Granted Patent
S1
US 1,142,243 · App. 35/525,831 · Granted Aug 18, 2026
Probe pin for integrated circuit testing
Inventors:
Dong Weon Hwang (Seongnam-si, KR); Jae Baek Hwang (Seongnam-si, KR); Logan Jae Hwang (Beverly Hills, CA)
View Patent ↗
Loading inventors, assignments & file history…
Claims (1)
The ornamental design for a probe pin for integrated circuit testing as shown and described.
Priority Claims (1)
KR 30-2024-0002489
· Jan 18, 2024
· national
References Cited (31)
US 5499933A
· Sekine
· 1996
[cited by examiner]
US 7025602B1
· Hwang
· 2006
[cited by examiner]
US 7116121B1
· Holcombe
· 2006
[cited by examiner]
US D764330S
· Teranishi
· 2016
[cited by examiner]
US D789225S
· Teranishi
· 2017
[cited by examiner]
US D792253S
· Teranishi
· 2017
[cited by examiner]
US D847757S
· Nasu
· 2019
[cited by examiner]
US 20020113612A1
· Nguyen
· 2002
[cited by examiner]
US 20100285698A1
· Lee
· 2010
[cited by examiner]
US 20250035670A1
· Ahn
· 2025
[cited by examiner]
KR 3005828310000
· 2010
[cited by examiner]
TW 113303698
· 2025
[cited by examiner]
TW 113303700
· 2025
[cited by examiner]
TW 113303689
· 2025
[cited by examiner]
Harwin two part probe, posted Jul. 21, 2017 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.digikey.com/en/products/detail/harwin-inc/P25-4021/3924416?gclsrc=aw.ds&gad_source=1&gad_campaignid=2…
[cited by examiner]
HiCon hi-contact hr-contact pins, posted Apr. 18, 2025 [online], [retrieved xx/xx/xx]. Retrieved from internet, https://www.hi-con.kr/pin (Year: 2025).
[cited by examiner]
Omron blade pin, posted Jun. 25, 2022 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://components.omron.com/eu-en/solutions/efc-sockets-and-probe-pins-for-ic-testing (Year: 2022).
[cited by examiner]
Omron high density probe pin, posted Jul. 1, 2013 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, hhttps://www.omron.com/media/press/2013/07/e0701.html (Year: 2013).
[cited by examiner]
PeakTest spring contact test probes, posted Dec. 9, 2023 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.peaktest.co.uk/resources/technical-how-guides/what-spring-contacttest-probe (Year: 2023).
[cited by examiner]
Plastronics H Pin YouTube, posted Jun. 15, 2020 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.youtube.com/watch?v=48OIBqsS5HU&t=76s (Year: 2020).
[cited by examiner]
Sfeng high current test probe pin, posted Mar. 11, 2026 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.sfcontactprobe.com/High-current-testprobesclips/25a-sf12-7-5-high-current-test-probepin (…
[cited by examiner]
Tek Crown stamped spring probe, posted Jul. 20, 2019 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://tekcrown.com/stamped-spring-probe/ (Year: 2019).
[cited by examiner]
UPT one-piece contact pin, posted Nov. 26, 2024 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://upt-co.com/en/product/semiconductor-test/u-contact/ (Year: 2024).
[cited by examiner]