IP Library › Granted Patent US 11,348,757
Granted Patent B2
US 11,348,757 · App. 17/260,494 · Granted May 31, 2022

Charged particle beam device

Inventors: Shuhei Yabu (Tokyo, JP); Michio Hatano (Tokyo, JP); Shin Imamura (Tokyo, JP); Masaaki Komatsu (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
H01J37/244G02B1/041G02B19/0009H01J37/226H01J2237/04735H01J2237/2445
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Quick Facts
Patent No.
US 11,348,757
App. No.
17/260,494
Granted
May 31, 2022
Kind
B2
Abstract

In order to improve a yield of light generated by a collision between secondary electrons and gas molecules, the invention provides a charged particle beam device including: a charged particle beam source configured to irradiate a sample with a charged particle beam; a sample chamber configured to hold the sample and a gas molecule; a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample; a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.

Claims (34)

1. A charged particle beam device, comprising:

a charged particle beam source configured to irradiate a sample with a charged particle beam;

a sample chamber configured to hold the sample and a gas molecule;

a positive electrode configured to form an electric field that accelerates a secondary electron emitted from the sample;

a photodetector configured to detect light generated by a collision between the accelerated secondary electron and the gas molecule; and

a light condensing unit disposed between the sample and the photodetector, having a light emitting space in which the light is generated, and configured to condense the light generated in the light emitting space on a photodetector side.

2. The charged particle beam device according to claim 1 , wherein

a material of the light condensing unit is a fluorine-based resin.

3. The charged particle beam device according to claim 2 , wherein

the fluorine-based resin is polytetrafluoroethylene or expanded polytetrafluoroethylene having an amorphous crystal structure in part.

4. The charged particle beam device according to claim 3 , wherein

the light condensing unit has a thickness so that a diffuse reflectance is 80% or more at a wavelength of light of 300 nm to 450 nm.

5. The charged particle beam device according to claim 1 , wherein

a surface of the light condensing unit facing the light emitting space has a curved shape.

6. The charged particle beam device according to claim 5 , wherein

an inclination angle of the curved shape with respect to a central axis of the light condensing unit increases as a distance from the photodetector increases.

7. The charged particle beam device according to claim 1 , wherein

a surface of the light condensing unit facing the light emitting space has a sawtooth wave shape.

8. The charged particle beam device according to claim 7 , wherein

the sawtooth wave shape includes an inclined surface that is inclined with respect to a central axis of the light condensing unit and faces a photodetector side, and an orthogonal plane orthogonal to the central axis.

9. The charged particle beam device according to claim 1 , wherein

the condensing unit includes a light condensing unit base material, and a light scattering body or a phosphor is applied to an inner peripheral surface of the light condensing unit base material.

10. The charged particle beam device according to claim 1 , wherein

the light condensing unit is a glass member having a refractive index higher than that of vacuum in a wavelength region of the light and having a mirror surface on a surface thereof.

11. The charged particle beam device according to claim 10 , wherein

a metal coating is applied to an outer surface of the glass member.

12. The charged particle beam device according to claim 10 , further comprising:

a light guide in front of the photodetector, wherein

the light guide is a component integral with the glass member.

13. The charged particle beam device according to claim 1 , further comprising:

a second positive electrode to which a voltage lower than a voltage applied to the positive electrode is applied, wherein

the light condensing unit is provided inside the second positive electrode.

14. The charged particle beam device according to claim 1 , wherein

the light condensing unit is electrically insulated from the positive electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2021
From: YABU, SHUHEI; HATANO, MICHIO; IMAMURA, SHIN; KOMATSU, MASAAKI
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 054926/0315 →
Continuity (1)
Related Publication 20210272768A1 · Sep 2, 2021
Cited By (1)
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