IP Library › Granted Patent US 11,391,692
Granted Patent B2
US 11,391,692 · App. 16/556,689 · Granted Jul 19, 2022

Field-effect transistor-based biosensor

Inventors: Geert Hellings (Halle, BE); Koen Martens (Ghent, BE)
Assignee: IMEC VZW
G01N27/4145
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,391,692
App. No.
16/556,689
Granted
Jul 19, 2022
Kind
B2
Abstract

A sensor is provided, the sensor including a field effect transistor comprising: (a) an active region comprising: (i) a source region and a drain region defining a source-drain axis and (ii) a channel region between the source region and the drain region; (b) a dielectric region on the channel region, comprising at least a first zone on a first portion of the channel region and a second zone on a second portion of the channel region, the first zone measuring from 1 to 100 nm in the direction of the source-drain axis and being adapted to create a different threshold voltage for the first portion of the channel region than for the second portion of the channel region, and (c) a fluidic gate region to which a top surface of the dielectric region is exposed. A biosensing device comprising such a sensor, a method for using such a sensor, and a process for making such a sensor are also provided.

Claims (42)

1. A sensor comprising a field effect transistor comprising:

an active region comprising:

a source region and a drain region defining a source-drain axis, and

a channel region between the source region and the drain region, the channel region comprising a first portion and a second portion;

a dielectric region on the channel region, the dielectric region composed of a common dielectric layer covering the first portion and the second portion of the channel region, the dielectric region comprising at least a first zone on the first portion of the channel region and a second zone on the second portion of the channel region, the first zone measuring from 1 to 100 nm in the direction of the source-drain axis and being adapted to create a different threshold voltage for the first portion of the channel region than for the second portion of the channel region; and

a fluidic gate region to which a top surface of the dielectric region is exposed.

2. The sensor according to claim 1 , wherein the first zone is adapted to create a difference in threshold voltage of at least 1 mV in the first portion of the channel region with respect to the second portion.

3. The sensor according to claim 1 , wherein the field effect transistor is either of an n-type and the first zone is adapted to create a higher threshold voltage for the first portion of the channel region relative to the second portion of the channel region, or the field effect transistor is of a p-type and the first zone is adapted to create a lower threshold voltage for the first portion of the channel region relative to the second portion of the channel region.

4. The sensor according to claim 2 , wherein the field effect transistor is either of an n-type and the first zone is adapted to create a higher threshold voltage for the first portion of the channel region relative to the second portion of the channel region, or the field effect transistor is of a p-type and the first zone is adapted to create a lower threshold voltage for the first portion of the channel region relative to the second portion of the channel region.

5. The sensor according to claim 1 , wherein a top surface of the first zone is charged differently than a top surface of the second zone.

6. The sensor according to claim 5 , wherein either the field effect transistor is of an n-type and the top surface of the first zone is negatively charged while the top surface of the second zone is less negatively charged or is positively charged, or the field effect transistor is of a p-type and the top surface of the first zone is positively charged while the top surface of the second zone is less positively charged or is negatively charged.

7. The sensor according to claim 5 , wherein the top surface of the first zone has a point of zero charge differing by at least 1 with respect to the point of zero charge of the top surface of the second zone.

8. The sensor according to claim 7 , wherein either the field effect transistor is of an n-type and the top surface of the first zone has a point of zero charge lower than the point of zero charge of the top surface of the second zone or the field effect transistor is of a p-type and the top surface of the first zone has a point of zero charge higher than the point of zero charge of the top surface of the second zone.

9. The sensor according to claim 6 , wherein the top surface of the first zone has a point of zero charge differing by at least 1 with respect to the point of zero charge of the top surface of the second zone.

10. The sensor according to claim 9 , wherein either the field effect transistor is of the n-type and the top surface of the first zone has a point of zero charge lower than the point of zero charge of the top surface of the second zone or the field effect transistor is of a p-type and the top surface of the first zone has a point of zero charge higher than the point of zero charge of the top surface of the second zone.

11. The sensor according to claim 1 , wherein the first zone and the second zone differ in thickness.

12. The sensor according to claim 1 , wherein the first zone and the second zone differ in their chemical composition.

13. The sensor according to claim 1 , wherein the first zone and the second zone comprise a common dielectric layer on the active region and wherein the first zone or the second zone comprise a further layer creating the different threshold.

14. The sensor according to claim 1 , wherein a molecular probe, for specifically binding a target molecule to be detected by the sensor, is attached to the surface of the first zone.

15. The sensor according to claim 1 , wherein a width of the first zone is at least 50% of a width of the channel.

16. A biosensing device comprising one or more sensors according to claim 1 .

17. A method for detecting the possible presence of an analyte in a liquid medium, the method comprising:

(a) providing a sensor according to claim 1 ;

(b) applying a gate potential and measuring a first current between the source region and the drain region;

(c) introducing the liquid medium potentially containing the analyte in the fluidic gate region; and

(d) measuring a second current between the source region and the drain region, thereby detecting the analyte.

18. A process for forming a sensor according to claim 1 , comprising the steps of:

(a) providing an active region, the active region having a source region, a drain region and a channel region therebetween, the channel region comprising a first portion and a second portion;

(b) providing a dielectric region on the channel region, the dielectric region composed of a common dielectric layer covering the first portion and the second portion of the channel region, the dielectric region comprising at least a first zone on a first portion of the channel region and a second zone on the second portion of the channel region, the first zone measuring from 1 to 100 nm in the direction of the source-drain axis and being adapted to create a different threshold voltage for the first portion of the channel region than for the second portion of the channel region; and

(c) providing a fluidic gate region to which a top surface of the dielectric region is exposed.

19. The process according to claim 18 , wherein the active region is on a substrate.

20. The method according to claim 19 , wherein the first zone measures from 1 to 50 nm.

21. A method for detecting the possible presence of an analyte in a liquid medium, the method comprising:

(a) providing a sensor, the sensor comprising a field effect transistor comprising:

an active region comprising:

a source region and a drain region defining a source-drain axis, and

a channel region between the source region and the drain region;

a dielectric region on the channel region, comprising at least a first zone on a first portion of the channel region and a second zone on a second portion of the channel region, the first zone measuring from 1 to 100 nm in the direction of the source-drain axis and being adapted to create a different threshold voltage for the first portion of the channel region than for the second portion of the channel region; and

a fluidic gate region to which a top surface of the dielectric region is exposed;

(b) applying a gate potential and measuring a first current between the source region and the drain region;

(c) introducing the liquid medium potentially containing the analyte in the fluidic gate region; and

(d) measuring a second current between the source region and the drain region, thereby detecting the analyte.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2019
From: HELLINGS, GEERT; MARTENS, KOEN
To: IMEC VZW
Reel/Frame 050314/0410 →
Priority Claims (1)
EP 18192768 · Sep 5, 2018 · regional
Continuity (1)
Related Publication 20200072788A1 · Mar 5, 2020