IP Library › Granted Patent US 11,381,050
Granted Patent B2
US 11,381,050 · App. 17/085,563 · Granted Jul 5, 2022

Laser cavity optical alignment

Inventor: Kai Hudek (Hyattsville, MD)
Assignees: IONQ, INC.; UNIVERSITY OF MARYLAND, COLLEGE PARK
H01S3/025G02B27/10H01S3/0014H01S3/10
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Quick Facts
Patent No.
US 11,381,050
App. No.
17/085,563
Granted
Jul 5, 2022
Kind
B2
Abstract

The disclosure describes aspects of laser cavity optical alignment, and more particularly, in situ alignment of optical devices in an optical system for replacement or upgrade. In one aspect, a method for optical alignment in an optical system is described that includes providing, via a positioning system, an optical beam to measure surface features and position of a first device under test (DUT), removing the first DUT from the optical system, placing a second DUT in the optical system at substantially the same position from which the first DUT was removed, providing, via the positioning system, an optical beam to measure surface features and position of the second DUT, aligning the second DUT based on the measurements made of the first DUT and the second DUT, and verifying operation of the second DUT in the optical system. The DUT can be an optical device such as an output optical coupler.

Claims (66)

1. An optical alignment system, the system comprising:

a positional component including:

a laser input port configured to receive an optical beam;

one or more alignment mirrors configured to redirect the optical beam to a beam splitter;

the beam splitter configured to redirect the optical beam to a measurement tool probe;

the measurement tool probe configured to redirect the optical beam to a device under test (DUT) within an optical system; and

a long travel translation stage configured to align the optical beam from the measurement tool probe with the DUT,

wherein:

the measurement tool probe is further configured to receive an output optical beam from the DUT,

the beam splitter is further configured to direct the output optical beam to an output of the positional component,

the optical system is a laser, and

the positional component is configured to be at least partially positioned within a laser cavity of the laser to provide the optical beam to measure surface features, position, or both of the DUT while the DUT is within the laser cavity of the laser.

2. The optical alignment system of claim 1 , further comprising:

a detector configured to detect and process the output optical beam directed from the beam splitter; and

an analyzer configured to analyze measurement information related to surface features, position, or both of the DUT obtained from the processing of the output optical beam.

3. The optical alignment system of claim 1 , further comprising:

a plate to which the laser input port, the one or more alignment mirrors, and the beam splitter are mechanically attached, and

a sliding component to which the plate is attached and is configured to slide along the long travel translation stage.

4. The optical alignment system of claim 1 , wherein the positional component is a first positional component and the optical beam provided by the first positional component to the DUT is a first optical beam, the system further comprising:

a second positional component that includes a second laser input port, one or more second alignment mirrors, a second beam splitter, a second measurement tool probe, and a second long travel translation stage, wherein an optical beam provided by the second positional component to the DUT is a second optical beam.

5. The optical alignment system of claim 4 , wherein the first optical beam is a collimated optical beam and the second optical beam is a focused optical beam.

6. The optical alignment system of claim 4 , wherein the first optical beam is applied to one side of the DUT and the second optical beam is applied to another side of the DUT.

7. The optical alignment system of claim 4 , wherein the first optical beam and the second optical beam are applied at 90 degrees from each other.

8. The optical alignment system of claim 4 , wherein the first optical beam and the second optical beam are applied opposite from each other.

9. The optical alignment system of claim 4 , wherein:

the output optical beam of the first positional component is a first output optical beam, and

an output optical beam received from the DUT by the second positional component is a second output optical beam,

the first output optical beam and the second output optical beam are optically combined and provided to a detector for detection and processing.

10. The optical alignment system of claim 1 , wherein the long travel translation stage is configured to travel vertically to:

move the measurement tool probe to align the optical beam from the measurement tool probe with the DUT to measure one or more of surface features and position of the DUT, and

move the measurement tool probe away from alignment with the DUT when not making measurements.

11. The optical alignment system of claim 1 , wherein the long travel translation stage is configured to align the optical beam from the measurement tool probe with an axis of the DUT.

12. The optical alignment system of claim 1 , wherein the long travel translation stage is configured to align the optical beam from the measurement tool probe with the DUT to measure surface features, position, or both of the DUT.

13. The optical alignment system of claim 12 , wherein the surface features include one or more of surface curvature, angle, or tilt.

14. The optical alignment system of claim 1 , wherein:

the DUT is an optical device having a specular surface, and

the measurement tool probe is further configured to be aligned and receive the output optical beam from the DUT having the specular surface.

15. The optical alignment system of claim 1 , wherein:

the DUT is a partially transmissive optical device, and

the measurement tool probe is further configured to be aligned and receive the output optical beam from the partially transmissive optical device.

16. The optical alignment system of claim 1 , wherein:

the DUT is a diffractive optical element, and

the measurement tool probe is further configured to be aligned and receive the output optical beam from the diffractive optical element.

17. The optical alignment system of claim 1 , wherein:

the DUT is a polarization control element, and

the measurement tool probe is further configured to be aligned and receive the output optical beam from the polarization control element.

18. The optical alignment system of claim 1 , wherein:

the DUT is an optical assembly, and

the measurement tool probe is further configured to be aligned and receive the output optical beam from the optical assembly.

19. The optical alignment system of claim 18 , wherein the optical assembly includes at least one retro-reflector, at least one complex lens, or a combination thereof.

20. An optical alignment system, the system comprising:

a first positional component including:

a laser input port configured to receive a first optical beam;

one or more alignment mirrors configured to redirect the first optical beam to a first beam splitter;

the first beam splitter configured to redirect the first optical beam to a first measurement tool probe;

the first measurement tool probe configured to redirect the first optical beam to a device under test (DUT) within an optical system;

a first long travel translation stage configured to align the first optical beam from the first measurement tool probe with the DUT; and

a second positional component including:

a second laser input port configured to receive a second optical beam;

one or more second alignment mirrors configured to redirect the second optical beam to a second beam splitter;

the second beam splitter configured to redirect the second optical beam to a second measurement tool probe;

the second measurement tool probe configured to redirect the second optical beam to the DUT within the optical system; and

a second long travel translation stage configured to align the second optical beam from the second measurement tool probe with the DUT,

wherein:

at least one of the first measurement tool probe or the second measurement tool probe is further configured to receive an output optical beam from the DUT, and

at least one of the first beam splitter or the second beam splitter is further configured to direct the output optical beam to an output of the first positional component or the second positional component.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2021
From: HUDEK, KAI
To: IONQ, INC.; UNIVERSITY OF MARYLAND, COLLEGE PARK
Reel/Frame 056157/0167 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2020
From: HUDEK, KAI
To: IONQ, INC.; UNIVERSITY OF MARYLAND, COLLEGE PARK
Reel/Frame 054227/0144 →
Continuity (3)
Division 16506873 · Jul 9, 2019
Provisional Application 62702142 · Jul 23, 2018
Related Publication 20210075180A1 · Mar 11, 2021