Characterization system and method with guided defect discovery
A system is disclosed, in accordance with one or more embodiment of the present disclosure. The system may include a controller including one or more processors configured to execute a set of program instructions. The set of program instructions may be configured to cause the processors to: receive images of a sample from a characterization sub-system; identify target clips from patch clips; prepare processed clips based on the target clips; generate encoded images by transforming the processed clips; sort the encoded images into a set of clusters; display sorted images from the set of clusters; receive labels for the displayed sorted images; determine whether the received labels are sufficient to train a deep learning classifier; and upon determining the received labels are sufficient to train the deep learning classifier, train the deep learning classifier via the displayed sorted images and the received labels.
1. A system comprising:
a controller including one or more processors configured to execute a set of program instructions stored in memory, the set of program instructions configured to cause the one or more processors to:
receive one or more images of a sample from a characterization sub-system, wherein the one or more images include one or more patch clips;
identify one or more target clips from the one or more patch clips;
prepare one or more processed clips based on the one or more target clips;
generate one or more encoded images by transforming the one or more processed clips via an autoencoder;
sort the one or more encoded images into a set of clusters via a clustering algorithm;
display one or more sorted images from one or more of the set of clusters to a user via a user interface;
receive one or more labels for the one or more displayed sorted images from the user via the user interface;
determine whether the received one or more labels are sufficient to train a deep learning classifier; and
upon determining the received one or more labels are sufficient to train the deep learning classifier, train the deep learning classifier via the one or more displayed sorted images and the received one or more labels.
2. The system of claim 1 , wherein the preparing the one or more processed clips based on the one or more target clips comprises:
generating at least one of one or more median clips or one or more difference clips.
3. The system of claim 1 , wherein the set of program instructions are further configured to cause the one or more processors to:
apply the deep learning classifier to one or more additional target images to automatically classify the one or more additional target images.
4. The system of claim 1 , wherein the set of program instructions are further configured to cause the one or more processors to:
prior to determining the received one or more labels are sufficient to train the deep learning classifier, determine that the received one or more labels are insufficient to train the deep learning classifier;
display additional one or more sorted images to the user via the user interface;
receive one or more additional labels for the one or more additional displayed sorted images from the user via the user interface; and
determine whether the received one or more additional labels are sufficient to train the deep learning classifier.
5. The system of claim 1 , wherein the characterization sub-system comprises at least one of a scanning electron microscopy (SEM) sub-system or an optical inspection sub-system.
6. The system of claim 5 , wherein the optical inspection sub-system comprises at least one of a bright-field inspection sub-system or a dark-field inspection sub-system.
7. The system of claim 1 , wherein the autoencoder is configured to learn a low dimensional representation of the one or more patch clips.
8. The system of claim 1 , wherein the set of clusters are sorted based on one or more similar defect characteristics.
9. The system of claim 1 , wherein the set of clusters further include:
one or more outlier events.
10. The system of claim 1 , wherein the one or more target clips includes one or more defects of interest (DOIs).
11. A system comprising:
a controller including one or more processors configured to execute a set of program instructions stored in memory, the set of program instructions configured to cause the one or more processors to:
receive one or more images of a sample from a characterization sub-system, wherein the one or more images include one or more patch clips;
identify one or more target clips from the one or more patch clips;
prepare one or more processed clips based on the one or more target clips;
generate one or more encoded images by transforming the one or more processed clips via an autoencoder;
sort the one or more encoded images into a set of clusters via a clustering algorithm;
display one or more sorted images from one or more of the set of clusters to a user via a user interface;
receive one or more labels for the one or more displayed sorted images from the user via the user interface;
determine whether the received one or more labels are sufficient to train a deep learning classifier;
upon determining the received one or more labels are insufficient to train the deep learning classifier, display additional one or more sorted images to the user via the user interface;
receive one or more additional labels for the one or more additional displayed sorted images from the user via the user interface;
determine whether the received additional one or more labels are sufficient to train the deep learning classifier; and
upon determining the received one or more additional labels are sufficient to train the deep learning classifier, train the deep learning classifier via the one of the one or more displayed sorted images, the one or more additional displayed sorted images, the received one or more labels, and the received one or more additional labels.
12. The system of claim 11 , wherein the preparing the one or more processed clips based on the one or more target clips comprises:
generating at least one of one or more median clips or one or more difference clips.
13. The system of claim 11 , wherein the set of program instructions are further configured to cause the one or more processors to:
apply the deep learning classifier to one or more additional target images to automatically classify the one or more additional target images.
14. The system of claim 11 , wherein the characterization sub-system comprises at least one of a scanning electron microscopy (SEM) sub-system or an optical inspection sub-system.
15. The system of claim 14 , wherein the optical inspection sub-system comprises at least one of a bright-field inspection sub-system or a dark-field inspection sub-system.
16. The system of claim 11 , wherein the autoencoder is configured to learn a low dimensional representation of the one or more patch clips.
17. The system of claim 11 , wherein the set of clusters are sorted based on one or more similar defect characteristics.
18. The system of claim 11 , wherein the set of clusters further include:
one or more outlier events.
19. The system of claim 11 , wherein the one or more target clips includes one or more defects of interest (DOIs).
20. A method comprising:
receiving one or more images of a sample from a characterization sub-system, wherein the one or more images include one or more patch clips;
identifying one or more target clips from the one or more patch clips;
preparing one or more processed clips based on the one or more target clips;
generating one or more encoded images by transforming the one or more processed clips via an autoencoder;
sorting the one or more encoded images into a set of clusters via a clustering algorithm;
displaying one or more sorted images from one or more of the set of clusters to a user via a user interface;
receiving one or more labels for the one or more displayed sorted images from the user via the user interface;
determining whether the received one or more labels are sufficient to train a deep learning classifier; and
upon determining the received one or more labels are sufficient to train the deep learning classifier, training the deep learning classifier via the one or more displayed sorted images and the received one or more labels.
21. A method comprising:
receiving one or more images of a sample from a characterization sub-system, wherein the one or more images include one or more patch clips;
identifying one or more target clips from the one or more patch clips;
preparing one or more processed clips based on the one or more target clips;
generating one or more encoded images by transforming the one or more processed clips via an autoencoder;
sorting the one or more encoded images into a set of clusters via a clustering algorithm;
displaying one or more sorted images from one or more of the set of clusters to a user via a user interface;
receiving one or more labels for the one or more displayed sorted images from the user via the user interface;
determining whether the received one or more labels are sufficient to train a deep learning classifier;
upon determining the received one or more labels are insufficient to train the deep learning classifier, displaying one or more additional sorted images to the user via the user interface;
receiving one or more additional labels for the one or more additional displayed sorted images from the user via the user interface;
determining whether the received one or more additional labels are sufficient to train the deep learning classifier; and
upon determining the received one or more additional labels are sufficient to train the deep learning classifier, training the deep learning classifier via the one or more displayed sorted images, the one or more additional displayed sorted images, the received one or more labels, and the received one or more additional labels.