Probe card holding device and inspection device
A probe card holding device includes: a frame that holds a probe card by vacuum suction; a sealing member provided on the frame and configured to form an enclosed space by contacting the probe card; a placement section in which a first engaging portion provided at an outer circumference of the probe card is placed when the probe card is attached to the frame; a second engaging portion configured to be engaged with the first engaging portion; and an actuator configured to drive the second engaging portion between a first position and a second position. When the second engaging portion is engaged with the first engaging portion in response to dissipation of the vacuum suction, the probe card is held by the probe card holding device while the sealing member maintains a seal with the probe card.
1. A probe card holding device comprising:
a frame that holds a probe card by vacuum suction, the probe card being provided with a first engaging portion at an outer circumference of the probe card;
a sealing member provided on the frame, the sealing member being configured to form an enclosed space by contacting the probe card;
a placement section in which the first engaging portion of the probe card is placed when the probe card is attached to the frame;
a second engaging portion configured to be engaged with the first engaging portion; and
an actuator configured to drive the second engaging portion; wherein
the actuator is configured to switch a position of the second engaging portion between a first position in which the second engaging portion is placed to avoid the placement section and a second position in which the second engaging portion is placed to overlap with the placement section; and
in a case in which the second engaging portion is engaged with the first engaging portion in response to dissipation of the vacuum suction, the probe card is held by the probe card holding device while the sealing member maintains a seal with the probe card.
2. The probe card holding device according to claim 1 , wherein
in a case in which the second engaging portion is engaged with the first engaging portion in response to the dissipation of the vacuum suction, the probe card is held by the probe card holding device while the sealing member is elastically deformed.
3. The probe card holding device according to claim 2 , further comprising an annular member, wherein
the second engaging portion is provided at an inner circumference of the annular member; and
the actuator is configured to rotate the annular member.
4. The probe card holding device according to claim 3 , wherein the first engaging portion is separated from the second engaging portion while the probe card is drawn toward the frame by the vacuum suction.
5. The probe card holding device according to claim 1 , further comprising an annular member, wherein
the second engaging portion is provided at an inner circumference of the annular member; and
the actuator is configured to rotate the annular member.
6. The probe card holding device according to claim 1 , wherein the first engaging portion is separated from the second engaging portion while the probe card is drawn toward the frame by the vacuum suction.
7. An inspection device comprising the probe card holding device according to claim 1 .