Method for controlling test apparatus and test apparatus

1. A method for controlling a test apparatus that includes

a test unit in which testers are arranged in columns and rows, each tester configured to test a substrate;

aligners each configured to cause the substrate to be contacted with respect to a given tester from among the testers, at least one aligner provided in each row, and each aligner configured to move between testers in a corresponding row; and

a controller configured to control the aligners, the method comprising:

independently controlling, by the controller, the at least one aligner in each row;

constraining, by the controller, movement, between testers in a second row, of a second aligner in the second row, while alignment is performed through a first aligner in a first row different from the second row, the first aligner and the second aligner being from among the aligners.

2. The method for controlling a test apparatus according to claim 1 , wherein the alignment through the first aligner is configured to perform in a coarse correction mode and a fine correction mode, and

wherein the constraining includes causing, by the controller, the second aligner to be stationary, while the alignment is performed through the first aligner, in the fine correction mode.

3. The method for controlling a test apparatus according to claim 1 , wherein a home position of each aligner is set, and

wherein the constraining includes causing, by the controller, the second aligner to be stationary at the home position, while the alignment is performed through the first aligner.

4. The method for controlling a test apparatus according to claim 1 , wherein the constraining includes constraining, by the controller, acceleration or deceleration of the second aligner, while the alignment is performed through the first aligner.

5. A method for controlling a test apparatus that includes

a test unit in which testers are arranged in columns and rows, each tester configured to test a substrate;

aligners each configured to cause the substrate to be contacted with respect to a given tester from among the testers, at least one aligner provided in each row; and

a controller configured to control the aligners, the method comprising:

constraining, by the controller, operation of at least a second aligner, while alignment is performed through a first aligner from among the aligners; and

performing realignment by the controller, upon detecting that an offset between a result of first camera alignment and a result of second camera alignment is greater than a predetermined value, the first camera alignment and the second camera alignment being each alignment associated with a first camera and a second camera,

wherein the alignment includes:

the first camera alignment in which an axis of the first camera is aligned with an axis of the second camera;

probe alignment in which a position of a probe card is detected via the second camera;

substrate alignment in which a position of the substrate is detected via the first camera; and

the second camera alignment in which the axis of the first camera is aligned with the axis of the second camera.

6. A method for controlling a test apparatus that includes

a test unit in which testers are arranged in columns and rows, each tester configured to test a substrate;

aligners each configured to cause the substrate to be contacted with respect to a given tester from among the testers, at least one aligner provided in each row; and

a controller configured to control the aligners, the method comprising:

constraining, by the controller, operation of at least a second aligner, while alignment is performed through a first aligner from among the aligners, wherein in the alignment,

a position of a pattern formed on a detected object is detected to calculate a pitch distance in the pattern based on the detected position, and

realignment is performed upon detecting that an offset between the calculated pitch distance and a stored pitch distance immediately preceding the calculated pitch distance is greater than a predetermined value.

7. A test apparatus comprising:

a test unit in which testers are arranged in columns and rows, each tester configured to test a substrate;

aligners each configured to cause the substrate to be contacted with respect to a given tester from among the testers, at least one aligner provided in each row, and each aligner configured to move between testers in a corresponding column; and

a controller configured to

independently control the at least one aligner in each row

constrain movement, between the testers in a second row, of a second aligner in the second row, while alignment is performed through a first aligner in a first row different from the second row, the first aligner and the second aligner being from among the aligners.