Apparatuses including multiple read modes and methods for same
Apparatuses and methods including multiple read modes for reading data from a memory are described. An example apparatus includes a memory including a first read mode and a second read mode. The memory has a read operation for the first read mode including a first pre-access phase, an access phase, and a first post-access phase. The read operation for the second read mode includes a second pre-access phase, the access phase, and a second post-access phase. The read operation for either the first read mode or the second read mode is performed responsive to the memory receiving a read command. The second pre-access phase is different from the first pre-access phase, with the second pre-access phase having a shorter time than the first pre-access phase measured from receipt of the read command.
1. An apparatus, comprising:
a memory having a sub-operation mode configurable to disable at least one sub-operation of a plurality of sub-operations for a read operation prior to the memory executing a read command,
wherein the at least one sub-operation of the plurality of sub-operations that is disabled comprises calculation of compensation information.
2. An apparatus, comprising:
a memory having a sub-operation mode configurable to disable at least one sub-operation of a plurality of sub-operations for a read operation prior to the memory executing a read command,
wherein a sub-operation of the plurality of sub-operations comprises development of an intermediate voltage at a charge pump circuit after the memory executes the read command, and prior to the memory executing another read command, wherein the intermediate voltage is less than a voltage used by the memory to execute the read command.
3. An apparatus, comprising:
a memory having a sub-operation mode configurable to disable at least one sub-operation of a plurality of sub-operations for a read operation prior to the memory executing a read command,
wherein the memory is further configured to disable the sub-operation mode when a set feature operation is used to enable a default read mode.
4. Au apparatus, comprising:
a memory having a sub-operation mode configurable to disable at least one sub-operation of a plurality of sub-operations of a read operation prior to the memory executing a read command, wherein the memory is further configured to disable the sub-operation mode when the memory receives a test mode setting or a trim setting.
5. An apparatus, comprising:
a memory having a sub-operation mode, wherein at least one sub-operation of a plurality of sub-operations of the sub-operation mode is performed prior to receiving a read command, and
control logic configured to provide, in the sub-operation mode, a control signal to selectively enable the at least one sub-operation of the sub-operation mode, responsive to a set feature command including a parameter indicative of the at least one sub-operation; and
a charge pump circuit configured to charge to a voltage, wherein the at least one sub-operation of the plurality of sub-operations comprises charging, at the charge pump circuit, an intermediate voltage.
6. The apparatus of claim 5 , the apparatus further comprising:
a global word line driver configured to receive the intermediate voltage and to drive a plurality of global word lines of the memory, wherein another sub-operation of the plurality of sub-operations comprises precharging the plurality of global word lines to the intermediate voltage.
7. The apparatus of claim 6 , wherein, upon executing the read command at the memory, the global word line driver is further configured to drive the plurality of global word lines to a read voltage from the intermediate voltage.
8. An apparatus comprising:
a memory having a read mode configurable to execute a read command;
a charge pump circuit configured to develop an intermediate voltage prior to execution of a read command at the memory; and
a global word line driver configured to receive the intermediate voltage and to drive a plurality of global word lines of the memory, prior to execution of the read command at the memory in accordance with the read mode.
9. The apparatus of claim 8 , wherein the global word line driver is further configured to precharge the plurality of global word lines to the intermediate voltage to drive the plurality of global word lines, prior to execution of the read command at the memory.
10. The apparatus of claim 8 , wherein, after execution of the read command at the memory in accordance with the read mode, the charge pump circuit is further configured to develop the intermediate voltage prior to the execution of another read command at the memory in accordance with read mode.
11. The apparatus of claim 10 , wherein, after execution of the read command at the memory in accordance with the read mode, the global word line driver is further configured to precharge the plurality of global word lines prior to the execution of another read command at the memory in accordance with read mode.
12. The apparatus of claim 8 , wherein the intermediate voltage is less than a voltage used by the global word lines during execution of the read command.
13. The apparatus of claim 8 , wherein the read mode is a set feature operation mode that is enabled using a set feature operation.
14. The apparatus of claim 13 , further comprising:
control logic configured to provide to the memory a control signal configured enable a sub-operation of the set feature operation mode.
15. The apparatus of claim 14 , wherein the sub-operation enabled by the control signal corresponds to the charge pump circuit developing the intermediate voltage prior to execution of the read command at the memory.