IP Library › Granted Patent US 11,282,567
Granted Patent B2
US 11,282,567 · App. 16/947,795 · Granted Mar 22, 2022

Sequential SLC read optimization

Inventors: Tomoko Ogura Iwasaki (San Jose, CA); Tracy D. Evans (Boise, ID); Avani F. Trivedi (Eagle, ID); Aparna U. Limaye (Boise, ID); Jianmin Huang (San Carlos, CA)
Assignee: Micron Technology, Inc.
G11C11/4087G06F12/0246G11C11/4074G11C11/4085G06F2212/7201
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Quick Facts
Patent No.
US 11,282,567
App. No.
16/947,795
Filed
Aug 17, 2020
Granted
Mar 22, 2022
Kind
B2
Art Unit
2827
USPC
365/185.23
Abstract

Systems and methods for read operations and management are disclosed. More specifically, this disclosure is directed to receiving a first read command directed to a first logical address and receiving, after the first read command, a second read command directed to a second logic address. The method also includes receiving, after the second read command, a third read command directed to a third logical address and determining that the first logical address and the third logical address correspond to a first physical address and a third physical address, respectively. The first physical address and the third physical address can be associated with a first word line of a memory component while the second logical address corresponds to a second physical address associated with a second word line of the memory component. The method includes executing the first read command and the third read command sequentially.

Claims (38)

1. A method comprising:

receiving a first read command directed to a first logical address;

receiving, after the first read command, a second read command directed to a second logic address;

receiving, after the second read command, a third read command directed to a third logical address;

determining that the first logical address corresponds to a first physical address, that the third logical address corresponds to a third physical address, that the first physical address and the third physical address are associated with a first word line of a memory component, and that the second logical address corresponds to a second physical address associated with a second word line of the memory component; and

executing the first read command and the third read command sequentially.

2. The method of claim 1 , wherein executing the first read command and the third read command sequentially comprises executing the first read command and the third read command prior to executing the second read command.

3. The method of claim 1 , wherein executing the first read command and the third read command sequentially comprises executing the first read command and the third read command after executing the second read command.

4. The method of claim 1 , further comprising:

performing an unselected word line setup operation and a selected word line setup operation for both the first read command and the third read command.

5. The method of claim 4 , wherein performing the unselected word line setup operation comprises applying an unselected word line voltage to one or more word lines not associated with the first physical address and the third physical address.

6. The method of claim 4 , wherein performing the selected word line setup operation comprises applying a selected word line voltage to the first word line of the memory component.

7. The method of claim 1 , wherein the first physical address is a first data subblock, the second physical address is a second data subblock, and the third physical address is a third data subblock.

8. A system comprising:

a memory component; and

a processing device, coupled to the memory component, configured to:

receive a first read command directed to a first logical address;

receive, after the first read command, a second read command directed to a second logic address;

receive, after the second read command, a third read command directed to a third logical address;

determine that the first logical address corresponds to a first physical address, that the third logical address corresponds to a third physical address, that the first physical address and the third physical address are associated with a first word line of a memory component, and that the second logical address corresponds to a second physical address associated with a second word line of the memory component; and

execute the first read command and the third read command sequentially.

9. The system of claim 8 , wherein when the processing device executes the first read command and the third read command sequentially, the processing device executes the first read command and the third read command prior to executing the second read command.

10. The system of claim 8 , wherein when the processing device executes the first read command and the third read command sequentially, the processing device executes the first read command and the third read command after executing the second read command.

11. The system of claim 8 , wherein the processing device performs an unselected word line setup operation and a selected word line setup operation for both the first read command and the third read command.

12. The system of claim 11 , wherein performing the unselected word line setup operation comprises applying an unselected word line voltage to one or more word lines not associated with the first physical address and the third physical address.

13. The system of claim 11 , wherein performing the selected word line setup operation comprises applying a selected word line voltage to the first word line of the memory component.

14. The system of claim 8 , wherein the first physical address is a first data subblock, the second physical address is a second data subblock, and the third physical address is a third data subblock.

15. A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

receive a first read command directed to a first logical address;

receive, after the first read command, a second read command directed to a second logic address;

receive, after the second read command, a third read command directed to a third logical address;

determine that the first logical address corresponds to a first physical address, that the third logical address corresponds to a third physical address, that the first physical address and the third physical address are associated with a first word line of a memory component, and that the second logical address corresponds to a second physical address associated with a second word line of the memory component; and

reorder an execution of the first read command, the second read command, and the third read command such that the first read command, the second read command, and the third read command are executed nonsequentially.

16. The non-transitory computer-readable storage medium of claim 15 , wherein when the processing device executes the first read command, the second read command, and the third read command nonsequentially, the processing device executes the first read command and the third read command prior to executing the second read command.

17. The non-transitory computer-readable storage medium of claim 15 , wherein when the processing device executes the first read command, the second read command, and the third read command nonsequentially, the processing device executes the first read command and the third read command after executing the second read command.

18. The non-transitory computer-readable storage medium of claim 15 , wherein the processing device performs an unselected word line setup operation and a selected word line setup operation for both the first read command and the third read command.

19. The non-transitory computer-readable storage medium of claim 18 , wherein performing the unselected word line setup operation comprises applying an unselected word line voltage to one or more word lines not associated with the first physical address and the third physical address.

20. The non-transitory computer-readable storage medium of claim 18 , wherein performing the selected word line setup operation comprises applying a selected word line voltage to the first word line of the memory component.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2020
From: IWASAKI, TOMOKO OGURA; EVANS, TRACY D.; TRIVEDI, AVANI F.; LIMAYE, APARNA U.; HUANG, JIANMIN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 053557/0258 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2020
From: IWASAKI, TOMOKO OGURA; EVANS, TRACY D.; TRIVEDI, AVANI F.; LIMAYE, APARNA U.; HUANG, JIANMIN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 053517/0486 →
Continuity (2)
Provisional Application 62889240 · Aug 20, 2019
Related Publication 20210057018A1 · Feb 25, 2021