IP Library › Granted Patent US 1,140,868
Granted Patent S1
US 1,140,868 · App. 35/525,816 · Granted Aug 11, 2026

Probe pin for integrated circuits testing

Inventors: Dong Weon Hwang (Seongnam-si, KR); Jae Baek Hwang (Seongnam-si, KR); Logan Jae Hwang (Beverly Hills, CA)
Assignees: HICON CO., LTD.; Dong Weon Hwang; Jae Baek Hwang
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Quick Facts
Patent No.
US 1,140,868
App. No.
35/525,816
Granted
Aug 11, 2026
Kind
S1
Claims (1)

The ornamental design for a probe pin for integrated circuits testing as shown and described.

Priority Claims (1)
KR 30-2024-0002454 · Jan 18, 2024 · national
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