IP Library › Granted Patent US 11,404,564
Granted Patent B2
US 11,404,564 · App. 16/208,377 · Granted Aug 2, 2022

Integrated circuit having a transistor, a diode, and a temperature sensor

Inventor: Masahiro Taoka (Matsumoto, JP)
Assignee: FUJI ELECTRIC CO., LTD.
H01L29/7397G01K7/01H01L27/0211H01L27/0664H01L27/0727H01L29/0692H01L29/0696H01L29/0804H01L29/0821H01L29/41708H01L27/0629
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Quick Facts
Patent No.
US 11,404,564
App. No.
16/208,377
Granted
Aug 2, 2022
Kind
B2
Abstract

A semiconductor device including a transistor section and a diode section, the semiconductor device having: a temperature sensing section; a neighboring transistor section adjacent to the temperature sensing section; a neighboring diode section adjacent to the temperature sensing section; and a first non-neighboring diode section that is not adjacent to the temperature sensing section, wherein the first non-neighboring diode section has a pattern different from the pattern of the neighboring diode section in the top view is provided.

Claims (36)

1. A semiconductor device comprising a transistor section and a diode section, the semiconductor device including:

a temperature sensing section;

a neighboring transistor section adjacent to the temperature sensing section;

a neighboring diode section adjacent to the temperature sensing section; and

a first non-neighboring diode section that is not adjacent to the temperature sensing section, wherein

the first non-neighboring diode section has a pattern different from a pattern of the neighboring diode section in a top view, and

the neighboring transistor section and the neighboring diode section are spaced apart from the temperature sensing section by a gate metal layer surrounding the temperature sensing section.

2. The semiconductor device according to claim 1 , wherein

the temperature sensing section has a longer side and a shorter side, and is, on the shorter side, adjacent to only one of the neighboring transistor section and the neighboring diode section.

3. The semiconductor device according to claim 1 , wherein

the transistor section has a non-neighboring transistor section that is not adjacent to the temperature sensing section, and

the neighboring diode section and the neighboring transistor section are adjacent to a longer side of the temperature sensing section and arrayed in a longitudinal direction.

4. The semiconductor device according to claim 3 , further comprising a second non-neighboring diode section that is not adjacent to the temperature sensing section, wherein

the second non-neighboring diode section and the non-neighboring transistor section are arrayed in the longitudinal direction on an opposite side to the temperature sensing section, in a reversed order of an arrangement of the neighboring diode section and the neighboring transistor section that are arrayed in the longitudinal direction.

5. The semiconductor device according to claim 4 , wherein the second non-neighboring diode section has a pattern same as a pattern of the neighboring diode section in a top view.

6. The semiconductor device according to claim 1 , wherein

the neighboring transistor section and the neighboring diode section have a longitudinal direction in an extending direction of trench portions included in the transistor section.

7. The semiconductor device according to claim 1 , wherein

the neighboring diode section has a longitudinal direction in a direction orthogonal to a longitudinal direction of the temperature sensing section, and

the first non-neighboring diode section has a longitudinal direction in a direction parallel to a longitudinal direction of the temperature sensing section.

8. The semiconductor device according to claim 7 , wherein

at least one of the neighboring diode section and the neighboring transistor section is adjacent to the temperature sensing section on one side of the temperature sensing section at two points.

9. The semiconductor device according to claim 1 , wherein

the temperature sensing section does not overlap the neighboring transistor section and the neighboring diode section in the top view.

10. The semiconductor device according to claim 1 , wherein

a portion of the neighboring diode section is larger than a portion of the neighboring transistor section, the portions being adjacent to the temperature sensing section.

11. A semiconductor device comprising a transistor section and a diode section, the semiconductor device including:

a temperature sensing section;

a neighboring transistor section adjacent to the temperature sensing section;

a neighboring diode section adjacent to the temperature sensing section;

a first non-neighboring diode section that is not adjacent to the temperature sensing section; and

a second non-neighboring diode section that is not adjacent to the temperature sensing section, wherein

the first non-neighboring diode section has a pattern different from a pattern of the neighboring diode section in a top view,

the transistor section has a non-neighboring transistor section that is not adjacent to the temperature sensing section,

the neighboring diode section and the neighboring transistor section are adjacent to a longer side of the temperature sensing section and arrayed in a longitudinal direction, and

the second non-neighboring diode section and the non-neighboring transistor section are arrayed in the longitudinal direction on an opposite side to the temperature sensing section, in a reversed order of an arrangement of the neighboring diode section and the neighboring transistor section that are arrayed in the longitudinal direction.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2018
From: TAOKA, MASAHIRO
To: FUJI ELECTRIC CO., LTD.
Reel/Frame 047673/0339 →
Priority Claims (1)
JP JP2018-025062 · Feb 15, 2018 · national
Continuity (1)
Related Publication 20190252532A1 · Aug 15, 2019