IP Library › Granted Patent US 11,335,531
Granted Patent B2
US 11,335,531 · App. 16/789,591 · Granted May 17, 2022

Shadow mask apparatus and methods for variable etch depths

Inventors: Joseph C. Olson (Beverly, MA); Morgan Evans (Manchester, MA); Thomas Soldi (West Simsbury, CT); Rutger Meyer Timmerman Thijssen (Sunnyvale, CA); Maurice Emerson Peploski (Potsdam, NY)
Assignee: Applied Materials, Inc.
H01J37/08H01J29/07H01J37/20H01J37/3056
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Quick Facts
Patent No.
US 11,335,531
App. No.
16/789,591
Granted
May 17, 2022
Kind
B2
Abstract

Methods of producing grating materials with variable height are provided. In one example, a method may include providing a grating material atop a substrate, and positioning a shadow mask between the grating material and an ion source, wherein the shadow mask is separated from the grating material by a distance. The method may further include etching the grating material using an ion beam passing through a set of openings of the shadow mask, wherein a first depth of a first portion of the grating material is different than a second depth of a second portion of the grating material.

Claims (20)

1. A method, comprising:

providing an etching material atop a substrate;

positioning a shadow mask between the etching material and an ion source, wherein at least a portion of the shadow mask is separated from the etching material by a distance;

providing a raised surface feature along a leading edge or a trailing edge of one or more openings of a set of openings of the shadow mask, wherein an uppermost surface of the raised surface feature extends above an uppermost surface of the shadow mask, and wherein the uppermost surface of the raised surface feature extends at a non-zero angle relative to the uppermost surface of the shadow mask; and

etching the etching material using an ion beam passing through the set of openings of the shadow mask, wherein a first depth of a first portion of the etching material is different than a second depth of a second portion of the etching material.

2. The method of claim 1 , further comprising etching the etching material to form a plurality of structures and a plurality of trenches.

3. The method of claim 2 , further comprising forming the plurality of structures at a non-zero angle with respect to a vertical extending from a top surface of the etching material.

4. The method of claim 1 , further comprising varying a distance between the shadow mask and the top surface of the etching material, between the leading edge and the trailing edge of the one or more openings of the set of openings.

5. The method of claim 4 , further comprising varying the distance between the shadow mask and the top surface of the etching material, between a first side edge and a second side edge of the one or more openings of the set of openings.

6. The method of claim 1 , further comprising aligning an opening of the set of openings over a processing area of the etching material impacted by the ion beam, wherein a distance between the trailing edge of the opening and a first grating edge of the etching material is different than a second distance between the leading edge of the opening and a second grating edge of the etching material.

7. The method of claim 1 , further comprising maintaining the ion beam at a constant power or a variable power while forming the plurality of structures.

8. The method of claim 1 , further comprising forming a plurality of optical gratings across the etching material, wherein the ion beam passing through one opening of the set of openings simultaneously impacts at least two optical gratings of the plurality of optical gratings.

9. A method of forming an optical grating, comprising:

providing an optical grating material atop a substrate;

positioning a shadow mask between the optical grating material and an ion source, wherein at least a portion of the shadow mask is separated from the optical grating material by a distance;

providing a raised surface feature along a leading edge or a trailing edge of one or more openings of a set of openings of the shadow mask, wherein an uppermost surface of the raised surface feature extends above an uppermost surface of the shadow mask, and wherein the uppermost surface of the raised surface feature extends at a non-zero angle relative to the uppermost surface of the shadow mask; and

forming a plurality of structures by etching the optical grating material using an ion beam passing through the set of openings of the shadow mask, wherein a first depth of a first portion of the optical grating material is different than a second depth of a second portion of the optical grating material.

10. The method of claim 9 , further comprising etching the optical grating material to form the plurality of structures and a plurality of trenches, wherein the plurality of structures are oriented at a non-zero angle with respect to a vertical extending from a top surface of the optical grating material.

11. The method of claim 10 , further comprising varying, between the leading edge and the trailing edge of the one or more openings of the set of openings, a distance between the shadow mask and the top surface of the optical grating material.

12. The method of claim 10 , wherein the raised surface feature extends above a plane defined by the top surface of the optical grating material.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECTIVE ASSIGNMENT TO CORRECT THE 4TH CONVEYING PARTY FULL LAST NAME PREVIOUSLY RECORDED ON REEL 052456 FRAME 0398. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 29, 2020
From: OLSON, JOSEPH C.; EVANS, MORGAN; SOLDI, THOMAS; MEYER TIMMERMAN THIJSSEN, RUTGER; PEPLOSKI, MAURICE EMERSON
To: APPLIED MATERIALS, INC.
Reel/Frame 055436/0580 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 5TH CONVEYING PARTY EXECUTION DATE ALSO 4TH CONVEYING PARTY NAME PREVIOUSLY RECORDED AT REEL: 52185 FRAME: 607. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 21, 2020
From: OLSON, JOSEPH C.; EVANS, MORGAN; SOLDI, THOMAS; THIJSSEN, RUTGER MEYER TIMMERMAN; PEPLOSKI, MAURICE EMERSON
To: APPLIED MATERIALS, INC.
Reel/Frame 052456/0398 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2020
From: OLSON, JOSEPH C.; EVANS, MORGAN; SOLDI, THOMAS; METER TIMMERMAN THIJSSEN, RUTGER; PEPLOSKI, MAURICE EMERSON
To: APPLIED MATERIALS, INC.
Reel/Frame 052185/0607 →
Continuity (1)
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Cited By (1)
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