Optical waveguide, optical concentration measuring device, and method for manufacturing optical waveguide
It is an object of this invention to provide an optical waveguide, an optical concentration measuring device, and a method for manufacturing an optical waveguide capable of achieving an improvement of evanescent wave exuding efficiency of propagating light and light extraction efficiency. A core layer provided in an optical waveguide has a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting the first portion and the second portion. The third portion is formed so that the film thickness is gradually increased from the second portion having the smaller film thickness toward the first portion having the larger film thickness between the first portion and the second portion, and the maximum inclination angle is 10° or more and 45° or less.
1. An optical waveguide comprising:
a core layer capable of propagating light and having a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting between the first portion and the second portion,
wherein the first portion has a grating portion,
the second portion has a light propagation portion,
in the third portion, a film thickness is gradually increased from a small film thickness side toward a large film thickness side between the first portion and the second portion,
the grating portion has a recessed portion, and
a depth of the recessed portion or a film thickness of the recessed portion is larger than a film thickness of the light propagation portion.
2. The optical waveguide according to claim 1 , wherein a maximum inclination angle of a gradually increased film thickness inclination is 10° or more and 45° or less in the third portion.
3. The optical waveguide according to claim 1 , wherein an average inclination angle of a gradually increased film thickness inclination is 30° or less in the third portion.
4. The optical waveguide according to claim 1 , wherein the core layer is made of a single crystal.
5. The optical waveguide according to claim 1 further comprising:
a protective film formed on at least a part of a surface of the core layer, having a film thickness of 1 nm or more and less than 20 nm, and having a refractive index smaller than a refractive index of the core layer.
6. The optical waveguide according to claim 5 , wherein the protective film is a silicon nitride film or a silicon oxynitride film.
7. The optical waveguide according to claim 1 , wherein light propagating through the core layer is an infrared ray as an analog signal.
8. An optical concentration measuring device comprising:
the optical waveguide according to claim 1 ;
a light source capable of making light incident on the core layer; and
a detection unit capable of receiving light propagating through the core layer.
9. The optical concentration measuring device according to claim 8 , wherein the light source makes an infrared ray having a wavelength of 2 μm or more and less than 10 μm incident on the core layer.
10. An optical waveguide comprising:
a core layer capable of propagating light and having a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting between the first portion and the second portion,
wherein the first portion has a grating portion,
the second portion has a light propagation portion,
in the third portion, a film thickness is gradually increased from a small film thickness side toward a large film thickness side between the first portion and the second portion, and
the grating portion has an average film thickness that is larger than a film thickness of the light propagation portion.
11. The optical waveguide according to claim 10 , wherein a maximum inclination angle of a gradually increased film thickness inclination is 10° or more and 45° or less in the third portion.
12. The optical waveguide according to claim 10 , wherein an average inclination angle of a gradually increased film thickness inclination is 30° or less in the third portion.
13. An optical concentration measuring device comprising:
the optical waveguide according to claim 10 ;
a light source capable of making light incident on the core layer; and
a detection unit capable of receiving light propagating through the core layer.
14. An optical waveguide comprising:
a core layer capable of propagating light and having a first portion having a first film thickness, a second portion having a second film thickness different from the first film thickness, and a third portion connecting between the first portion and the second portion,
wherein the first portion has a grating portion,
the second portion has a light propagation portion,
in the third portion, a film thickness is gradually increased from a small film thickness side toward a large film thickness side between the first portion and the second portion,
the grating portion has a projection portion, and
a film thickness of the projection portion is larger than a film thickness of the light propagation portion.
15. The optical waveguide according to claim 14 , wherein a maximum inclination angle of a gradually increased film thickness inclination is 10° or more and 45° or less in the third portion.
16. The optical waveguide according to claim 14 , wherein an average inclination angle of a gradually increased film thickness inclination is 30° or less in the third portion.
17. The optical waveguide according to claim 14 , wherein the core layer is made of a single crystal.
18. The optical waveguide according to claim 14 further comprising:
a protective film formed on at least a part of a surface of the core layer, having a film thickness of 1 nm or more and less than 20 nm, and having a refractive index smaller than a refractive index of the core layer.
19. The optical waveguide according to claim 18 , wherein the protective film is a silicon nitride film or a silicon oxynitride film.
20. An optical concentration measuring device comprising:
the optical waveguide according to claim 14 ;
a light source capable of making light incident on the core layer; and
a detection unit capable of receiving light propagating through the core layer.