Concentration measurement method and concentration measurement device

1. A concentration measurement method for measuring a concentration of impurities in a measurement target object, the concentration measurement method comprising:

irradiating the measurement target object with measurement light and stimulus light subjected to intensity modulation using a modulation signal including a default frequency;

outputting a detection signal by detecting an intensity of reflected light from the measurement target object or transmitted light through the measurement target object; and

detecting a phase delay of the detection signal with respect to the modulation signal, obtaining a frequency at which the phase delay has a predetermined value, and estimating a concentration of impurities in the measurement target object on the basis of a time constant corresponding to a lifetime of carriers in the measurement target object, calculated from the obtained frequency.

2. The concentration measurement method according to claim 1 , wherein the detection signal is one of a plurality of detection signals outputted by detecting an intensity of reflected light from the measurement target object or transmitted light through the measurement target object, further comprising:

detecting, for each of the detection signals, a phase delay of the detection signal with respect to the modulation signal;

obtaining, for each of the detected phase delays, a frequency at which the phase delay has a predetermined value; and

estimating the concentration of impurities in the measurement target object on the basis of a time constant corresponding to a lifetime of carriers in the measurement target object, calculated from the obtained frequencies.

3. The concentration measurement method according to claim 1 ,

wherein irradiation is performed with the stimulus light subjected to intensity modulation due to the modulation signal having rectangular waves.

4. The concentration measurement method according to claim 2 ,

wherein irradiation is performed with the stimulus light subjected to intensity modulation using the modulation signal for each of the obtained frequencies, and

wherein each of the detection signals is output in association with each ray of the stimulus light.

5. The concentration measurement method according to claim 1 ,

wherein the predetermined value is 45 degrees.

6. The concentration measurement method according to claim 1 ,

wherein irradiation is performed with stimulus light having an energy higher than a band-gap energy of a semiconductor configuring the measurement target object.

7. The concentration measurement method according to claim 1 , further comprising:

comparing information of a concentration of impurities input in advance and the concentration of impurities estimated to each other.

8. The concentration measurement method according to claim 1 ,

wherein image data indicating a distribution of a concentration of impurities is generated by mapping the estimated concentration of impurities.

9. A concentration measurement device for measuring a concentration of impurities in a measurement target object, the concentration measurement device comprising:

a first light source configured to generate measurement light;

a second light source configured to generate stimulus light;

a modulator configured to perform intensity modulation of the stimulus light using a modulation signal including a default frequency;

a photo detector configured to output a detection signal by detecting an intensity of reflected light from the measurement target object or transmitted light through the measurement target object;

an optical system configured to guide the measurement light and the stimulus light subjected to intensity modulation toward the measurement target object and to guide reflected light from the measurement target object or transmitted light through the measurement target object toward the photo detector; and

an analyzer configured to detect a phase delay of the detection signal with respect to the modulation signal, to obtain a frequency at which the phase delay has a predetermined value, and to estimate a concentration of impurities in the measurement target object on the basis of a time constant corresponding to a lifetime of carriers in the measurement target object, calculated from the obtained frequency.

10. The concentration measurement device according to claim 9 ,

wherein the analyzer is configured to detect a plurality of phase delays of a plurality of detection signals having default frequencies and to obtain, for each of the detected phase delays, a frequency at which the phase delay has a predetermined value.

11. The concentration measurement device according to claim 9 ,

wherein the modulator performs intensity modulation of the stimulus light using the modulation signal having rectangular waves.

12. The concentration measurement device according to claim 10 ,

wherein the modulator performs intensity modulation of the stimulus light using the modulation signal for each of the default frequencies, and

wherein the photo detector outputs each of the detection signals in association with each ray of the stimulus light.

13. The concentration measurement device according to claim 9 ,

wherein the predetermined value is 45 degrees.

14. The concentration measurement device according to claim 9 ,

wherein the second light source generates stimulus light having an energy higher than a band-gap energy of a semiconductor configuring the measurement target object.

15. The concentration measurement device according to claim 9 ,

wherein the analyzer compares information of a concentration of impurities input in advance and the estimated concentration of impurities to each other.

16. The concentration measurement device according to claim 9 ,

wherein the analyzer generates image data indicating a distribution of a concentration of impurities by mapping the estimated concentration of impurities.