IP Library › Granted Patent US 11,385,106
Granted Patent B2
US 11,385,106 · App. 16/359,114 · Granted Jul 12, 2022

Assembly for detecting temperature and contact assembly having such an assembly

Inventors: Tobias Meissner (Mannheim, DE); Frank Wittrock (Schriesheim, DE)
Assignee: TE Connectivity Germany GmbH
G01K1/16B60L53/16G01K1/14G01K7/42H01R13/6271H01R13/66H01R13/665H01R13/6658H01R13/6683H05K1/181H05K2201/10151
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Quick Facts
Patent No.
US 11,385,106
App. No.
16/359,114
Granted
Jul 12, 2022
Kind
B2
Abstract

An assembly for detecting a temperature of an electrically conductive element comprises a temperature probe and a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material. The heat conductor surrounds the temperature probe at least in sections and has a bearing surface bearing against the electrically conductive element.

Claims (34)

1. An assembly for detecting a temperature of an electrically conductive element, comprising:

a temperature probe; and

a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material, the heat conductor surrounds the temperature probe at least in sections and has a bearing surface formed of the electrically insulating and heat-conductive material and bearing against the electrically conductive element.

2. The assembly of claim 1 , wherein the bearing surface is elastically deformable.

3. The assembly of claim 1 , wherein the bearing surface is at least partially concave.

4. The assembly of claim 1 , wherein the heat conductor is formed of a silicone.

5. The assembly of claim 1 , wherein the temperature probe is arranged on a circuit board.

6. The assembly of claim 1 , wherein the heat conductor surrounds at least three sides of the temperature probe.

7. The assembly of claim 5 , wherein a section of the circuit board is plugged into the heat conductor.

8. The assembly of claim 1 , wherein the heat conductor has a slot adapted to receive the temperature probe.

9. The assembly of claim 1 , wherein the heat conductor completely encloses the temperature probe.

10. The assembly of claim 1 , wherein the heat conductor includes an electrically insulating outer shell and a heat-conductive medium received in the outer shell.

11. The assembly of claim 1 , wherein the heat conductor has a breakdown voltage greater than 500 Volts.

12. A contact assembly, comprising:

a contact receptacle receiving an electrically conductive element; and

a sensor receptacle receiving an assembly for detecting a temperature of the electrically conductive element including a temperature probe and a heat conductor separate from the temperature probe, the heat conductor is made of an electrically insulating and heat-conductive material and surrounds the temperature probe at least in sections and has a bearing surface formed of the electrically insulating and heat-conductive material and bearing against the electrically conductive element.

13. The contact assembly of claim 12 , wherein the contact assembly is a socket or a plug.

14. The contact assembly of claim 12 , wherein the sensor receptacle is formed in a secondary latching element.

15. The contact assembly of claim 14 , wherein the assembly is moved with the secondary latching element.

16. The contact assembly of claim 15 , wherein, in a position of the secondary latching element, the heat conductor abuts against the contact receptacle or overlaps with the contact receptacle.

17. The contact assembly of claim 12 , wherein the sensor receptacle is potted with a material of the heat conductor.

18. An assembly for detecting a temperature of an electrically conductive element, comprising:

a temperature probe; and

a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material, the heat conductor surrounds the temperature probe at least in sections and has a bearing surface bearing against the electrically conductive element, the heat conductor surrounds at least three sides of the temperature probe.

19. The assembly of claim 18 , wherein the heat conductor completely encloses the temperature probe.

20. An assembly for detecting a temperature of an electrically conductive element, comprising:

a temperature probe arranged on a circuit board; and

a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material, the heat conductor surrounds the temperature probe at least in sections and has a bearing surface bearing against the electrically conductive element, a section of the circuit board is plugged into the heat conductor.

21. An assembly for detecting a temperature of an electrically conductive element, comprising:

a temperature probe; and

a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material, the heat conductor surrounds the temperature probe at least in sections and has a bearing surface bearing against the electrically conductive element, the heat conductor has a slot adapted to receive the temperature probe.

22. An assembly for detecting a temperature of an electrically conductive element, comprising:

a temperature probe; and

a heat conductor separate from the temperature probe and made of an electrically insulating and heat-conductive material, the heat conductor surrounds the temperature probe at least in sections and has a bearing surface bearing against the electrically conductive element, the heat conductor includes an electrically insulating outer shell and a heat-conductive medium received in the outer shell.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2019
From: MEISSNER, TOBIAS; WITTROCK, FRANK
To: TE CONNECTIVITY GERMANY GMBH
Reel/Frame 048648/0116 →
Priority Claims (1)
DE 102018204271 · Mar 20, 2018 · national
Continuity (1)
Related Publication 20190293493A1 · Sep 26, 2019