RF ion trap ion loading method
In one aspect, a method of processing ions in a mass spectrometer is disclosed, which comprises trapping a plurality of ions having different mass-to-charge (m/z) ratios in a collision cell, releasing said ions from the collision cell in a descending order in m/z ratio, and receiving the ions in a mass analyzer having a plurality of rods to at least one of which an RF voltage is applied, where the RF voltage is varied from a first value to a lower second value as the released ions are received by the mass analyzer.
1. A method of processing ions in a mass spectrometer, comprising:
trapping a plurality of ions having different mass-to-charge (m/z) ratios in a collision cell,
releasing said ions from the collision cell in a descending order in m/z ratio,
receiving said ions in a mass analyzer having a plurality of rods to at least one of which an RF voltage is applied,
wherein an amplitude of said RF voltage is varied from a first value to a lower second value as said released ions are received by the mass analyzer.
2. The method of claim 1 , further comprising releasing said received ions from said mass analyzer via mass selective axial ejection (MSAE).
3. The method of claim 1 , wherein said collision cell comprises a plurality of rods arranged in a quadrupole configuration.
4. The method of claim 3 , wherein said step of releasing the ions from the collision cell comprises utilizing mass selective axial ejection (MSAE).
5. The method of claim 4 , wherein said MSAE is performed by application of a dipolar voltage across two radially opposed rods of said plurality of rods of the collision cell.
6. The method of claim 5 , wherein an amplitude of the excitation voltage is ramped from a first value to a second lower value to release ions from the collision cell in descending m/z ratio.
7. The method of claim 4 , wherein said MSAE is performed by applying an excitation voltage to a lens disposed between said collision cell and said mass analyzer.
8. The method of claim 1 , wherein said mass analyzer comprises a plurality of rods arranged in a quadrupole configuration.
9. The method of claim 8 , wherein said RF voltage is applied to at least one of said plurality of rods.
10. The method of claim 1 , wherein the amplitude of the RF voltage is varied linearly from said first value to said second value.
11. The method of claim 1 , wherein the amplitude of the RF voltage is varied nonlinearly from said first value to said second value.
12. The method of claim 1 , further comprising applying a gas pressure pulse to said mass analyzer ion trap as ions received by the mass analyzer ion trap from the collision cell.
13. The method of claim 1 , further comprising performing the following steps prior to said step of trapping a plurality of ions:
generating ions, and
mass selecting a subset of said generated ions for trapping.
14. The method of claim 1 , further comprising mass selectively axially ejecting said ions from said mass analyzer from a low m/z ratio to a high m/z ratio.
15. A mass spectrometer, comprising
a source for generating a plurality of ions having different mass-to-charge (m/z) ratios,
an ion trap for receiving and trapping at least a subset of said plurality of ions, wherein said subset comprises ions having different m/z ratios,
a mass analyzer positioned downstream of said ion trap, said mass analyzer comprising a plurality of rods to at least one of which an RF voltage can be applied, and
a controller for effecting release of said trapped ions from the ion trap in a descending order in m/z ratio and varying an amplitude of the RF voltage applied to at least one rod of the mass analyzer as the released ions are received by said mass analyzer.
16. The mass spectrometer of claim 15 , wherein said ion trap comprises four rods arranged in a quadrupole configuration.
17. The mass spectrometer of claim 15 , further comprising at least a first RF voltage source for applying an RF voltage to said at least one rod of said mass analyzer and at least a second RF voltage source for applying an RF voltage to at least one rod of said ion trap for radially confining ions therein.
18. The mass spectrometer of claim 15 , wherein said mass spectrometer further comprises an excitation voltage source operating under control of said controller for applying an excitation voltage across two rods of said collision cell for causing release of ions contained in the collision cell.
19. The mass spectrometer of claim 17 , wherein said controller controls said first RF voltage source to cause varying the amplitude of RF voltage applied to said at least one rod of the mass analyzer as the released ions are received by the mass analyzer.