IP Library Granted Patent US 11,389,877
Granted Patent B2
US 11,389,877 · App. 16/703,292 · Granted Jul 19, 2022

Scanfield alignment of multiple optical systems

Inventor: Nicholas Edward Buhr (Cincinnati, OH)
Assignee: General Electric Company
B22F10/00B29C64/153B22F10/10B33Y10/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,389,877
App. No.
16/703,292
Granted
Jul 19, 2022
Kind
B2
Abstract

A method for calibrating beam scan fields for an additive manufacturing process in which two or more radiant energy beams are used to selectively melt material to form a workpiece. The method includes: directing the two or more radiant energy beams using individual beam steering mechanisms to create a calibration build pattern on a substrate, the calibration build pattern including at least one measurement artifact created by each of the two or more radiant energy beams; measuring the position of the measurement artifacts; comparing the position of the measurement artifacts to a standard to identify an alignment error; and adjusting at least one of the beam steering mechanisms to compensate for the alignment error.

Claims (26)

1. A method of calibrating beam scan fields for an additive manufacturing process in which two or more radiant energy beams ( 54 , 56 ) are used to selectively fuse material to form a workpiece ( 25 ), the method comprising:

directing the two or more radiant energy beams ( 54 , 56 ) using individual beam steering mechanisms to create a calibration build pattern ( 66 ) on a substrate, the calibration build pattern ( 66 ) including at least one measurement artifact ( 70 , 72 ) created by each of the two or more radiant energy beams ( 54 , 56 );

measuring the position of the measurement artifacts ( 70 , 72 );

comparing the measured position of the measurement artifacts ( 70 , 72 ) to a standard to identify an alignment error; and

adjusting at least one of the beam steering mechanisms to compensate for the alignment error;

wherein the measurement artifacts ( 70 , 72 ) are arranged in a plurality of measurement artifact groups ( 68 ), and the measurement artifact groups ( 68 ) have a variable spacing distance within the calibration build pattern ( 66 ).

2. The method of claim 1 wherein each beam steering mechanism is associated with a scan field, and the beam steering mechanisms are positioned such that the scan fields partially overlap each other.

3. The method of claim 1 wherein the step of adjusting includes minimizing an average alignment error of each beam steering apparatus.

4. The method of claim 1 wherein the step of adjusting includes minimizing the alignment error in a predetermined location of the calibration build pattern ( 66 ).

5. The method of claim 1 wherein each beam steering mechanism includes at least one galvanometer operable to steer a radiant energy beam in response to an input signal.

6. The method of claim 1 wherein the step of adjusting includes changing at least one parameter of a software transfer function used to transmit drive signals to the beam steering mechanism.

7. The method of claim 1 wherein:

each beam steering mechanism is associated with a scan field, and

the step of adjusting includes providing different adjustment values at different portions of the scan field for each beam steering mechanisms.

8. The method of claim 1 wherein the measurement artifacts ( 70 , 72 ) are arranged in a plurality of measurement artifact groups ( 68 ), each measurement artifact group including a control point and including at least one measurement artifact formed by each of the radiant beams ( 54 , 56 ).

9. The method of claim 1 wherein the calibration build pattern ( 66 ) includes a central area ( 67 ) surrounded by a boundary ( 69 ), the measurement artifacts ( 70 , 72 ) are arranged in a plurality of measurement artifact groups ( 68 ), and the measurement artifact groups ( 68 ) have a relatively larger spacing within the central area ( 67 ) and a relatively smaller spacing near the boundary ( 69 ).

10. The method of claim 1 wherein the calibration build pattern ( 66 ) has a central area ( 67 ) surrounded by a boundary ( 69 ), the measurement artifacts ( 70 , 72 ) are arranged in a plurality of measurement artifact groups ( 68 ), and the measurement artifact groups ( 68 ) have a smaller spacing in a preselected region within the central area ( 67 ).

11. The method of claim 1 wherein the step of measuring includes determining a position of at least one point lying on each of the measurement artifacts ( 70 , 72 ).

12. The method of claim 1 wherein the material is a powder contained in a build chamber and the two or more energy beams are used to selectively fuse the powder in the build chamber in a layer-by-layer process to form the workpiece.

13. The method of claim 1 further comprising: using the calibrated additive manufacturing process to build one or more workpieces each including two or more layers.

14. The method of claim 13 further comprising: repeating the steps of creating a calibration build pattern, measuring the position of the measurement artifacts, comparing the measured position of the measurement artifacts to a standard, and adjusting at least one of the beam steering mechanisms, after a predetermined number of layers are built for one workpiece.

15. The method of claim 13 further comprising: repeating the steps of creating a calibration build pattern, measuring the position of the measurement artifacts, comparing the measured position of the measurement artifacts to a standard, and adjusting at least one of the beam steering mechanisms, after a predetermined number of workpieces are built.

16. The method of claim 1 further comprising: repeating the steps of creating a calibration build pattern, measuring the position of the measurement artifacts, and comparing the measured position of the measurement artifacts to a standard subsequent to adjusting at least one of the beam steering mechanisms, to confirm that a correction was sufficient.

17. The method of claim 1 wherein the standard includes at least one of a position or a rotation of a scan field relative to a center of a worksurface.

18. The method of claim 1 wherein the standard comprises an absolute position of a scan field.

19. The method of claim 1 wherein the standard comprises a relative position of two or more scan fields.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2019
From: BUHR, NICHOLAS EDWARD
To: GENERAL ELECTRIC COMPANY
Reel/Frame 051178/0225 →
Continuity (1)
Related Publication 20210170484A1 · Jun 10, 2021