Method and apparatus for x-ray scattering material analysis

1. Method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis, comprising:

generating and directing an incident X-ray beam along a propagation direction (X) to a sample held in a sample environment;

executing a sample measurement process ( 400 ) comprising the following steps:

determining a distribution of X rays scattered from said sample by means of an area detector ( 10 ) arranged downstream of said sample environment; and

determining an intensity (It) of a beam of X rays transmitted through said sample by means of said detector ( 10 );

executing a sample data treatment process ( 500 ) comprising the following step:

determining an absolute scattered X-ray distribution by applying to said scattered X-ray distribution a conversion into absolute intensities which depends on said transmitted intensity; and

executing a data analysis process ( 800 ) comprising the following step:

determining at least one structural characteristic of said sample on the basis of said absolute scattered X-ray distribution;

characterized in that

acquisition of said scattered and said transmitted X-rays is divided into a plurality of acquisition periods, wherein each acquisition period (Tacq) is shorter than or equal to a previously determined maximum acquisition time (Tmax) in such a way that said detector ( 10 ) always operates in a linear range;

said detector ( 10 ) measures individual detector image frames containing signals of said scattered and said transmitted X-rays, wherein each individual detector image frame is measured during one among said plurality of acquisition periods;

said individual detector image frames are added up to a total detector image frame in a computer connected to said detector ( 10 ); and

said determination of said at least one structural characteristic of said sample is realized based on an absolute scattered X-ray distribution obtained on the basis of said total detector image frame.

2. A method according to claim 1 , wherein said total detector image frame is displayed and continuously updated with each additional individual detector image frame on a screen connected to said computer.

3. A method according to claim 1 , furthermore comprising a maximum acquisition time determining process ( 100 ) executed before said sample measurement process ( 400 ), wherein said maximum acquisition time determining process ( 100 ) comprises:

measuring said intensity (It) of a beam of X rays transmitted through said sample; and

calculating said maximum acquisition time on the basis of said intensity (It).

4. A method according to claim 1 , furthermore comprising a beam resolution determining process ( 200 ) executed before said sample measurement process ( 400 ), wherein said beam resolution determining process ( 200 ) comprises:

measuring at least one individual detector image frame containing signals of an X-ray beam transmitted through said sample environment and of X rays scattered from said sample environment with the sample in place or in a situation in which no sample and no sample solvent is held in said sample environment; and

determining a beam resolution of said transmitted X-ray beam from said at least one individual detector image frame,

wherein preferably said step of determining a beam resolution comprises executing an azimuthal averaging of said at least one individual detector image frame such as to convert a 2D signal intensity distribution in said individual detector image frame or in a total detector image frame obtained by adding up said individual detector image frames into a 1D intensity distribution as a function of momentum transfer (Q).

5. A method according to claim 1 , furthermore comprising a sample environment calibration process ( 300 ) executed before said sample measurement process ( 400 ), wherein said sample environment calibration process ( 300 ) comprises:

measuring individual detector image calibration frames containing signals of said scattered and said transmitted X-rays by means of said detector ( 10 ) in a situation in which no sample is held in said sample environment, wherein each individual detector image calibration frame is measured during one among a plurality of calibration acquisition periods;

adding up said individual detector image calibration frames to a total detector image calibration frame in said computer connected to said detector ( 10 );

determining a transmitted intensity and a beam center position from said total detector image calibration frame.

6. A method according to claim 5 , wherein said sample environment calibration process ( 300 ) furthermore comprises executing an azimuthal averaging of said total detector image calibration frame such as to convert a 2D signal intensity distribution in said total detector image calibration frame into a 1D calibration intensity distribution as a function of momentum transfer (Q),

wherein preferably said conversion is realized continuously between scattered signals corresponding to a finite momentum transfer Q>0 and transmitted signals measured along said propagation direction (X) corresponding to no momentum transfer Q=0.

7. A method according to claim 1 , wherein said data analysis process ( 800 ) comprises:

determining a transmitted intensity and a beam center position from said total detector image frame,

wherein preferably said data analysis process ( 800 ) furthermore comprises:

executing an azimuthal averaging of said total detector image frame such as to convert a 2D signal intensity distribution in said total detector image frame into a 1D intensity distribution as a function of momentum transfer (Q),

wherein preferably said conversion is realized continuously between scattered signals corresponding to a finite momentum transfer Q>0 and transmitted signals measured along said propagation direction (X) corresponding to no momentum transfer Q=0.

8. A method according to claim 7 , furthermore comprising correcting said 1D intensity distribution by means of said 1D calibration intensity distribution, preferably furthermore comprising a data quality control process ( 600 ) in which a signal to noise ratio in a predetermined range of momentum transfer (Q) in said corrected 1D intensity distribution is compared to a predetermined threshold and a feedback action is executed depending on the result of said comparison,

wherein preferably said feedback action comprises at least one of the following:

stopping said sample measurement process ( 400 );

changing a position of said area detector ( 10 );

changing an opening of one or more collimating apertures.

9. A method according to claim 8 , wherein several additional measuring steps are performed with different measuring parameters such as detector position or collimation apertures comprising a final merge step wherein several 1D intensity distributions corresponding to different measuring parameters for different ranges of momentum transfer are joined together in a merged 1D intensity distribution,

wherein preferably the merged 1D intensity distribution is associated to different beam resolution functions obtained by a beam resolution determination process for each of the different measuring parameters.

10. A method according to claim 1 , furthermore comprising a data posttreatment process ( 700 ), comprising a background removal step in which background signals are removed from said individual detector image frames based on a comparison with said total detector image frame, wherein said background corrected individual detector image frames are added up to a total background corrected detector image frame in said computer, and wherein a background corrected determination of said at least one structural characteristic of said sample is realized based on said total background corrected detector image frame,

preferably furthermore comprising determining a background corrected transmitted intensity and a background corrected beam center position from said total background corrected detector image frame.

11. A method according to claim 10 , furthermore comprising executing an azimuthal averaging of said total background corrected detector image frame such as to convert a 2D signal intensity distribution in said total background corrected detector image frame into a 1D background corrected intensity distribution as a function of momentum transfer (Q),

wherein preferably said conversion is realized continuously between background corrected scattered signals corresponding to a finite momentum transfer Q>0 and background corrected transmitted signals measured along said propagation direction (X) corresponding to no momentum transfer Q=0,

preferably furthermore comprising correcting said 1D background corrected intensity distribution by means of said 1D background corrected calibration intensity distribution.

12. A method according to claim 1 , furthermore comprising executing UV-Vis analysis on said sample, preferably simultaneously with said sample measurement process.

13. A method according to claim 12 , wherein said sample environment comprises a capillary containing said sample and an evacuated capillary holder block holding said capillary, wherein UV-Vis lenses through which incoming UV-Vis light is directed to said sample and transmitted UV-Vis light is directed to a spectrometer, respectively, are inserted into said capillary holder block,

wherein preferably said UV-Vis lenses are mounted into said capillary holder block in a vacuum tight manner.

14. A method according to claim 1 , wherein said structural characteristic is a particle size distribution, a particle surface area distribution, a radius of gyration and/or a shape of particles within said sample.

15. An apparatus for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis, comprising:

a sample environment for holding a sample ( 12 );

an X-ray beam delivery system for generating and directing an incident X-ray beam along a propagation direction (X) to said sample ( 12 );

an area detector ( 10 ) arranged downstream of said sample environment; and

a central control computer designed to control said apparatus such as to execute the method according to claim 1 .