Interferometry with an achromatic interferometric superposition of electromagnetic fields

1. An interferometer apparatus, being configured for an achromatic interferometric superposition of electromagnetic fields, with a dual beam path interferometer, comprising:

a beam splitter being arranged for splitting an input beam into a first beam propagating along a first interferometer arm including at least one deflection mirror and a second beam propagating along a second interferometer arm including at least one deflection mirror, wherein the first and second interferometer arms have an identical optical path length, and

a beam combiner being arranged for recombining the first and second beams into a constructive output and a destructive output, wherein

reflective surfaces of the beam splitter and the beam combiner are arranged such that, in the first interferometer arm compared with the second interferometer arm, one additional Fresnel reflection at an optically dense medium is provided and a propagation of the electromagnetic fields of the first and second beams, when recombined by the beam combiner, results in a wavelength-independent phase difference of π between contributions of the two interferometer arms to the destructive output, and

the first interferometer arm includes a balancing transmission element being arranged for balancing a chromatic dispersion and Fresnel losses in the first and second interferometer arms, the balancing transmission element configured to have a fixed position and orientation throughout a whole measurement.

2. The interferometer apparatus according to claim 1 , further including

at least one spatial filter being arranged for suppressing the propagation of electromagnetic fields in at least one of the first and second interferometer arms, wherein the electromagnetic fields do not have opposing phases.

3. The interferometer apparatus according to claim 1 , further including

at least one anti-reflective coating being arranged on at least one of the reflective surfaces.

4. The interferometer apparatus according to claim 1 , wherein

the additional Fresnel reflection at the optically dense medium is provided at the beam splitter.

5. The interferometer apparatus according to claim 1 , wherein

the additional Fresnel reflection at the optically dense medium is provided at the beam combiner.

6. The interferometer apparatus according to claim 1 , further including

a stabilization device being arranged for controlling at least one of the optical path lengths, a mirror position, a mirror orientation, a beam splitter position, a beam splitter orientation, a beam combiner position, a beam combiner orientation and a balancing transmission element orientation.

7. The interferometer apparatus according to claim 6 , wherein

the stabilization device includes a feedback loop control coupled with one of the constructive and the destructive outputs.

8. The interferometer apparatus according to claim 1 , wherein

the dual beam path interferometer is arranged in an evacuated environment.

9. The interferometer apparatus according to claim 1 , wherein

the balancing transmission element comprises a transparent plate.

10. The interferometer apparatus according to claim 1 , wherein

the first and second interferometer arms cross each other in space.

11. The interferometer apparatus according to claim 1 , further including

at least one phase setting element being arranged in at least one of the input beam, the destructive output and the constructive output.

12. The interferometer apparatus according to claim 1 , further including

an imaging optic being arranged for shaping a transverse profile of the electromagnetic field in the first and second interferometer arms.

13. The interferometer apparatus according to claim 12 , wherein

the imaging optic is arranged for shaping the transverse profile of the electromagnetic field of at least one of the input beam, the destructive output and the constructive output.

14. An interferometric measurement apparatus, comprising

an interferometer apparatus according to claim 1 ,

a radiation source being arranged for creating the input beam having a broadband spectrum, and

a first detection device being arranged for detecting the destructive output.

15. The interferometric measurement apparatus according to claim 14 , wherein

the radiation source comprises a pulsed laser or a thermal radiation source with a coherence length above the optical path length of the first and second interferometer arms.

16. The interferometric measurement apparatus according to claim 14 , further including

a second detection device being arranged for detecting the constructive output.

17. An interferometric measurement method, utilizing an interferometer apparatus according to claim 1 , comprising the steps of:

arranging a sample to be investigated in one of the first and second interferometer arms,

arranging a reference sample in the other one of the first and second interferometer arms,

creating the input beam having a broadband spectrum and irradiating the sample and the reference sample, and

sensing at least one of the constructive output and the destructive output of the beam combiner, wherein the balancing transmission element has the fixed position and orientation throughout the whole measurement.

18. The interferometric measurement method according to claim 17 , wherein

the sensing at least one of the constructive output and the destructive output of the beam combiner includes sensing the destructive output of the beam combiner, the sensing the destructive output including an achromatic interferometric subtraction of the electromagnetic fields.

19. The interferometric measurement method according to claim 17 , wherein

the sensing at least one of the constructive output and the destructive output of the beam combiner includes sensing the constructive output of the beam combiner, the sensing the constructive output including an achromatic interferometric summation of the electromagnetic fields.