IP Library › Granted Patent US 11,277,113
Granted Patent B2
US 11,277,113 · App. 16/936,807 · Granted Mar 15, 2022

Bulk-acoustic wave resonator

Inventors: Seung Wook Park (Suwon-si, KR); Jae Hyun Jung (Suwon-si, KR); Jae Chang Lee (Suwon-si, KR); Dae Hun Jeong (Suwon-si, KR); Sang Uk Son (Suwon-si, KR); Seong Hun Na (Suwon-si, KR)
Assignee: Samsung Electro-Mechanics Co., Ltd.
H03H9/131H03H9/02015H03H9/02157H03H9/17
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Quick Facts
Patent No.
US 11,277,113
App. No.
16/936,807
Granted
Mar 15, 2022
Kind
B2
Abstract

A bulk-acoustic wave resonator includes: a substrate; a first electrode disposed on the substrate; a piezoelectric layer disposed to cover at least a portion of the first electrode; a second electrode disposed to cover at least a portion of the piezoelectric layer; a metal pad connected to the first electrode and the second electrode; and a connection member connected an upper surface of the metal pad. A lower end portion of the connection member includes a tapered portion decreasing in a diameter in a direction toward a lower end of the connection member, and an angle between an inclined surface of the tapered portion and the upper surface of the metal pad is 45° to 80°.

Claims (43)

1. A bulk-acoustic wave resonator, comprising:

a substrate;

a first electrode disposed on the substrate;

a piezoelectric layer disposed to cover at least a portion of the first electrode;

a second electrode disposed to cover at least a portion of the piezoelectric layer;

a metal pad connected to the first electrode and the second electrode; and

a connection member connected an upper surface of the metal pad,

wherein an upper end portion of the connection member includes a cylindrical portion having a constant diameter,

wherein a lower end portion of the connection member includes a tapered portion disposed below the cylindrical portion and decreasing in a diameter in a direction toward the lower end of the connection member,

wherein an angle between an inclined surface of the tapered portion and the upper surface of the metal pad is 45° to 80°, and

wherein a diameter of a bottom surface of the tapered portion is 60 μm or more.

2. A bulk-acoustic wave resonator, comprising:

a substrate;

a first electrode disposed on the substrate;

a piezoelectric layer disposed to cover at least a portion of the first electrode;

a second electrode disposed to cover at least a portion of the piezoelectric layer;

a metal pad connected to the first electrode and the second electrode; and

a connection member connected an upper surface of the metal pad,

wherein a lower end portion of the connection member includes a tapered portion decreasing in a diameter in a direction toward the lower end of the connection member, the tapered portion has a height of 6 μm or more, and an angle between an inclined surface of the tapered portion and the upper surface of the metal pad is 45° to 80°.

3. The bulk-acoustic wave resonator of claim 2 , wherein an upper end portion of the connection member includes a cylindrical portion having a constant diameter, and wherein the tapered portion is disposed below the cylindrical portion.

4. The bulk-acoustic wave resonator of claim 3 , wherein a diameter of a bottom surface of the tapered portion is 60 μm or more.

5. The bulk-acoustic wave resonator of claim 2 , wherein the connection member is made of any one of gold (Au), a gold-tin (Au—Sn) alloy, copper (Cu), a copper-tin (Cu—Sn) alloy, and aluminum (Al), and an aluminum alloy, or a material containing any two or more of gold (Au), a gold-tin (Au—Sn) alloy, copper (Cu), a copper-tin (Cu—Sn) alloy and aluminum (Al), and an aluminum alloy.

6. The bulk-acoustic wave resonator of claim 2 , further comprising an insertion layer disposed between the first electrode and the piezoelectric layer.

7. The bulk-acoustic wave resonator of claim 2 , further comprising a membrane layer forming a cavity together with the substrate.

8. The bulk-acoustic wave resonator of claim 7 , further comprising:

an etch stop portion disposed to surround the cavity; and

a sacrificial layer disposed to surround the etch stop portion.

9. The bulk-acoustic wave resonator of claim 7 , wherein the membrane layer comprises an inclined portion disposed obliquely with respect to an upper surface of the substrate, and a flat portion disposed in an active region in which the first electrode, the piezoelectric layer, and the second electrode all overlap one another.

10. The bulk-acoustic wave resonator of claim 9 , wherein the second electrode includes a frame disposed at an edge of the active region, and wherein the frame has a thickness greater than a thickness of a remainder of the second electrode.

11. The bulk-acoustic wave resonator of claim 7 , further comprising an insulating layer disposed on the substrate, below the cavity.

12. The bulk-acoustic wave resonator of claim 2 , wherein the metal pad comprises a first metal pad connected to the first electrode, and a second metal pad connected to the second electrode.

13. A bulk-acoustic wave resonator, comprising:

a substrate;

a first electrode disposed on the substrate;

a piezoelectric layer disposed to cover at least a portion of the first electrode;

a second electrode disposed to cover at least a portion of the piezoelectric layer;

a metal pad connected to the first electrode and the second electrode; and

a connection member connected to an upper surface of the metal pad,

wherein the connection member comprises:

a cylindrical portion disposed at an upper end portion of the connection member and having a constant diameter; and

a tapered portion disposed below the cylindrical portion, the tapered portion having a height of 6 μm or more and a diameter that is smaller at a lower end of the tapered portion than an upper end of the tapered portion.

14. The bulk acoustic wave resonator of claim 13 , wherein a bottom surface of the tapered portion is in contact with the upper surface of the metal pad.

15. The bulk acoustic wave resonator of claim 14 , wherein a diameter of the bottom surface of the tapered portion is 60 μm or more.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2020
From: PARK, SEUNG WOOK; JUNG, JAE HYUN; LEE, JAE CHANG; JEONG, DAE HUN; SON, SANG UK; NA, SEONG HUN
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 053292/0710 →
Priority Claims (1)
KR 10-2020-0042080 · Apr 7, 2020 · national
Continuity (1)
Related Publication 20210313954A1 · Oct 7, 2021
Cited By (2)
US 12,603,634 US 12,609,670