixels, wherein the central pixel comprises the pixel having the highest amplitude response to the photon interaction; and

determine, from the photoelectron cloud, a characteristic of the photon interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction, wherein the determining comprises adding a correction factor from each of the plurality of pixels to the central pixel based upon a ratio of energy of each of the plurality of pixels.

12. The device of claim 11 , wherein the photon detector array comprises an anode and a cathode that generates electro-static repulsion within the photon.

13. The device of claim 11 , wherein the central pixel receives a negative charge current induction.

14. The device of claim 11 , wherein each of the plurality of neighboring pixels receives a positive charge current induction.

15. The device of claim 14 , wherein the positive charge current induction is proportional to a subset of the photoelectron cloud.

16. The device of claim 11 , wherein the characteristic comprises a location of the photon interaction, wherein the determining the location of the interaction comprises comparing a pulse height from at least two neighboring pixels.

17. The device of claim 11 , wherein the characteristic comprises an intensity of the photon interaction, wherein the intensity is based upon adding a response to the central pixel and the plurality of neighboring pixels.

18. The device of claim 11 , wherein the characteristic comprises a location of the photon interaction, wherein the determining the location of the interaction comprises comparing a latency from at least two neighboring pixels.

19. The device of claim 11 , wherein the plurality of responses does not correspond to responses from a cathode of the photon detector pixel array.

20. A product, comprising:

a non-transitory storage device that stores code, the code being executable by a processor and comprising:

code that receives a photon interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels;

code that determines a photoelectron cloud generated from the photon interaction, wherein the photon detector pixel array comprises an electric field, wherein an electrostatic repulsive force disperses a photon to the photoelectron cloud;

code that identifies a subset of the plurality of pixels associated with the photon interaction, wherein each of the subset of the plurality of pixels corresponds to pixels activated by the photo electron cloud, wherein the subset of the plurality of pixels comprise a central pixel and a plurality of neighboring pixels, wherein the central pixel comprises the pixel having the highest amplitude response to the photon interaction; and

code that determines, from the photoelectron cloud, a characteristic of the photon interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction, wherein the determining comprises adding a correction factor from each of the plurality of pixels to the central pixel based upon a ratio of energy of each of the plurality of pixels.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 7, 2020
From: HARRIS, BRIAN WILLIAM; TOMITA, HIDEFUMI
To: KROMEK GROUP, PLC
Reel/Frame 052601/0158 →
Continuity (1)
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